ATE495476T1 - Laserabtastvorrichtung und laserabtast-mikroskop - Google Patents

Laserabtastvorrichtung und laserabtast-mikroskop

Info

Publication number
ATE495476T1
ATE495476T1 AT07790182T AT07790182T ATE495476T1 AT E495476 T1 ATE495476 T1 AT E495476T1 AT 07790182 T AT07790182 T AT 07790182T AT 07790182 T AT07790182 T AT 07790182T AT E495476 T1 ATE495476 T1 AT E495476T1
Authority
AT
Austria
Prior art keywords
laser scanning
deflecting unit
light
light deflecting
laser
Prior art date
Application number
AT07790182T
Other languages
English (en)
Inventor
Atsushi Tsurumune
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=38956646&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE495476(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Nikon Corp filed Critical Nikon Corp
Application granted granted Critical
Publication of ATE495476T1 publication Critical patent/ATE495476T1/de

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10Scanning systems
    • G02B26/101Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10Scanning systems
    • G02B26/105Scanning systems with one or more pivoting mirrors or galvano-mirrors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G02B27/0031Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration for scanning purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Laser Beam Processing (AREA)
AT07790182T 2006-07-18 2007-06-20 Laserabtastvorrichtung und laserabtast-mikroskop ATE495476T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006195241 2006-07-18
PCT/JP2007/000656 WO2008010311A1 (fr) 2006-07-18 2007-06-20 Appareil à balayage laser et microscope à balayage laser

Publications (1)

Publication Number Publication Date
ATE495476T1 true ATE495476T1 (de) 2011-01-15

Family

ID=38956646

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07790182T ATE495476T1 (de) 2006-07-18 2007-06-20 Laserabtastvorrichtung und laserabtast-mikroskop

Country Status (6)

Country Link
US (1) US8159744B2 (de)
EP (1) EP2045640B1 (de)
JP (1) JPWO2008010311A1 (de)
AT (1) ATE495476T1 (de)
DE (1) DE602007011940D1 (de)
WO (1) WO2008010311A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
HU0800688D0 (en) * 2008-11-17 2009-01-28 Femtonics Kft Multiple free line-scan mode of scanning
JP5581707B2 (ja) * 2010-01-28 2014-09-03 株式会社ニコン 制御方法
JP5806450B2 (ja) * 2010-07-02 2015-11-10 オリンパス株式会社 細胞観察方法
JP6157155B2 (ja) * 2012-03-15 2017-07-05 オリンパス株式会社 顕微鏡システム、駆動方法およびプログラム
JP2015125177A (ja) 2013-12-25 2015-07-06 ソニー株式会社 顕微鏡システムおよびその画像データ転送方法
JP6171970B2 (ja) 2014-02-10 2017-08-02 ソニー株式会社 レーザ走査型顕微鏡装置および制御方法
JP6161678B2 (ja) * 2015-11-20 2017-07-12 株式会社キーエンス 共焦点顕微鏡システム
US10514394B2 (en) * 2016-02-26 2019-12-24 Tektronix, Inc. Dynamic output clamping for a probe or accessory
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6161123A (ja) * 1984-08-31 1986-03-28 Fuji Photo Film Co Ltd ガルバノメ−タミラ−駆動装置
US5187364A (en) * 1989-03-22 1993-02-16 National Research Council Of Canada/Conseil National De Recherches Du Canada Scanning device with waveform generator optimizer
US5084612A (en) * 1989-10-20 1992-01-28 Fuji Photo Film Co., Ltd. Imaging method for scanning microscopes, and confocal scanning microscope
DE19702752C2 (de) * 1997-01-27 2001-12-13 Zeiss Carl Jena Gmbh Ansteuersystem für einen Scannerantrieb
JP4555905B2 (ja) * 1998-01-27 2010-10-06 カール ツアイス マイクロイメージング ゲゼルシャフト ミット ベシュレンクテル ハフツング スキャナ駆動部のための方向制御システム
KR20020025180A (ko) * 1999-07-05 2002-04-03 칼 하인쯔 호르닝어 미리 정해진 희망 경로를 입자 비임 또는 파동 비임으로 표시하는 방법 및 그 방법의 이용방법
US6687035B2 (en) * 2001-06-07 2004-02-03 Leica Microsystems Heildelberg Gmbh Method and apparatus for ROI-scan with high temporal resolution
JP4700299B2 (ja) * 2004-07-07 2011-06-15 オリンパス株式会社 共焦点走査型顕微鏡
US7355702B2 (en) 2004-06-21 2008-04-08 Olympus Corporation Confocal observation system
DE102004034956A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop mit linienförmiger Abtastung
US7696996B2 (en) * 2004-12-13 2010-04-13 Olympus Corporation Laser scanning microscope apparatus

Also Published As

Publication number Publication date
EP2045640A4 (de) 2009-11-11
US8159744B2 (en) 2012-04-17
WO2008010311A1 (fr) 2008-01-24
JPWO2008010311A1 (ja) 2009-12-17
DE602007011940D1 (de) 2011-02-24
US20090168157A1 (en) 2009-07-02
EP2045640A1 (de) 2009-04-08
EP2045640B1 (de) 2011-01-12

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Legal Events

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