JPS63160301A - Slide contactor - Google Patents

Slide contactor

Info

Publication number
JPS63160301A
JPS63160301A JP61314041A JP31404186A JPS63160301A JP S63160301 A JPS63160301 A JP S63160301A JP 61314041 A JP61314041 A JP 61314041A JP 31404186 A JP31404186 A JP 31404186A JP S63160301 A JPS63160301 A JP S63160301A
Authority
JP
Japan
Prior art keywords
thick film
sliding contact
contact
pattern
wiring board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61314041A
Other languages
Japanese (ja)
Inventor
重雄 塩田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tanaka Kikinzoku Kogyo KK
Original Assignee
Tanaka Kikinzoku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tanaka Kikinzoku Kogyo KK filed Critical Tanaka Kikinzoku Kogyo KK
Priority to JP61314041A priority Critical patent/JPS63160301A/en
Publication of JPS63160301A publication Critical patent/JPS63160301A/en
Pending legal-status Critical Current

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  • Details Of Resistors (AREA)
  • Adjustable Resistors (AREA)
  • Contacts (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、計測器、各種機械等で、検出用、制御用、設
定用、発振器用などに使用されているボリュームスイッ
チ、ポテンシオメータ、トリマー(可変抵抗器の一種)
等で用いられる摺動接点装置の改良に関する。
Detailed Description of the Invention (Field of Industrial Application) The present invention applies to volume switches, potentiometers, and trimmers used for detection, control, setting, oscillators, etc. in measuring instruments, various machines, etc. (a type of variable resistor)
This paper relates to improvements to sliding contact devices used in, etc.

(従来の技術とその問題点) 従来より上記のボリュームスイッチ、ポテンシオメータ
、トリマー等で用いられる摺動接点装置は、セラミック
ス基板上にカーボン(C)や酸化ルテニウム(RuOz
)などの抵抗ペーストを焼成して厚膜抵抗パターンを形
成して成る配線板と、この配線板の厚膜抵抗パターンに
対向して摺動し得るようになされたスプリング端子材に
Ag接点材をかしめ或いは溶接して成るすり接点とによ
り構成されているが、この摺動接点装置は、ノイズが発
生し易く、又接触抵抗がやや高く且つ幾分ばらつきがあ
って不安定であり、しかも摩耗し易くて寿命が短く、接
触信頼性にやや欠けるものであった。
(Prior art and its problems) Sliding contact devices conventionally used in the above-mentioned volume switches, potentiometers, trimmers, etc. are made of carbon (C) or ruthenium oxide (RuOz) on a ceramic substrate.
), etc., to form a thick film resistance pattern, and a spring terminal material that can slide against the thick film resistance pattern of this wiring board, and an Ag contact material. These sliding contact devices are constructed with caulked or welded sliding contacts, but these sliding contact devices tend to generate noise, have somewhat high contact resistance, are unstable due to some variation, and are prone to wear. It was easy to use, short-lived, and somewhat lacking in contact reliability.

この為、セラミックス基板上のカーボンや酸化ルテニウ
ムの厚膜抵抗パターンのすり接点と摺動する部分を、A
g−樹脂系の導体ペーストに置き換えて硬化するかある
いは厚膜抵抗パターンのすり接点と摺動する部分にAg
−樹脂系導体ペーストを重ねて硬化することにより、接
触イS頬性を改善し、又すり接点のAg接点材を硫化防
止の為、Ag−Pd30〜50wt%に置き換えている
For this reason, the part that slides with the sliding contact of the carbon or ruthenium oxide thick film resistor pattern on the ceramic substrate is
g-Replace with resin-based conductive paste and harden, or add Ag to the part that slides with the sliding contact of the thick film resistor pattern.
- By stacking and curing resin-based conductor paste, the contact properties are improved, and the Ag contact material of the sliding contact is replaced with 30 to 50 wt% of Ag-Pd to prevent sulfurization.

然し乍ら、A g −P d 30〜50wt%の接点
材はHv160〜200で硬すぎるのに対し、Ag−樹
脂系の導体ペーストの硬化物である厚膜導体パターンが
軟らかい為、摩耗が多くなり、早期に寿命となる。
However, the contact material containing 30 to 50 wt% of Ag-Pd is too hard at Hv160 to 200, whereas the thick film conductor pattern, which is a cured product of Ag-resin conductor paste, is soft, resulting in increased wear. It reaches the end of its lifespan early.

更にAg−Pd30〜50wt%接点材は、電気伝導度
(IAC33,8〜5.5)が低い為、発熱する等の問
題点があった。
Furthermore, since the Ag-Pd 30-50 wt% contact material has a low electrical conductivity (IAC33.8-5.5), there are problems such as heat generation.

(発明の目的) 本発明は、上記問題点を解決することのできる摺動接点
装置を提供することを目的とするものである。
(Object of the Invention) An object of the present invention is to provide a sliding contact device that can solve the above problems.

(問題点を解決す4ための手段) 前記の問題点を解決するための本発明の摺動接点装置は
、セラミックス基板上に、抵抗ペーストを焼成して厚膜
抵抗パターンを形成し、この厚膜抵抗パターンに接続し
てAg−樹脂系導体ペーストを硬化して厚膜導体パター
ンを形成して成る配線板と、この配線板の厚膜導体パタ
ーンに対向して摺動し得るようになされAg−Cd0.
5〜15wt%の接点材がスプリング端子材に取付けら
れて成るすり接点とにより構成されていることを特徴と
する。
(Means for Solving the Problem 4) The sliding contact device of the present invention for solving the above-mentioned problem is to form a thick film resistance pattern by firing a resistance paste on a ceramic substrate, and to form a thick film resistance pattern on a ceramic substrate. A wiring board formed by connecting to a film resistance pattern and forming a thick film conductor pattern by curing an Ag-resin conductor paste, and an Ag wire which can be slid against the thick film conductor pattern of the wiring board. -Cd0.
It is characterized in that it is constituted by a sliding contact formed by attaching 5 to 15 wt% of contact material to a spring terminal material.

本発明の摺動接点装置に於いて、すり接点の接点材をA
g−CdQ、5〜15wt%とした理由は、Ag中のC
dが0.5wt%未満だと潤滑効果が薄く、そのすり接
点がセラミックス基板上のAg−樹脂系の厚膜導体パタ
ーンとの接触に於いて凝着、剥離が生じ、15wt%を
超えると、酸化物の生成量が多くなりノイズの発生原因
となるがらである。
In the sliding contact device of the present invention, the contact material of the sliding contact is A
The reason for setting g-CdQ to 5 to 15 wt% is that C in Ag
If d is less than 0.5 wt%, the lubricating effect will be weak, and adhesion and peeling will occur when the sliding contact contacts the Ag-resin thick film conductor pattern on the ceramic substrate.If d exceeds 15 wt%, However, the amount of oxides produced increases, causing noise.

(作用) 上記の如く構成された摺動接点装置は、すり接点とセラ
ミックス基板上の厚膜導体パターンとの接触作用におい
て、すり接点のAg−Cd0,5〜15wt%接点材の
硬さく Hv 80〜110)が軟らがく滑りやすいの
で、接触抵抗が低く安定していて、Ag−樹脂系厚膜導
体パターンを損耗することが無く、又凝着、剥離が殆ん
ど無くなり、摩耗が減少するので良好な接触が得られる
。更にすり接点のAg−Cd0.5〜15wt%接点材
の電気伝導度がlAC340〜60%と良好であるので
、発熱しない。
(Function) In the sliding contact device configured as described above, in the contact action between the sliding contact and the thick film conductor pattern on the ceramic substrate, the hardness of the Ag-Cd 0.5 to 15 wt% contact material of the sliding contact is Hv 80. ~110) is soft and slippery, so the contact resistance is low and stable, there is no damage to the Ag-resin thick film conductor pattern, and there is almost no adhesion or peeling, reducing wear. Therefore, good contact can be obtained. Furthermore, since the electrical conductivity of the Ag-Cd 0.5-15 wt% contact material of the sliding contact is as good as 340-60% lAC, no heat is generated.

(実施例) 本発明の摺動接点装置の実施例を説明すると、図に示す
如き板厚Q 、 5 mm、直径30m−の純度98%
のA 1 z 03基板1上の外周に幅3 mmでRu
0zの抵抗ペーストをスクリーン印刷し、800℃で焼
成して厚さ10μの厚膜抵抗パターン2を形成し、この
厚膜抵抗パターン2に接続して、周方向に、Ag−樹脂
系導体ペーストをスクリーン印刷し、130℃で硬化し
て、0.2鶴間隔に幅0.2鶴、長さ7 xH1厚さ1
0μの厚膜導体パターン(Ag−樹脂26wt%)3を
形成して配線板4とした。一方、この配線板4の厚膜導
体パターン3に対向して夫々摺動するようになされた2
種のすり接点5は、Ag−Cd1wt%とAg−Cd 
3−ニッケル0.1wt%の2種の接点線材(直径1 
、5 n+ )から作製した頭部径3鶴、頭部厚さ0.
6mm、脚部径1 、5 vrs、脚部長1.5+uの
2種のリベット接点6を、夫々幅4鰭、厚さ0.15w
のB e−Cuより成るスプリング端子材7の接点取付
穴に挿入しかしめて成るものである。
(Example) To explain an example of the sliding contact device of the present invention, as shown in the figure, the plate thickness Q is 5 mm, the diameter is 30 m, and the purity is 98%.
Ru on the outer periphery of the A 1 z 03 substrate 1 with a width of 3 mm.
0z resistor paste is screen printed and baked at 800°C to form a thick film resistor pattern 2 with a thickness of 10 μm. Connected to this thick film resistor pattern 2, an Ag-resin conductor paste is applied in the circumferential direction. Screen print and cure at 130℃, width 0.2 cranes at 0.2 crane intervals, length 7 x H1 thickness 1
A wiring board 4 was formed by forming a thick film conductor pattern (Ag-resin 26 wt %) 3 having a thickness of 0 μm. On the other hand, the 2 parts are slidably arranged to face the thick film conductor pattern 3 of the wiring board 4, respectively.
The seed sliding contact 5 is composed of 1wt% Ag-Cd and Ag-Cd.
3-Two types of contact wires containing 0.1 wt% nickel (diameter 1
, 5 n+) with a head diameter of 3 cranes and a head thickness of 0.
Two types of rivet contacts 6 with a diameter of 6 mm, a leg diameter of 1 and 5 vrs, and a leg length of 1.5 + u, each with a width of 4 fins and a thickness of 0.15 w.
The contact mounting hole of the spring terminal material 7 made of Be-Cu is inserted into and tightened.

このように構成された実施例1.2の摺動接点装置と、
A g −P d30wt%接点材を有するすり接点を
配線板のAg−樹脂の厚膜導体パターンと対向させて成
る従来の摺動接点装置とを、下記の試験条件にて摺動開
閉試験を行った処、下記の表に示すような結果を得た。
The sliding contact device of Example 1.2 configured in this way,
A sliding opening/closing test was conducted under the following test conditions using a conventional sliding contact device consisting of a sliding contact having a 30wt% A g -P d contact material facing a thick film conductor pattern made of Ag-resin on a wiring board. However, we obtained the results shown in the table below.

試験条件 接触カニ10g、動作二回転往復型(55度)、駆動:
60ストロ一ク/min、通電:12■、100mA上
記の表で明らかなように実施例1.2の摺動接点装置は
、従来例の摺動装置に比し、寿命が大概倍増しているこ
とが判る。これはひとえにすり接点5のAg−Cd0.
5〜15wt%接点材の硬さが軟らかく滑りやすい為、
対向するAg−樹脂系の厚膜導体パターン3を損耗する
ことが無く、又凝着、剥離することが無く、摩耗が減少
し、更にAg−Cd0.5〜15wt%の接点材の電気
伝導度が良好で発熱することが無いからである。
Test conditions Contact crab 10g, action 2 rotation reciprocating type (55 degrees), drive:
60 strokes/min, current flow: 12 mm, 100 mA As is clear from the above table, the sliding contact device of Example 1.2 has almost double the lifespan compared to the conventional sliding device. I understand that. This is simply due to the Ag-Cd0 of the sliding contact 5.
5-15wt% The hardness of the contact material is soft and slippery, so
The opposing thick film conductor pattern 3 made of Ag-resin is not damaged, and there is no adhesion or peeling, reducing wear, and the electrical conductivity of the contact material of 0.5 to 15 wt% Ag-Cd. This is because it has good properties and does not generate heat.

尚、前記の寿命は、厚膜導体パターン3の摩耗により、
すり接点5が、l、O,基板との接触となって、オープ
ン状態(接触抵抗無限大)となった場合と、厚膜導体パ
ターン3間のスリット部の目詰まりによりショートした
場合で判定した。
Note that the above-mentioned lifespan is due to wear of the thick film conductor pattern 3.
Judgments were made based on the cases where the sliding contact 5 came into contact with the L, O, and substrate, resulting in an open state (infinite contact resistance), and the case where a short circuit occurred due to clogging of the slit between the thick film conductor patterns 3. .

尚、上記実施例の摺動接点装置の配線板4は円形である
が、矩形でも良いものである。その場合、厚膜抵抗パタ
ーンは矩形の配線板の一側端に形成し、厚Hり導体パタ
ーンは厚膜抵抗パターンに接続してその長手方向に一定
間隔に平行に形成すると良い。そしてすり接点は厚膜導
体パターンに対向して厚膜抵抗パターンの長手方向に摺
動し得るようにする。またセラミックス基板上にベロー
ズ形状に前後に往復させた厚膜抵抗パターンを形成し、
その上に厚膜導体パターンを一定間隔に並べて形成した
配線板と、この配線板の厚膜導体パターンに対向して摺
動するようにしたすり接点とより成る摺動接点装置とし
ても良い。
Although the wiring board 4 of the sliding contact device in the above embodiment is circular, it may also be rectangular. In that case, the thick film resistor pattern is preferably formed at one end of the rectangular wiring board, and the thick H-shaped conductor patterns are preferably connected to the thick film resistor pattern and formed parallel to it at regular intervals in its longitudinal direction. The sliding contact is slidable in the longitudinal direction of the thick film resistor pattern, facing the thick film conductor pattern. In addition, a thick film resistor pattern is formed on the ceramic substrate, reciprocating back and forth in a bellows shape.
A sliding contact device may be provided which includes a wiring board on which thick film conductor patterns are formed at regular intervals, and a sliding contact that slides in opposition to the thick film conductor patterns of the wiring board.

さらに実施例2のようにCdの一部を0.01〜1wt
%の範囲で鉄族元素で置き替えてもよいものである。
Furthermore, as in Example 2, a part of Cd is added in an amount of 0.01 to 1 wt.
It may be replaced with an iron group element within a range of %.

(発明の効果) 以上の説明で判るように本発明の摺動接点装置は、すり
接点のAg−Cd0.5〜15匈t%が硬さくHV80
〜110)が軟らかく滑りやすいので、接触作用におい
てセラミックス基板上のAg=樹脂系厚膜導体パターン
が損耗することが無(、又凝着、ヱ1j離が殆んど無(
なり、摩耗が減少するので良好な接触が得られる。
(Effects of the Invention) As can be seen from the above explanation, the sliding contact device of the present invention has a hardness of 0.5 to 15 t% of Ag-Cd in the sliding contact, and has a hardness of HV80.
~110) is soft and slippery, so there is no wear of the Ag=resin thick film conductor pattern on the ceramic substrate during contact action (and there is almost no adhesion or separation (
This reduces wear and provides good contact.

従って、接触信頼性が向上し、摺動接点装置の寿命が著
しく増長する。更にすり接点のAg−Cd0.5〜15
wt%接点材の電気伝導度が良好であるので、接触作用
において、発熱せず、溶着が起こりにくい。従って、摺
動接点装置の耐溶着性が著しく向上する。
Therefore, the contact reliability is improved and the life of the sliding contact device is significantly extended. Furthermore, the Ag-Cd of the sliding contact is 0.5 to 15.
Since the electrical conductivity of the wt% contact material is good, no heat is generated during contact action, and welding is less likely to occur. Therefore, the welding resistance of the sliding contact device is significantly improved.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明の摺動接点装置の一実施例を示す概略斜視図
である。
The figure is a schematic perspective view showing an embodiment of the sliding contact device of the present invention.

Claims (1)

【特許請求の範囲】[Claims]  セラミックス基板上に、抵抗ペーストを焼成して厚膜
抵抗パターンを形成し、この厚膜抵抗パターンに接続し
てAg−樹脂系導体ペーストを硬化して厚膜導体パター
ンを形成して成る配線板と、この配線板の厚膜導体パタ
ーンに対向して摺動し得るようになされAg−Cd0.
5〜15wt%の接点材がスプリング端子材に取り付け
られて成るすり接点とにより構成されていることを特徴
とする摺動接点装置。
A wiring board is formed by firing a resistor paste to form a thick film resistor pattern on a ceramic substrate, and connecting it to the thick film resistor pattern to harden an Ag-resin conductor paste to form a thick film conductor pattern. , Ag-Cd0. is made to be able to slide against the thick film conductor pattern of this wiring board.
A sliding contact device comprising a sliding contact in which 5 to 15 wt% of contact material is attached to a spring terminal material.
JP61314041A 1986-12-24 1986-12-24 Slide contactor Pending JPS63160301A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61314041A JPS63160301A (en) 1986-12-24 1986-12-24 Slide contactor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61314041A JPS63160301A (en) 1986-12-24 1986-12-24 Slide contactor

Publications (1)

Publication Number Publication Date
JPS63160301A true JPS63160301A (en) 1988-07-04

Family

ID=18048500

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61314041A Pending JPS63160301A (en) 1986-12-24 1986-12-24 Slide contactor

Country Status (1)

Country Link
JP (1) JPS63160301A (en)

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