DE3889140D1 - On-chip, On-line-Wechselstrom und Gleichstromfehlererkennungssystem für Taktbaum. - Google Patents

On-chip, On-line-Wechselstrom und Gleichstromfehlererkennungssystem für Taktbaum.

Info

Publication number
DE3889140D1
DE3889140D1 DE3889140T DE3889140T DE3889140D1 DE 3889140 D1 DE3889140 D1 DE 3889140D1 DE 3889140 T DE3889140 T DE 3889140T DE 3889140 T DE3889140 T DE 3889140T DE 3889140 D1 DE3889140 D1 DE 3889140D1
Authority
DE
Germany
Prior art keywords
circuit
signal
clock
chip
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3889140T
Other languages
English (en)
Other versions
DE3889140T2 (de
Inventor
George Thomas Johansson
Maureen Barbara Johansson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE3889140D1 publication Critical patent/DE3889140D1/de
Application granted granted Critical
Publication of DE3889140T2 publication Critical patent/DE3889140T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/1604—Error detection or correction of the data by redundancy in hardware where the fault affects the clock signals of a processing unit and the redundancy is at or within the level of clock signal generation hardware
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/1608—Error detection by comparing the output signals of redundant hardware

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE3889140T 1987-03-02 1988-01-15 On-chip, On-line-Wechselstrom und Gleichstromfehlererkennungssystem für Taktbaum. Expired - Fee Related DE3889140T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/020,637 US4811343A (en) 1987-03-02 1987-03-02 On-chip on-line AC and DC clock tree error detection system

Publications (2)

Publication Number Publication Date
DE3889140D1 true DE3889140D1 (de) 1994-05-26
DE3889140T2 DE3889140T2 (de) 1994-11-17

Family

ID=21799737

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3889140T Expired - Fee Related DE3889140T2 (de) 1987-03-02 1988-01-15 On-chip, On-line-Wechselstrom und Gleichstromfehlererkennungssystem für Taktbaum.

Country Status (4)

Country Link
US (1) US4811343A (de)
EP (1) EP0280848B1 (de)
JP (1) JPH0628037B2 (de)
DE (1) DE3889140T2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5077739A (en) * 1989-05-17 1991-12-31 Unisys Corporation Method for isolating failures of clear signals in instruction processors
US4972414A (en) * 1989-11-13 1990-11-20 International Business Machines Corporation Method and apparatus for detecting oscillator stuck faults in a level sensitive scan design (LSSD) system
US5313476A (en) * 1991-06-28 1994-05-17 International Business Machines Corporation Clock security ring
US5675273A (en) * 1995-09-08 1997-10-07 International Business Machines Corporation Clock regulator with precision midcycle edge timing
US5656963A (en) * 1995-09-08 1997-08-12 International Business Machines Corporation Clock distribution network for reducing clock skew
US5828257A (en) * 1995-09-08 1998-10-27 International Business Machines Corporation Precision time interval division with digital phase delay lines
US5610548A (en) * 1995-09-08 1997-03-11 International Business Machines Corporation Split drive clock buffer
US5614845A (en) * 1995-09-08 1997-03-25 International Business Machines Corporation Independent clock edge regulation
US6125461A (en) * 1998-02-19 2000-09-26 International Business Machines Corporation Method for identifying long paths in integrated circuits
US6272647B1 (en) * 1998-11-20 2001-08-07 Honeywell Inc. Fault tolerant clock voter with recovery
US6467057B1 (en) * 2000-03-01 2002-10-15 Industrial Technology Research Institute Scan driver of LCD with fault detection and correction function
US6763314B2 (en) * 2001-09-28 2004-07-13 International Business Machines Corporation AC defect detection and failure avoidance power up and diagnostic system
US6730540B2 (en) 2002-04-18 2004-05-04 Tru-Si Technologies, Inc. Clock distribution networks and conductive lines in semiconductor integrated circuits
US10215804B2 (en) * 2016-07-27 2019-02-26 International Business Machines Corporation Semiconductor power and performance optimization
CN107908510A (zh) * 2017-11-09 2018-04-13 郑州云海信息技术有限公司 可同时测试多台服务器和电子产品稳定性的无线测试系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3105955A (en) * 1956-03-28 1963-10-01 Sperry Rand Corp Error checking device
US3056108A (en) * 1959-06-30 1962-09-25 Internat Bushiness Machines Co Error check circuit
US3328688A (en) * 1964-08-24 1967-06-27 Robert R Brooks Phase comparator using bistable and logic elements
US3521172A (en) * 1965-11-26 1970-07-21 Martin Marietta Corp Binary phase comparator
US3496477A (en) * 1967-06-29 1970-02-17 Bell Telephone Labor Inc Clock pulse failure detector
JPS5236381B2 (de) * 1972-04-14 1977-09-14
JPS5953515B2 (ja) * 1976-10-25 1984-12-25 株式会社日立製作所 時間差検出回路
US4144448A (en) * 1977-11-29 1979-03-13 International Business Machines Corporation Asynchronous validity checking system and method for monitoring clock signals on separate electrical conductors
DE2853546C2 (de) * 1978-12-12 1982-02-25 Ibm Deutschland Gmbh, 7000 Stuttgart Prüfschaltung für mindestens zwei synchron arbeitende Taktgeber
US4362957A (en) * 1980-12-29 1982-12-07 Gte Automatic Electric Labs Inc. Clock pulse tolerance verification circuit
JPS5831456A (ja) * 1981-08-17 1983-02-24 Matsushita Electronics Corp 論理回路装置の比較試験回路
US4392226A (en) * 1981-09-28 1983-07-05 Ncr Corporation Multiple source clock encoded communications error detection circuit
US4564943A (en) * 1983-07-05 1986-01-14 International Business Machines System path stressing
US4542509A (en) * 1983-10-31 1985-09-17 International Business Machines Corporation Fault testing a clock distribution network
EP0173521A3 (de) * 1984-08-29 1988-05-11 Unisys Corporation Gerät zur automatischen Angleichung von Signalverzögerungen
US4686677A (en) * 1985-08-02 1987-08-11 Unisys Corporation Apparatus and method for detecting time-related faults

Also Published As

Publication number Publication date
JPS63216138A (ja) 1988-09-08
US4811343A (en) 1989-03-07
EP0280848A3 (en) 1990-09-05
EP0280848B1 (de) 1994-04-20
DE3889140T2 (de) 1994-11-17
JPH0628037B2 (ja) 1994-04-13
EP0280848A2 (de) 1988-09-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee