JPS6315623B2 - - Google Patents
Info
- Publication number
- JPS6315623B2 JPS6315623B2 JP58064728A JP6472883A JPS6315623B2 JP S6315623 B2 JPS6315623 B2 JP S6315623B2 JP 58064728 A JP58064728 A JP 58064728A JP 6472883 A JP6472883 A JP 6472883A JP S6315623 B2 JPS6315623 B2 JP S6315623B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- processing device
- scan
- data processing
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012545 processing Methods 0.000 claims description 38
- 238000001514 detection method Methods 0.000 claims description 17
- 238000012423 maintenance Methods 0.000 claims description 16
- 230000003213 activating effect Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 3
- 230000004913 activation Effects 0.000 claims description 2
- 238000003745 diagnosis Methods 0.000 description 10
- 238000002405 diagnostic procedure Methods 0.000 description 5
- 238000011161 development Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012905 input function Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000004393 prognosis Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58064728A JPS59189454A (ja) | 1983-04-13 | 1983-04-13 | デ−タ処理装置の診断方式 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58064728A JPS59189454A (ja) | 1983-04-13 | 1983-04-13 | デ−タ処理装置の診断方式 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59189454A JPS59189454A (ja) | 1984-10-27 |
| JPS6315623B2 true JPS6315623B2 (US06826419-20041130-M00005.png) | 1988-04-05 |
Family
ID=13266498
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58064728A Granted JPS59189454A (ja) | 1983-04-13 | 1983-04-13 | デ−タ処理装置の診断方式 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59189454A (US06826419-20041130-M00005.png) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01137618U (US06826419-20041130-M00005.png) * | 1988-03-16 | 1989-09-20 |
-
1983
- 1983-04-13 JP JP58064728A patent/JPS59189454A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01137618U (US06826419-20041130-M00005.png) * | 1988-03-16 | 1989-09-20 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59189454A (ja) | 1984-10-27 |
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