JPS6313123B2 - - Google Patents

Info

Publication number
JPS6313123B2
JPS6313123B2 JP55140611A JP14061180A JPS6313123B2 JP S6313123 B2 JPS6313123 B2 JP S6313123B2 JP 55140611 A JP55140611 A JP 55140611A JP 14061180 A JP14061180 A JP 14061180A JP S6313123 B2 JPS6313123 B2 JP S6313123B2
Authority
JP
Japan
Prior art keywords
scanning
peak position
image
slit
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55140611A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5766303A (en
Inventor
Yasuo Nakagawa
Hiroshi Makihira
Sohei Ikeda
Satoru Ezaki
Osamu Harada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55140611A priority Critical patent/JPS5766303A/ja
Priority to US06/286,068 priority patent/US4472056A/en
Publication of JPS5766303A publication Critical patent/JPS5766303A/ja
Publication of JPS6313123B2 publication Critical patent/JPS6313123B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Image Processing (AREA)
JP55140611A 1980-07-23 1980-10-09 Configuration sensing device Granted JPS5766303A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP55140611A JPS5766303A (en) 1980-10-09 1980-10-09 Configuration sensing device
US06/286,068 US4472056A (en) 1980-07-23 1981-07-23 Shape detecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55140611A JPS5766303A (en) 1980-10-09 1980-10-09 Configuration sensing device

Publications (2)

Publication Number Publication Date
JPS5766303A JPS5766303A (en) 1982-04-22
JPS6313123B2 true JPS6313123B2 (enrdf_load_stackoverflow) 1988-03-24

Family

ID=15272726

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55140611A Granted JPS5766303A (en) 1980-07-23 1980-10-09 Configuration sensing device

Country Status (1)

Country Link
JP (1) JPS5766303A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60259904A (ja) * 1984-06-05 1985-12-23 Kokusai Kogyo Kk 路面横断プロフイル測定方法
JPH10124646A (ja) * 1996-10-17 1998-05-15 Minolta Co Ltd 3次元計測装置

Also Published As

Publication number Publication date
JPS5766303A (en) 1982-04-22

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