JPS6338083B2 - - Google Patents

Info

Publication number
JPS6338083B2
JPS6338083B2 JP57134611A JP13461182A JPS6338083B2 JP S6338083 B2 JPS6338083 B2 JP S6338083B2 JP 57134611 A JP57134611 A JP 57134611A JP 13461182 A JP13461182 A JP 13461182A JP S6338083 B2 JPS6338083 B2 JP S6338083B2
Authority
JP
Japan
Prior art keywords
light
output
circuit
position sensor
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57134611A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5924202A (ja
Inventor
Toshinori Inoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP13461182A priority Critical patent/JPS5924202A/ja
Publication of JPS5924202A publication Critical patent/JPS5924202A/ja
Publication of JPS6338083B2 publication Critical patent/JPS6338083B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP13461182A 1982-07-30 1982-07-30 表面欠陥検出装置 Granted JPS5924202A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13461182A JPS5924202A (ja) 1982-07-30 1982-07-30 表面欠陥検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13461182A JPS5924202A (ja) 1982-07-30 1982-07-30 表面欠陥検出装置

Publications (2)

Publication Number Publication Date
JPS5924202A JPS5924202A (ja) 1984-02-07
JPS6338083B2 true JPS6338083B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-07-28

Family

ID=15132437

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13461182A Granted JPS5924202A (ja) 1982-07-30 1982-07-30 表面欠陥検出装置

Country Status (1)

Country Link
JP (1) JPS5924202A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62137504A (ja) * 1985-12-10 1987-06-20 Sumitomo Special Metals Co Ltd 部分クラッド材の幅測定装置
JPH0641164Y2 (ja) * 1987-01-19 1994-10-26 名古屋電機工業株式会社 実装済プリント基板自動検査装置
JPS63177040A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4974815A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1972-11-20 1974-07-19
JPS54124784A (en) * 1978-03-20 1979-09-27 Ricoh Co Ltd Laser flaw inspector

Also Published As

Publication number Publication date
JPS5924202A (ja) 1984-02-07

Similar Documents

Publication Publication Date Title
JP2546885B2 (ja) 表面形状情報を決定する方法及び装置
JPS6338083B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
US3506839A (en) Contactless probe system
JPH04279846A (ja) 光学式検査装置
US6208370B1 (en) Method and apparatus for determining the starting position and the power of a scanning light beam to be used in writing on a media
JPH05264719A (ja) レーザレーダ装置
JPH0434503Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH05215528A (ja) 三次元形状測定装置
JPS6048015B2 (ja) 光ビ−ム走査装置
JPS6069503A (ja) 鋼板端部の形状測定方法
JPS61191908A (ja) 形状測定方法
JPS5826325Y2 (ja) 位置検出装置
JPS63285512A (ja) 光偏向器における面倒れ検出装置
JPH0642930A (ja) リード高さ測定方法および装置
JPH0349522U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPS6361152A (ja) レ−ザビ−ム検査方法
SU838323A1 (ru) Устройство дл бесконтактного измерени гЕОМЕТРичЕСКиХ пАРАМЕТРОВ пОВЕРХНОСТЕй
JPH08201036A (ja) 走査型レーザー変位計
JPH0658723A (ja) 走査型レーザ変位計
GB1308669A (en) Optical measurement apparatus
JPS6096390A (ja) レ−ザ加工装置
JPH0129401B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPS60189724A (ja) 光走査装置
JPS6295407A (ja) 微細位置計測方法
JPH0220679A (ja) レーザ装置用焦点位置検出装置および焦点追随機構