JPS6314440B2 - - Google Patents

Info

Publication number
JPS6314440B2
JPS6314440B2 JP57140704A JP14070482A JPS6314440B2 JP S6314440 B2 JPS6314440 B2 JP S6314440B2 JP 57140704 A JP57140704 A JP 57140704A JP 14070482 A JP14070482 A JP 14070482A JP S6314440 B2 JPS6314440 B2 JP S6314440B2
Authority
JP
Japan
Prior art keywords
address
circuit
parity
signal
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57140704A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5930300A (ja
Inventor
Katsuji Hosoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP57140704A priority Critical patent/JPS5930300A/ja
Publication of JPS5930300A publication Critical patent/JPS5930300A/ja
Publication of JPS6314440B2 publication Critical patent/JPS6314440B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP57140704A 1982-08-13 1982-08-13 集積ｍｏｓ型メモリ回路素子 Granted JPS5930300A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57140704A JPS5930300A (ja) 1982-08-13 1982-08-13 集積ｍｏｓ型メモリ回路素子

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57140704A JPS5930300A (ja) 1982-08-13 1982-08-13 集積ｍｏｓ型メモリ回路素子

Publications (2)

Publication Number Publication Date
JPS5930300A JPS5930300A (ja) 1984-02-17
JPS6314440B2 true JPS6314440B2 (enrdf_load_stackoverflow) 1988-03-30

Family

ID=15274786

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57140704A Granted JPS5930300A (ja) 1982-08-13 1982-08-13 集積ｍｏｓ型メモリ回路素子

Country Status (1)

Country Link
JP (1) JPS5930300A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009211797A (ja) * 2008-02-29 2009-09-17 Hynix Semiconductor Inc 半導体素子

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4825416A (en) * 1986-05-07 1989-04-25 Advanced Micro Devices, Inc. Integrated electronic memory circuit with internal timing and operable in both latch-based and register-based systems
US5392302A (en) * 1991-03-13 1995-02-21 Quantum Corp. Address error detection technique for increasing the reliability of a storage subsystem
US5311520A (en) * 1991-08-29 1994-05-10 At&T Bell Laboratories Method and apparatus for programmable memory control with error regulation and test functions

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009211797A (ja) * 2008-02-29 2009-09-17 Hynix Semiconductor Inc 半導体素子

Also Published As

Publication number Publication date
JPS5930300A (ja) 1984-02-17

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