JPS6473661A - Complementary semiconductor device - Google Patents

Complementary semiconductor device

Info

Publication number
JPS6473661A
JPS6473661A JP62231611A JP23161187A JPS6473661A JP S6473661 A JPS6473661 A JP S6473661A JP 62231611 A JP62231611 A JP 62231611A JP 23161187 A JP23161187 A JP 23161187A JP S6473661 A JPS6473661 A JP S6473661A
Authority
JP
Japan
Prior art keywords
semiconductor substrate
type
depth
buried layer
parasitic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62231611A
Other languages
Japanese (ja)
Inventor
Kiyohiko Muranaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62231611A priority Critical patent/JPS6473661A/en
Publication of JPS6473661A publication Critical patent/JPS6473661A/en
Pending legal-status Critical Current

Links

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To improve resistance to a latch-up by a method wherein at least an N<+> type or a P<+> type buried layer is formed selectively at a prescribed depth of a semiconductor substrate and a parasitic resistance value of a parasitic bipolar transistor is reduced. CONSTITUTION:In a CMOS semiconductor device which contains a P-channel MOS transistor formed on an N-type semiconductor substrate 1 composed of silicon and an N-channel MOS transistor formed in a P-well 2 formed in the N-type semiconductor substrate 1, an N<+> type buried layer is formed on the whole part at a prescribed depth of the N-type semiconductor substrate 1 in order to reduce a parasitic resistance value of a base for a parasitic PNP transistor 9. If the depth of the P-well 2 is 4-5mum, it is enough to form the N<+> type buried layer from a depth of 5-6mum with a thickness of about 1mum. For this formation, ions of boron are implanted and a heat-treatment operation is executed.
JP62231611A 1987-09-14 1987-09-14 Complementary semiconductor device Pending JPS6473661A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62231611A JPS6473661A (en) 1987-09-14 1987-09-14 Complementary semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62231611A JPS6473661A (en) 1987-09-14 1987-09-14 Complementary semiconductor device

Publications (1)

Publication Number Publication Date
JPS6473661A true JPS6473661A (en) 1989-03-17

Family

ID=16926225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62231611A Pending JPS6473661A (en) 1987-09-14 1987-09-14 Complementary semiconductor device

Country Status (1)

Country Link
JP (1) JPS6473661A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0399464A (en) * 1989-09-12 1991-04-24 Mitsubishi Electric Corp Complementary mos semiconductor device
JP2006165026A (en) * 2004-12-02 2006-06-22 Mitsubishi Electric Corp Semiconductor device
JP2011018928A (en) * 2010-09-08 2011-01-27 Mitsubishi Electric Corp Semiconductor device
JP2011018929A (en) * 2010-09-08 2011-01-27 Mitsubishi Electric Corp Semiconductor device
JP2011023734A (en) * 2010-09-08 2011-02-03 Mitsubishi Electric Corp Semiconductor device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0399464A (en) * 1989-09-12 1991-04-24 Mitsubishi Electric Corp Complementary mos semiconductor device
JP2006165026A (en) * 2004-12-02 2006-06-22 Mitsubishi Electric Corp Semiconductor device
JP2011018928A (en) * 2010-09-08 2011-01-27 Mitsubishi Electric Corp Semiconductor device
JP2011018929A (en) * 2010-09-08 2011-01-27 Mitsubishi Electric Corp Semiconductor device
JP2011023734A (en) * 2010-09-08 2011-02-03 Mitsubishi Electric Corp Semiconductor device

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