ATE495476T1 - Laserabtastvorrichtung und laserabtast-mikroskop - Google Patents
Laserabtastvorrichtung und laserabtast-mikroskopInfo
- Publication number
- ATE495476T1 ATE495476T1 AT07790182T AT07790182T ATE495476T1 AT E495476 T1 ATE495476 T1 AT E495476T1 AT 07790182 T AT07790182 T AT 07790182T AT 07790182 T AT07790182 T AT 07790182T AT E495476 T1 ATE495476 T1 AT E495476T1
- Authority
- AT
- Austria
- Prior art keywords
- laser scanning
- deflecting unit
- light
- light deflecting
- laser
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
- G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
- G02B26/105—Scanning systems with one or more pivoting mirrors or galvano-mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
- G02B27/0031—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration for scanning purposes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Laser Beam Processing (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006195241 | 2006-07-18 | ||
PCT/JP2007/000656 WO2008010311A1 (fr) | 2006-07-18 | 2007-06-20 | Appareil à balayage laser et microscope à balayage laser |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE495476T1 true ATE495476T1 (de) | 2011-01-15 |
Family
ID=38956646
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07790182T ATE495476T1 (de) | 2006-07-18 | 2007-06-20 | Laserabtastvorrichtung und laserabtast-mikroskop |
Country Status (6)
Country | Link |
---|---|
US (1) | US8159744B2 (de) |
EP (1) | EP2045640B1 (de) |
JP (1) | JPWO2008010311A1 (de) |
AT (1) | ATE495476T1 (de) |
DE (1) | DE602007011940D1 (de) |
WO (1) | WO2008010311A1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
HU0800688D0 (en) * | 2008-11-17 | 2009-01-28 | Femtonics Kft | Multiple free line-scan mode of scanning |
JP5581707B2 (ja) * | 2010-01-28 | 2014-09-03 | 株式会社ニコン | 制御方法 |
JP5806450B2 (ja) * | 2010-07-02 | 2015-11-10 | オリンパス株式会社 | 細胞観察方法 |
JP6157155B2 (ja) * | 2012-03-15 | 2017-07-05 | オリンパス株式会社 | 顕微鏡システム、駆動方法およびプログラム |
JP2015125177A (ja) | 2013-12-25 | 2015-07-06 | ソニー株式会社 | 顕微鏡システムおよびその画像データ転送方法 |
JP6171970B2 (ja) | 2014-02-10 | 2017-08-02 | ソニー株式会社 | レーザ走査型顕微鏡装置および制御方法 |
JP6161678B2 (ja) * | 2015-11-20 | 2017-07-12 | 株式会社キーエンス | 共焦点顕微鏡システム |
US10514394B2 (en) * | 2016-02-26 | 2019-12-24 | Tektronix, Inc. | Dynamic output clamping for a probe or accessory |
EP3538941A4 (de) | 2016-11-10 | 2020-06-17 | The Trustees of Columbia University in the City of New York | Schnelles hochauflösendes bildgebungsverfahren für grosse proben |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6161123A (ja) * | 1984-08-31 | 1986-03-28 | Fuji Photo Film Co Ltd | ガルバノメ−タミラ−駆動装置 |
US5187364A (en) * | 1989-03-22 | 1993-02-16 | National Research Council Of Canada/Conseil National De Recherches Du Canada | Scanning device with waveform generator optimizer |
US5084612A (en) * | 1989-10-20 | 1992-01-28 | Fuji Photo Film Co., Ltd. | Imaging method for scanning microscopes, and confocal scanning microscope |
DE19702752C2 (de) * | 1997-01-27 | 2001-12-13 | Zeiss Carl Jena Gmbh | Ansteuersystem für einen Scannerantrieb |
JP4555905B2 (ja) * | 1998-01-27 | 2010-10-06 | カール ツアイス マイクロイメージング ゲゼルシャフト ミット ベシュレンクテル ハフツング | スキャナ駆動部のための方向制御システム |
KR20020025180A (ko) * | 1999-07-05 | 2002-04-03 | 칼 하인쯔 호르닝어 | 미리 정해진 희망 경로를 입자 비임 또는 파동 비임으로 표시하는 방법 및 그 방법의 이용방법 |
US6687035B2 (en) * | 2001-06-07 | 2004-02-03 | Leica Microsystems Heildelberg Gmbh | Method and apparatus for ROI-scan with high temporal resolution |
JP4700299B2 (ja) * | 2004-07-07 | 2011-06-15 | オリンパス株式会社 | 共焦点走査型顕微鏡 |
US7355702B2 (en) | 2004-06-21 | 2008-04-08 | Olympus Corporation | Confocal observation system |
DE102004034956A1 (de) * | 2004-07-16 | 2006-02-02 | Carl Zeiss Jena Gmbh | Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop mit linienförmiger Abtastung |
US7696996B2 (en) * | 2004-12-13 | 2010-04-13 | Olympus Corporation | Laser scanning microscope apparatus |
-
2007
- 2007-06-20 DE DE602007011940T patent/DE602007011940D1/de active Active
- 2007-06-20 EP EP07790182A patent/EP2045640B1/de not_active Revoked
- 2007-06-20 AT AT07790182T patent/ATE495476T1/de not_active IP Right Cessation
- 2007-06-20 JP JP2008525783A patent/JPWO2008010311A1/ja not_active Withdrawn
- 2007-06-20 WO PCT/JP2007/000656 patent/WO2008010311A1/ja active Application Filing
-
2008
- 2008-12-22 US US12/318,132 patent/US8159744B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP2045640A4 (de) | 2009-11-11 |
US8159744B2 (en) | 2012-04-17 |
WO2008010311A1 (fr) | 2008-01-24 |
JPWO2008010311A1 (ja) | 2009-12-17 |
DE602007011940D1 (de) | 2011-02-24 |
US20090168157A1 (en) | 2009-07-02 |
EP2045640A1 (de) | 2009-04-08 |
EP2045640B1 (de) | 2011-01-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |