JPS6350733B2 - - Google Patents

Info

Publication number
JPS6350733B2
JPS6350733B2 JP58118897A JP11889783A JPS6350733B2 JP S6350733 B2 JPS6350733 B2 JP S6350733B2 JP 58118897 A JP58118897 A JP 58118897A JP 11889783 A JP11889783 A JP 11889783A JP S6350733 B2 JPS6350733 B2 JP S6350733B2
Authority
JP
Japan
Prior art keywords
memory
block
scan
state
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58118897A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6010349A (ja
Inventor
Katsuhiko Shioya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58118897A priority Critical patent/JPS6010349A/ja
Publication of JPS6010349A publication Critical patent/JPS6010349A/ja
Publication of JPS6350733B2 publication Critical patent/JPS6350733B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Communication Control (AREA)
JP58118897A 1983-06-30 1983-06-30 スキヤン方式 Granted JPS6010349A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58118897A JPS6010349A (ja) 1983-06-30 1983-06-30 スキヤン方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58118897A JPS6010349A (ja) 1983-06-30 1983-06-30 スキヤン方式

Publications (2)

Publication Number Publication Date
JPS6010349A JPS6010349A (ja) 1985-01-19
JPS6350733B2 true JPS6350733B2 (enrdf_load_stackoverflow) 1988-10-11

Family

ID=14747864

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58118897A Granted JPS6010349A (ja) 1983-06-30 1983-06-30 スキヤン方式

Country Status (1)

Country Link
JP (1) JPS6010349A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0628060B2 (ja) * 1989-09-29 1994-04-13 キヤノン株式会社 文字処理装置
JPH0630104B2 (ja) * 1989-09-29 1994-04-20 キヤノン株式会社 文字処理装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS607298B2 (ja) * 1979-12-26 1985-02-23 富士通株式会社 スキヤンイン制御方式

Also Published As

Publication number Publication date
JPS6010349A (ja) 1985-01-19

Similar Documents

Publication Publication Date Title
JP2527935B2 (ja) 半導体メモリ試験装置
JPH0312573A (ja) テストデータ変更回路を有する論理回路テスト装置
EP0324386A2 (en) Memory testing device
JPH04192809A (ja) プログラマブル集積回路
JPS61204744A (ja) 診断機能を有するram内蔵lsiおよびその診断方法
JPS6350733B2 (enrdf_load_stackoverflow)
KR100276504B1 (ko) 오류 데이터 저장 시스템
JPS6319058A (ja) メモリ装置
US4658376A (en) Magnetic bubble file system
JP3389317B2 (ja) 集積回路のテスト回路
JPH0120514B2 (enrdf_load_stackoverflow)
KR940005767B1 (ko) 시스템 메모리 및 외부캐시메모리의 내용일치 유지장치
JPS59218548A (ja) 論理回路
JPS6349811B2 (enrdf_load_stackoverflow)
JPH0668539B2 (ja) 半導体メモリ試験装置
JPH0672910B2 (ja) テストパタ−ンメモリ回路
JPS634500A (ja) テスト回路付きram装置
JPH05225045A (ja) シーケンスコントローラ
KR950020736A (ko) 반도체 기억장치
JPH04204273A (ja) Lsi実装ボード及びデータ処理装置
JPS6048059B2 (ja) 磁気バブル記憶装置
JPS61262945A (ja) 記憶装置
JPS5947264B2 (ja) 試験パタ−ンのコピ−装置
JPH0746125B2 (ja) スキャンテスト制御回路
JPS63241783A (ja) 半導体記憶装置