JPS644481A - Parallel-plate discharge electrode - Google Patents
Parallel-plate discharge electrodeInfo
- Publication number
- JPS644481A JPS644481A JP15553087A JP15553087A JPS644481A JP S644481 A JPS644481 A JP S644481A JP 15553087 A JP15553087 A JP 15553087A JP 15553087 A JP15553087 A JP 15553087A JP S644481 A JPS644481 A JP S644481A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- current density
- parallel
- discharge
- plate discharge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005530 etching Methods 0.000 abstract 1
- 238000001020 plasma etching Methods 0.000 abstract 1
Landscapes
- ing And Chemical Polishing (AREA)
- Drying Of Semiconductors (AREA)
- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15553087A JPS644481A (en) | 1987-06-24 | 1987-06-24 | Parallel-plate discharge electrode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15553087A JPS644481A (en) | 1987-06-24 | 1987-06-24 | Parallel-plate discharge electrode |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS644481A true JPS644481A (en) | 1989-01-09 |
JPH0338345B2 JPH0338345B2 (enrdf_load_stackoverflow) | 1991-06-10 |
Family
ID=15608084
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15553087A Granted JPS644481A (en) | 1987-06-24 | 1987-06-24 | Parallel-plate discharge electrode |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS644481A (enrdf_load_stackoverflow) |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0266941A (ja) * | 1988-08-31 | 1990-03-07 | Nec Corp | エッチング装置 |
WO1994005035A1 (en) * | 1992-08-13 | 1994-03-03 | Lam Research Corporation | Hollow-anode glow discharge apparatus |
EP0730532A4 (en) * | 1993-11-17 | 1997-01-02 | Lam Res Corp | INCREASING PLASMA DENSITY BY TOPOGRAPHY TO IMPROVE HOMOGENEITY OF ATTACK |
WO2000034979A1 (en) * | 1998-12-07 | 2000-06-15 | E.I. Du Pont De Nemours And Company | Hollow cathode array for plasma generation |
JP2002038263A (ja) * | 2000-07-25 | 2002-02-06 | Ulvac Japan Ltd | スパッタリング装置 |
US6528947B1 (en) | 1999-12-06 | 2003-03-04 | E. I. Du Pont De Nemours And Company | Hollow cathode array for plasma generation |
WO2004070808A1 (ja) * | 2003-02-03 | 2004-08-19 | Octec Inc. | プラズマ処理装置及びプラズマ処理装置用の電極板及び電極板製造方法 |
WO2006017136A3 (en) * | 2004-07-12 | 2006-09-21 | Applied Materials Inc | Plasma uniformity control by gas diffuser curvature |
US7785672B2 (en) | 2004-04-20 | 2010-08-31 | Applied Materials, Inc. | Method of controlling the film properties of PECVD-deposited thin films |
JP2011518959A (ja) * | 2008-04-28 | 2011-06-30 | アプライド マテリアルズ インコーポレイテッド | プラズマ処理チャンバ用の非平面状フェースプレート |
EP2239759A3 (en) * | 2009-04-06 | 2011-12-28 | Korea Advanced Institute of Science and Technology | Substrate treatment apparatus, substrate treatment method, preliminary electrode structure, measuring electrode structure, and process electrode structure |
DE102010030608A1 (de) * | 2010-06-28 | 2011-12-29 | Von Ardenne Anlagentechnik Gmbh | Vorrichtung zur plasmagestützten Bearbeitung von Substraten |
JP2012038682A (ja) * | 2010-08-11 | 2012-02-23 | Tokyo Electron Ltd | プラズマ処理装置及びプラズマ制御方法 |
JP2013520836A (ja) * | 2010-02-26 | 2013-06-06 | ラム リサーチ コーポレーション | イオン発生と処理ガスの解離の独立制御を有するプラズマエッチングのためのシステム、方法、および装置 |
US9967965B2 (en) | 2010-08-06 | 2018-05-08 | Lam Research Corporation | Distributed, concentric multi-zone plasma source systems, methods and apparatus |
US10262837B2 (en) | 2004-05-12 | 2019-04-16 | Applied Materials, Inc. | Plasma uniformity control by gas diffuser hole design |
US10283325B2 (en) | 2012-10-10 | 2019-05-07 | Lam Research Corporation | Distributed multi-zone plasma source systems, methods and apparatus |
JP2020084295A (ja) * | 2018-11-30 | 2020-06-04 | 株式会社アルバック | スパッタリング方法及びスパッタリング装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6273719A (ja) * | 1985-09-27 | 1987-04-04 | Hitachi Ltd | ドライエツチング装置 |
-
1987
- 1987-06-24 JP JP15553087A patent/JPS644481A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6273719A (ja) * | 1985-09-27 | 1987-04-04 | Hitachi Ltd | ドライエツチング装置 |
Cited By (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0266941A (ja) * | 1988-08-31 | 1990-03-07 | Nec Corp | エッチング装置 |
WO1994005035A1 (en) * | 1992-08-13 | 1994-03-03 | Lam Research Corporation | Hollow-anode glow discharge apparatus |
EP0730532A4 (en) * | 1993-11-17 | 1997-01-02 | Lam Res Corp | INCREASING PLASMA DENSITY BY TOPOGRAPHY TO IMPROVE HOMOGENEITY OF ATTACK |
WO2000034979A1 (en) * | 1998-12-07 | 2000-06-15 | E.I. Du Pont De Nemours And Company | Hollow cathode array for plasma generation |
US6528947B1 (en) | 1999-12-06 | 2003-03-04 | E. I. Du Pont De Nemours And Company | Hollow cathode array for plasma generation |
JP2002038263A (ja) * | 2000-07-25 | 2002-02-06 | Ulvac Japan Ltd | スパッタリング装置 |
WO2004070808A1 (ja) * | 2003-02-03 | 2004-08-19 | Octec Inc. | プラズマ処理装置及びプラズマ処理装置用の電極板及び電極板製造方法 |
US7922862B2 (en) | 2003-02-03 | 2011-04-12 | Octec Inc. | Plasma processing apparatus, electrode plate for plasma processing apparatus, and electrode plate manufacturing method |
US7785672B2 (en) | 2004-04-20 | 2010-08-31 | Applied Materials, Inc. | Method of controlling the film properties of PECVD-deposited thin films |
US10262837B2 (en) | 2004-05-12 | 2019-04-16 | Applied Materials, Inc. | Plasma uniformity control by gas diffuser hole design |
US10312058B2 (en) | 2004-05-12 | 2019-06-04 | Applied Materials, Inc. | Plasma uniformity control by gas diffuser hole design |
WO2006017136A3 (en) * | 2004-07-12 | 2006-09-21 | Applied Materials Inc | Plasma uniformity control by gas diffuser curvature |
JP2011518959A (ja) * | 2008-04-28 | 2011-06-30 | アプライド マテリアルズ インコーポレイテッド | プラズマ処理チャンバ用の非平面状フェースプレート |
EP2239759A3 (en) * | 2009-04-06 | 2011-12-28 | Korea Advanced Institute of Science and Technology | Substrate treatment apparatus, substrate treatment method, preliminary electrode structure, measuring electrode structure, and process electrode structure |
JP2013520836A (ja) * | 2010-02-26 | 2013-06-06 | ラム リサーチ コーポレーション | イオン発生と処理ガスの解離の独立制御を有するプラズマエッチングのためのシステム、方法、および装置 |
US9735020B2 (en) | 2010-02-26 | 2017-08-15 | Lam Research Corporation | System, method and apparatus for plasma etch having independent control of ion generation and dissociation of process gas |
DE102010030608B4 (de) * | 2010-06-28 | 2012-04-05 | Von Ardenne Anlagentechnik Gmbh | Vorrichtung zur plasmagestützten Bearbeitung von Substraten |
DE102010030608A1 (de) * | 2010-06-28 | 2011-12-29 | Von Ardenne Anlagentechnik Gmbh | Vorrichtung zur plasmagestützten Bearbeitung von Substraten |
US9967965B2 (en) | 2010-08-06 | 2018-05-08 | Lam Research Corporation | Distributed, concentric multi-zone plasma source systems, methods and apparatus |
JP2012038682A (ja) * | 2010-08-11 | 2012-02-23 | Tokyo Electron Ltd | プラズマ処理装置及びプラズマ制御方法 |
US8829387B2 (en) | 2010-08-11 | 2014-09-09 | Tokyo Electron Limited | Plasma processing apparatus having hollow electrode on periphery and plasma control method |
US10283325B2 (en) | 2012-10-10 | 2019-05-07 | Lam Research Corporation | Distributed multi-zone plasma source systems, methods and apparatus |
JP2020084295A (ja) * | 2018-11-30 | 2020-06-04 | 株式会社アルバック | スパッタリング方法及びスパッタリング装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0338345B2 (enrdf_load_stackoverflow) | 1991-06-10 |
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