JPS6356570B2 - - Google Patents

Info

Publication number
JPS6356570B2
JPS6356570B2 JP57211884A JP21188482A JPS6356570B2 JP S6356570 B2 JPS6356570 B2 JP S6356570B2 JP 57211884 A JP57211884 A JP 57211884A JP 21188482 A JP21188482 A JP 21188482A JP S6356570 B2 JPS6356570 B2 JP S6356570B2
Authority
JP
Japan
Prior art keywords
data
memory
test
storage device
read
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57211884A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59101100A (ja
Inventor
Yukiharu Tsukada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57211884A priority Critical patent/JPS59101100A/ja
Publication of JPS59101100A publication Critical patent/JPS59101100A/ja
Publication of JPS6356570B2 publication Critical patent/JPS6356570B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP57211884A 1982-12-02 1982-12-02 記憶装置の試験方式 Granted JPS59101100A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57211884A JPS59101100A (ja) 1982-12-02 1982-12-02 記憶装置の試験方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57211884A JPS59101100A (ja) 1982-12-02 1982-12-02 記憶装置の試験方式

Publications (2)

Publication Number Publication Date
JPS59101100A JPS59101100A (ja) 1984-06-11
JPS6356570B2 true JPS6356570B2 (OSRAM) 1988-11-08

Family

ID=16613218

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57211884A Granted JPS59101100A (ja) 1982-12-02 1982-12-02 記憶装置の試験方式

Country Status (1)

Country Link
JP (1) JPS59101100A (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03150372A (ja) * 1989-11-02 1991-06-26 Mitsubishi Electric Corp エッチング方法および装置
JPH03149777A (ja) * 1989-11-02 1991-06-26 Tokyo Electric Power Co Inc:The 負荷制御装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61123555A (ja) * 1984-11-20 1986-06-11 Alps Electric Co Ltd プリンタ制御処理方式
JPH0525893Y2 (OSRAM) * 1984-11-28 1993-06-30

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5247345A (en) * 1975-10-13 1977-04-15 Advantest Corp Pattern generating equipment
JPS5743252A (en) * 1980-08-28 1982-03-11 Toshiba Corp Method for generating test pattern

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03150372A (ja) * 1989-11-02 1991-06-26 Mitsubishi Electric Corp エッチング方法および装置
JPH03149777A (ja) * 1989-11-02 1991-06-26 Tokyo Electric Power Co Inc:The 負荷制御装置

Also Published As

Publication number Publication date
JPS59101100A (ja) 1984-06-11

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