JPS6310458B2 - - Google Patents

Info

Publication number
JPS6310458B2
JPS6310458B2 JP58062774A JP6277483A JPS6310458B2 JP S6310458 B2 JPS6310458 B2 JP S6310458B2 JP 58062774 A JP58062774 A JP 58062774A JP 6277483 A JP6277483 A JP 6277483A JP S6310458 B2 JPS6310458 B2 JP S6310458B2
Authority
JP
Japan
Prior art keywords
data
scan
scan path
buffer means
bit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58062774A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59188756A (ja
Inventor
Shukichi Moryama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP58062774A priority Critical patent/JPS59188756A/ja
Publication of JPS59188756A publication Critical patent/JPS59188756A/ja
Publication of JPS6310458B2 publication Critical patent/JPS6310458B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/267Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP58062774A 1983-04-08 1983-04-08 スキヤンパス制御装置 Granted JPS59188756A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58062774A JPS59188756A (ja) 1983-04-08 1983-04-08 スキヤンパス制御装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58062774A JPS59188756A (ja) 1983-04-08 1983-04-08 スキヤンパス制御装置

Publications (2)

Publication Number Publication Date
JPS59188756A JPS59188756A (ja) 1984-10-26
JPS6310458B2 true JPS6310458B2 (enrdf_load_stackoverflow) 1988-03-07

Family

ID=13210052

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58062774A Granted JPS59188756A (ja) 1983-04-08 1983-04-08 スキヤンパス制御装置

Country Status (1)

Country Link
JP (1) JPS59188756A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS59188756A (ja) 1984-10-26

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