JPS6419732A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6419732A
JPS6419732A JP17479087A JP17479087A JPS6419732A JP S6419732 A JPS6419732 A JP S6419732A JP 17479087 A JP17479087 A JP 17479087A JP 17479087 A JP17479087 A JP 17479087A JP S6419732 A JPS6419732 A JP S6419732A
Authority
JP
Japan
Prior art keywords
silicon film
polycrystalline silicon
film
contact hole
photoresist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17479087A
Other languages
Japanese (ja)
Inventor
Yoshitaka Narita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP17479087A priority Critical patent/JPS6419732A/en
Publication of JPS6419732A publication Critical patent/JPS6419732A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To flatten the surface of a polycrystalline silicon film buried in a contact hole by a method wherein, after an auxiliary film, consisting of the substance having the etching speed lower than that of the polycrystalline silicon film, is left on the recess located on the surface of the polycrystalline silicon film buried in a contact hole by conducting an etching back operation, the polycrystalline silicon film is etched back. CONSTITUTION:After the first crystal silicon film 15 has been grown in the contact hole 14 provided on an interlayer silicon oxide film 13, the second polycrystalline silicon film 16 is grown in such a manner that the contact hole 14 is completely filled up. Then, a photoresist 17 is coated on the whole surface of the second polycrystalline silicon film 16. Subsequently, the photoresist 17 is etched back until the lower layer of the polycrystalline film 16 is exposed, and the photoresist 17 is left on the recess 18 alone located at the upper part of the contact hole of the polycrystalline silicon film 16. Then, the second polycrystalline silicon film 16 and the first polycrystalline silicon film 15 are etched back by conducting isotropic plasma etching using SF6. As a result, the recess 18 on the polycrystalline silicon film 16 is removed, and the surface of the film 16 can be flattened.
JP17479087A 1987-07-15 1987-07-15 Manufacture of semiconductor device Pending JPS6419732A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17479087A JPS6419732A (en) 1987-07-15 1987-07-15 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17479087A JPS6419732A (en) 1987-07-15 1987-07-15 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS6419732A true JPS6419732A (en) 1989-01-23

Family

ID=15984718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17479087A Pending JPS6419732A (en) 1987-07-15 1987-07-15 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6419732A (en)

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