JPS6317190B2 - - Google Patents

Info

Publication number
JPS6317190B2
JPS6317190B2 JP55010299A JP1029980A JPS6317190B2 JP S6317190 B2 JPS6317190 B2 JP S6317190B2 JP 55010299 A JP55010299 A JP 55010299A JP 1029980 A JP1029980 A JP 1029980A JP S6317190 B2 JPS6317190 B2 JP S6317190B2
Authority
JP
Japan
Prior art keywords
test
circuit
power supply
defective
semiconductor integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55010299A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56107174A (en
Inventor
Kenichi Nagatome
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP1029980A priority Critical patent/JPS56107174A/ja
Publication of JPS56107174A publication Critical patent/JPS56107174A/ja
Publication of JPS6317190B2 publication Critical patent/JPS6317190B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1029980A 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit Granted JPS56107174A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1029980A JPS56107174A (en) 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1029980A JPS56107174A (en) 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS56107174A JPS56107174A (en) 1981-08-25
JPS6317190B2 true JPS6317190B2 (enrdf_load_stackoverflow) 1988-04-12

Family

ID=11746378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1029980A Granted JPS56107174A (en) 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS56107174A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59228177A (ja) * 1983-06-10 1984-12-21 Hitachi Electronics Eng Co Ltd Ｉｃテスタのｄｃ測定機能付きテストヘツド

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098677A (enrdf_load_stackoverflow) * 1973-12-30 1975-08-05
JPS6021356B2 (ja) * 1977-07-18 1985-05-27 九州日本電気株式会社 集積回路の測定装置

Also Published As

Publication number Publication date
JPS56107174A (en) 1981-08-25

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