ATE498145T1 - Vorrichtung zum erhalten eines dreidimensionalen bildes und verarbeitungsvorrichtung damit - Google Patents
Vorrichtung zum erhalten eines dreidimensionalen bildes und verarbeitungsvorrichtung damitInfo
- Publication number
- ATE498145T1 ATE498145T1 AT09158022T AT09158022T ATE498145T1 AT E498145 T1 ATE498145 T1 AT E498145T1 AT 09158022 T AT09158022 T AT 09158022T AT 09158022 T AT09158022 T AT 09158022T AT E498145 T1 ATE498145 T1 AT E498145T1
- Authority
- AT
- Austria
- Prior art keywords
- dimensional image
- obtaining
- measured
- measurement point
- specimen
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/086—Condensers for transillumination only
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Multimedia (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Image Analysis (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008110769A JP4236123B1 (ja) | 2008-04-21 | 2008-04-21 | 三次元画像取得装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE498145T1 true ATE498145T1 (de) | 2011-02-15 |
Family
ID=40506401
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT09158022T ATE498145T1 (de) | 2008-04-21 | 2009-04-16 | Vorrichtung zum erhalten eines dreidimensionalen bildes und verarbeitungsvorrichtung damit |
Country Status (6)
Country | Link |
---|---|
US (1) | US8237797B2 (de) |
EP (1) | EP2112543B1 (de) |
JP (1) | JP4236123B1 (de) |
CN (1) | CN101576505B (de) |
AT (1) | ATE498145T1 (de) |
DE (1) | DE602009000708D1 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DK2270423T3 (da) * | 2009-06-26 | 2014-06-30 | Siemens Medical Instr Pte Ltd | System og fremgangsmåde til tredimensional rekonstruktion af et anatomisk aftryk |
CN101867709B (zh) * | 2010-05-17 | 2012-06-06 | 哈尔滨工业大学 | 球面成像装置及其成像方法 |
JP5957825B2 (ja) * | 2011-08-09 | 2016-07-27 | 株式会社リコー | ラマン分光装置およびラマン分光測定法 |
CN103096141B (zh) * | 2011-11-08 | 2019-06-11 | 华为技术有限公司 | 一种获取视觉角度的方法、装置及系统 |
JP6048950B2 (ja) * | 2012-06-15 | 2016-12-21 | セイコーエプソン株式会社 | 濃度測定装置 |
WO2014015128A2 (en) * | 2012-07-18 | 2014-01-23 | The Trustees Of Princeton University | Multiscale spectral nanoscopy |
JP6020123B2 (ja) | 2012-12-17 | 2016-11-02 | 富士通株式会社 | 画像処理装置、画像処理方法及びプログラム |
FR3013128B1 (fr) * | 2013-11-13 | 2016-01-01 | Univ Aix Marseille | Dispositif et methode de mise au point tridimensionnelle pour microscope |
EP3037861A1 (de) * | 2014-12-23 | 2016-06-29 | Commissariat à l'Énergie Atomique et aux Énergies Alternatives | Bildgebungsverfahren und System zum Erhalt eines hochauflösenden Bildes eines Objekts |
CN113421652B (zh) * | 2015-06-02 | 2024-06-28 | 推想医疗科技股份有限公司 | 对医疗数据进行分析的方法、训练模型的方法及分析仪 |
CN105136062B (zh) * | 2015-08-25 | 2018-02-27 | 上海集成电路研发中心有限公司 | 基于衰减光的三维扫描装置及三维扫描方法 |
WO2017090100A1 (ja) * | 2015-11-25 | 2017-06-01 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置、荷電粒子線装置を用いた観察方法、及び、プログラム |
JP6843585B2 (ja) * | 2016-10-28 | 2021-03-17 | 株式会社日立エルジーデータストレージ | 走査型画像計測装置及び走査型画像計測方法 |
EP3538941A4 (de) | 2016-11-10 | 2020-06-17 | The Trustees of Columbia University in the City of New York | Schnelles hochauflösendes bildgebungsverfahren für grosse proben |
DE102017122858A1 (de) * | 2017-10-02 | 2019-04-04 | Carl Zeiss Microscopy Gmbh | Konfokalmikroskop mit hoher Auflösung |
CN109725700A (zh) * | 2017-10-29 | 2019-05-07 | 上海寒武纪信息科技有限公司 | 动态调压调频装置和方法 |
JP7298993B2 (ja) | 2018-04-09 | 2023-06-27 | 浜松ホトニクス株式会社 | 試料観察装置及び試料観察方法 |
CN112861786B (zh) * | 2021-03-09 | 2022-12-02 | 南开大学 | 人脸篡改视频检测方法和人脸篡改视频检测装置 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3506749B2 (ja) | 1993-12-28 | 2004-03-15 | オリンパス株式会社 | 顕微鏡及びその光学的断層像表示方法及び光学的断層像表示プログラムを記録した記録媒体 |
US5587583A (en) * | 1995-09-06 | 1996-12-24 | Hughes Electronics | Thermal imaging device |
JP2869479B2 (ja) | 1995-12-21 | 1999-03-10 | 小池精機株式会社 | 透過型レーザー顕微鏡による特定物質撮像方法 |
JPH09297269A (ja) | 1996-05-01 | 1997-11-18 | Olympus Optical Co Ltd | 走査型画像入力装置及び走査型プローブ顕微鏡 |
JPH09304178A (ja) | 1996-05-09 | 1997-11-28 | Ando Electric Co Ltd | 透光率測定装置および方法 |
US5991437A (en) * | 1996-07-12 | 1999-11-23 | Real-Time Geometry Corporation | Modular digital audio system having individualized functional modules |
US6166853A (en) * | 1997-01-09 | 2000-12-26 | The University Of Connecticut | Method and apparatus for three-dimensional deconvolution of optical microscope images |
US7420602B2 (en) * | 2001-05-29 | 2008-09-02 | Samsung Semiconductor Israel R&D Center (Sirc) | Cmos imager for cellular applications and methods of using such |
JP4686147B2 (ja) * | 2003-07-31 | 2011-05-18 | 株式会社東芝 | 画像データ処理装置 |
US7136157B2 (en) * | 2003-08-22 | 2006-11-14 | Micron Technology, Inc. | Method and apparatus for testing image sensors |
US7139067B2 (en) * | 2003-09-12 | 2006-11-21 | Textron Systems Corporation | Three-dimensional imaging with multiframe blind deconvolution |
JP4566685B2 (ja) * | 2004-10-13 | 2010-10-20 | 株式会社トプコン | 光画像計測装置及び光画像計測方法 |
US7602501B2 (en) * | 2006-07-10 | 2009-10-13 | The Board Of Trustees Of The University Of Illinois | Interferometric synthetic aperture microscopy |
WO2010021148A1 (ja) * | 2008-08-20 | 2010-02-25 | 国立大学法人東北大学 | 形状・傾斜検知及び/又は計測光学装置及び方法並びにその関連装置 |
WO2011038006A1 (en) * | 2009-09-22 | 2011-03-31 | Visen Medical, Inc. | Systems and methods for virtual index-matching of diffusive media |
-
2008
- 2008-04-21 JP JP2008110769A patent/JP4236123B1/ja not_active Expired - Fee Related
-
2009
- 2009-04-16 DE DE602009000708T patent/DE602009000708D1/de active Active
- 2009-04-16 AT AT09158022T patent/ATE498145T1/de not_active IP Right Cessation
- 2009-04-16 EP EP09158022A patent/EP2112543B1/de not_active Not-in-force
- 2009-04-17 US US12/386,394 patent/US8237797B2/en not_active Expired - Fee Related
- 2009-04-21 CN CN2009101321282A patent/CN101576505B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE602009000708D1 (de) | 2011-03-24 |
EP2112543A1 (de) | 2009-10-28 |
CN101576505A (zh) | 2009-11-11 |
CN101576505B (zh) | 2011-11-16 |
JP4236123B1 (ja) | 2009-03-11 |
JP2009264752A (ja) | 2009-11-12 |
US8237797B2 (en) | 2012-08-07 |
US20090262183A1 (en) | 2009-10-22 |
EP2112543B1 (de) | 2011-02-09 |
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Legal Events
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RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |