JPS6348178B2 - - Google Patents

Info

Publication number
JPS6348178B2
JPS6348178B2 JP56045094A JP4509481A JPS6348178B2 JP S6348178 B2 JPS6348178 B2 JP S6348178B2 JP 56045094 A JP56045094 A JP 56045094A JP 4509481 A JP4509481 A JP 4509481A JP S6348178 B2 JPS6348178 B2 JP S6348178B2
Authority
JP
Japan
Prior art keywords
detected
image
marker
monitor screen
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56045094A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57167648A (en
Inventor
Masahito Nakajima
Tetsuo Hizuka
Masato Myamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56045094A priority Critical patent/JPS57167648A/ja
Publication of JPS57167648A publication Critical patent/JPS57167648A/ja
Publication of JPS6348178B2 publication Critical patent/JPS6348178B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P74/00
    • H10W72/0711
    • H10W72/07141
    • H10W72/07168
    • H10W72/07502

Landscapes

  • Wire Bonding (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP56045094A 1981-03-27 1981-03-27 Processing and inspecting device for electronic part Granted JPS57167648A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56045094A JPS57167648A (en) 1981-03-27 1981-03-27 Processing and inspecting device for electronic part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56045094A JPS57167648A (en) 1981-03-27 1981-03-27 Processing and inspecting device for electronic part

Publications (2)

Publication Number Publication Date
JPS57167648A JPS57167648A (en) 1982-10-15
JPS6348178B2 true JPS6348178B2 (enExample) 1988-09-28

Family

ID=12709714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56045094A Granted JPS57167648A (en) 1981-03-27 1981-03-27 Processing and inspecting device for electronic part

Country Status (1)

Country Link
JP (1) JPS57167648A (enExample)

Also Published As

Publication number Publication date
JPS57167648A (en) 1982-10-15

Similar Documents

Publication Publication Date Title
US4938600A (en) Method and apparatus for measuring registration between layers of a semiconductor wafer
JP3156192B2 (ja) プローブ方法及びその装置
US6250534B1 (en) Wire bonding method
JPS6348178B2 (enExample)
JPH0536765A (ja) プローバ
JP3202577B2 (ja) プローブ方法
JP2999298B2 (ja) 画像認識手段による電子部品の位置検出装置
JP3166816B2 (ja) 画像認識によるパターン位置出し方法及び装置
JPH05198999A (ja) 基板検査装置
KR20040069853A (ko) 반도체 웨이퍼 검사장비 및 검사방법
TWI784088B (zh) 電子半導體組件之光學表示方法及裝置
JPH0134345Y2 (enExample)
JPH0611321A (ja) 半田印刷検査方法
JPS63108736A (ja) ウエハプロ−バ装置
JPH0282172A (ja) 導体パターンの導通検査機
JP2694462B2 (ja) 半導体ウェーハチップの位置合わせ方法
JPH0685016A (ja) 半導体チップ検査装置
JPH07335722A (ja) 基板の位置合わせ方法
JP3480643B2 (ja) パターンの検査方法
JPS63108737A (ja) ウエハプロ−バ装置
JP4554190B2 (ja) 印刷検査装置および印刷検査方法
JPH05275900A (ja) 部品リードの実装状態検査方法
JPH05259700A (ja) 回路基板検査装置
JP2004055599A (ja) 実装基板の検査方法およびその装置
JPH04249705A (ja) 位置ずれ検出方法と位置決め装置