JPS56107174A - Test evaluation device for semiconductor integrated circuit - Google Patents

Test evaluation device for semiconductor integrated circuit

Info

Publication number
JPS56107174A
JPS56107174A JP1029980A JP1029980A JPS56107174A JP S56107174 A JPS56107174 A JP S56107174A JP 1029980 A JP1029980 A JP 1029980A JP 1029980 A JP1029980 A JP 1029980A JP S56107174 A JPS56107174 A JP S56107174A
Authority
JP
Japan
Prior art keywords
tests
power supply
evaluation device
fault
fail stop
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1029980A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6317190B2 (enrdf_load_stackoverflow
Inventor
Kenichi Nagatome
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP1029980A priority Critical patent/JPS56107174A/ja
Publication of JPS56107174A publication Critical patent/JPS56107174A/ja
Publication of JPS6317190B2 publication Critical patent/JPS6317190B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1029980A 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit Granted JPS56107174A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1029980A JPS56107174A (en) 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1029980A JPS56107174A (en) 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS56107174A true JPS56107174A (en) 1981-08-25
JPS6317190B2 JPS6317190B2 (enrdf_load_stackoverflow) 1988-04-12

Family

ID=11746378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1029980A Granted JPS56107174A (en) 1980-01-31 1980-01-31 Test evaluation device for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS56107174A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59228177A (ja) * 1983-06-10 1984-12-21 Hitachi Electronics Eng Co Ltd Ｉｃテスタのｄｃ測定機能付きテストヘツド

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098677A (enrdf_load_stackoverflow) * 1973-12-30 1975-08-05
JPS5421147A (en) * 1977-07-18 1979-02-17 Kyushu Nippon Electric Device for measuring ic

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098677A (enrdf_load_stackoverflow) * 1973-12-30 1975-08-05
JPS5421147A (en) * 1977-07-18 1979-02-17 Kyushu Nippon Electric Device for measuring ic

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59228177A (ja) * 1983-06-10 1984-12-21 Hitachi Electronics Eng Co Ltd Ｉｃテスタのｄｃ測定機能付きテストヘツド

Also Published As

Publication number Publication date
JPS6317190B2 (enrdf_load_stackoverflow) 1988-04-12

Similar Documents

Publication Publication Date Title
KR960024421A (ko) 반도체 메모리장치의 테스트 제어회로 및 방법
ATE203851T1 (de) Verfahren und vorrichtung zum zugriff auf inneren prüfschaltungen in einer integrierten schaltung
DE3889140D1 (de) On-chip, On-line-Wechselstrom und Gleichstromfehlererkennungssystem für Taktbaum.
JPS6491074A (en) Memory-contained logic lsi and testing thereof
JPS56107174A (en) Test evaluation device for semiconductor integrated circuit
EP0382360A3 (en) Event qualified testing architecture for integrated circuits
JPS5627667A (en) Method of estimating semiconductor device
JPS5727041A (en) Large-scale integrated circuit having testing function
JPS57105053A (en) Integrated circuit which has incorporated testing circuit for fault detecting circuit
KR910003203B1 (ko) 반도체 칩내에 테스트 입력단의 보호회로를 구비한 테스트 회로
JPS62211570A (ja) プリント基板検査装置
OLIVEIRA Multiple fault analysis in combinational logic circuits[Ph. D. Thesis]
JPS6423548A (en) Semiconductor integrated circuit device
SU483633A1 (ru) Логический пробник
JPS5760865A (en) Integrated circuit device
JPS5789153A (en) Logic comparator for logical operation circuit tester
SU983611A1 (ru) Устройство дл контрол магнитных сердечников
JPS5673361A (en) Testing device of ic
SU1550444A1 (ru) Устройство дл контрол контактировани выводов электронных блоков
JPS574560A (en) Testing method of mos integrated circuit
JPS5690271A (en) Testing method for logic device
JPS5552156A (en) Test unit for logic circuit
Altaf-Ul-Amin et al. An off-chip current sensor for IDDQ testing of CMOS ICs
JPS5731057A (en) Information processing equipment
JPS5784163A (en) Inspecting method for complementary mos integrated circuit