WO2008108174A1 - 照明装置並びにそれを用いた欠陥検査装置及びその方法並びに高さ計測装置及びその方法 - Google Patents
照明装置並びにそれを用いた欠陥検査装置及びその方法並びに高さ計測装置及びその方法 Download PDFInfo
- Publication number
- WO2008108174A1 WO2008108174A1 PCT/JP2008/052855 JP2008052855W WO2008108174A1 WO 2008108174 A1 WO2008108174 A1 WO 2008108174A1 JP 2008052855 W JP2008052855 W JP 2008052855W WO 2008108174 A1 WO2008108174 A1 WO 2008108174A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- laser beam
- defect inspecting
- height metering
- illuminating device
- inspecting apparatus
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
Abstract
検査装置または高さ計測装置において、レーザビームを試料上に回折光学素子を介して直線状に照射することによって、照射領域の全領域に渡って均一なレーザビーム強度を得る。これによって、レーザビームを斜め方向から入射しても、また、低いレーザパワーでも試料表面を正確に測定することが出来る。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007057975A JP5581563B2 (ja) | 2007-03-08 | 2007-03-08 | 照明装置並びにそれを用いた欠陥検査装置及びその方法並びに高さ計測装置及びその方法 |
JP2007-057975 | 2007-03-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008108174A1 true WO2008108174A1 (ja) | 2008-09-12 |
Family
ID=39738071
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/052855 WO2008108174A1 (ja) | 2007-03-08 | 2008-02-20 | 照明装置並びにそれを用いた欠陥検査装置及びその方法並びに高さ計測装置及びその方法 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5581563B2 (ja) |
WO (1) | WO2008108174A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012014358A1 (ja) * | 2010-07-30 | 2012-02-02 | 株式会社日立ハイテクノロジーズ | 欠陥検査装置および欠陥検査方法 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104136881B (zh) * | 2012-02-03 | 2017-08-29 | 独立行政法人产业技术综合研究所 | 计测物品表面上的突起或突条的高度的方法及用于该方法的装置 |
US9255891B2 (en) * | 2012-11-20 | 2016-02-09 | Kla-Tencor Corporation | Inspection beam shaping for improved detection sensitivity |
JP2015096837A (ja) * | 2013-11-15 | 2015-05-21 | 株式会社島津製作所 | 表面形状計測装置 |
JP6081520B2 (ja) * | 2014-05-28 | 2017-02-15 | インディアン インスティテュート オブ テクノロジー デリー | 非干渉位相計測 |
US20220216119A1 (en) | 2019-02-21 | 2022-07-07 | Nikon Corporation | Surface position detection device, exposure apparatus, substrate-processing system, and device-manufacturing method |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6357731B2 (ja) * | 1980-05-16 | 1988-11-14 | Hitachi Seisakusho Kk | |
JPH0319528B2 (ja) * | 1984-12-25 | 1991-03-15 | Fujitsu Ltd | |
JPH0339604B2 (ja) * | 1985-12-18 | 1991-06-14 | Fujitsu Ltd | |
JP2843308B2 (ja) * | 1996-08-16 | 1999-01-06 | 株式会社川口光学産業 | レーザー十字スリット発生装置 |
JPH11183154A (ja) * | 1997-12-19 | 1999-07-09 | Hitachi Ltd | 電子線式検査または測定装置およびその方法並びに光学的高さ検出装置 |
JP2000105203A (ja) * | 1998-07-28 | 2000-04-11 | Hitachi Ltd | 欠陥検査装置およびその方法 |
JP3051609B2 (ja) * | 1993-09-01 | 2000-06-12 | 三菱重工業株式会社 | 燃料集合体の外観検査装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4183492B2 (ja) * | 2002-11-27 | 2008-11-19 | 株式会社日立製作所 | 欠陥検査装置および欠陥検査方法 |
JP4171399B2 (ja) * | 2003-10-30 | 2008-10-22 | 住友重機械工業株式会社 | レーザ照射装置 |
JP4567984B2 (ja) * | 2004-01-30 | 2010-10-27 | 株式会社 日立ディスプレイズ | 平面表示装置の製造装置 |
JP5072197B2 (ja) * | 2004-06-18 | 2012-11-14 | 株式会社半導体エネルギー研究所 | レーザ照射装置およびレーザ照射方法 |
JP2006162500A (ja) * | 2004-12-09 | 2006-06-22 | Hitachi High-Technologies Corp | 欠陥検査装置 |
WO2006108137A2 (en) * | 2005-04-06 | 2006-10-12 | Corning Incorporated | Glass inspection systems and methods for using same |
JP4988223B2 (ja) * | 2005-06-22 | 2012-08-01 | 株式会社日立ハイテクノロジーズ | 欠陥検査装置およびその方法 |
-
2007
- 2007-03-08 JP JP2007057975A patent/JP5581563B2/ja not_active Expired - Fee Related
-
2008
- 2008-02-20 WO PCT/JP2008/052855 patent/WO2008108174A1/ja active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6357731B2 (ja) * | 1980-05-16 | 1988-11-14 | Hitachi Seisakusho Kk | |
JPH0319528B2 (ja) * | 1984-12-25 | 1991-03-15 | Fujitsu Ltd | |
JPH0339604B2 (ja) * | 1985-12-18 | 1991-06-14 | Fujitsu Ltd | |
JP3051609B2 (ja) * | 1993-09-01 | 2000-06-12 | 三菱重工業株式会社 | 燃料集合体の外観検査装置 |
JP2843308B2 (ja) * | 1996-08-16 | 1999-01-06 | 株式会社川口光学産業 | レーザー十字スリット発生装置 |
JPH11183154A (ja) * | 1997-12-19 | 1999-07-09 | Hitachi Ltd | 電子線式検査または測定装置およびその方法並びに光学的高さ検出装置 |
JP2000105203A (ja) * | 1998-07-28 | 2000-04-11 | Hitachi Ltd | 欠陥検査装置およびその方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012014358A1 (ja) * | 2010-07-30 | 2012-02-02 | 株式会社日立ハイテクノロジーズ | 欠陥検査装置および欠陥検査方法 |
JP2012032252A (ja) * | 2010-07-30 | 2012-02-16 | Hitachi High-Technologies Corp | 欠陥検査装置および欠陥検査方法 |
US8804110B2 (en) | 2010-07-30 | 2014-08-12 | Hitachi High-Technologies Corporation | Fault inspection device and fault inspection method |
Also Published As
Publication number | Publication date |
---|---|
JP2008216219A (ja) | 2008-09-18 |
JP5581563B2 (ja) | 2014-09-03 |
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