JPS6331935B2 - - Google Patents
Info
- Publication number
- JPS6331935B2 JPS6331935B2 JP55101121A JP10112180A JPS6331935B2 JP S6331935 B2 JPS6331935 B2 JP S6331935B2 JP 55101121 A JP55101121 A JP 55101121A JP 10112180 A JP10112180 A JP 10112180A JP S6331935 B2 JPS6331935 B2 JP S6331935B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- test
- test mode
- reset
- lsi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 81
- 238000010586 diagram Methods 0.000 description 7
- 230000007704 transition Effects 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10112180A JPS5727041A (en) | 1980-07-25 | 1980-07-25 | Large-scale integrated circuit having testing function |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10112180A JPS5727041A (en) | 1980-07-25 | 1980-07-25 | Large-scale integrated circuit having testing function |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5727041A JPS5727041A (en) | 1982-02-13 |
JPS6331935B2 true JPS6331935B2 (ru) | 1988-06-27 |
Family
ID=14292236
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10112180A Granted JPS5727041A (en) | 1980-07-25 | 1980-07-25 | Large-scale integrated circuit having testing function |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5727041A (ru) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4507761A (en) * | 1982-04-20 | 1985-03-26 | Mostek Corporation | Functional command for semiconductor memory |
JPS6356741A (ja) * | 1986-08-28 | 1988-03-11 | Nec Corp | テスト回路 |
JPH0389182A (ja) * | 1989-08-31 | 1991-04-15 | Sharp Corp | 集積回路装置 |
JP6070600B2 (ja) * | 2014-02-21 | 2017-02-01 | 株式会社デンソー | マイクロコンピュータ |
CN110941218B (zh) * | 2019-12-10 | 2021-02-26 | 北京振兴计量测试研究所 | 一种can总线控制器测试方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56162849A (en) * | 1980-05-20 | 1981-12-15 | Fujitsu Ltd | Integrated circuit |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5734458Y2 (ru) * | 1975-11-07 | 1982-07-29 |
-
1980
- 1980-07-25 JP JP10112180A patent/JPS5727041A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56162849A (en) * | 1980-05-20 | 1981-12-15 | Fujitsu Ltd | Integrated circuit |
Also Published As
Publication number | Publication date |
---|---|
JPS5727041A (en) | 1982-02-13 |
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