JPS6298764A - 半導体装置 - Google Patents
半導体装置Info
- Publication number
- JPS6298764A JPS6298764A JP60240105A JP24010585A JPS6298764A JP S6298764 A JPS6298764 A JP S6298764A JP 60240105 A JP60240105 A JP 60240105A JP 24010585 A JP24010585 A JP 24010585A JP S6298764 A JPS6298764 A JP S6298764A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- region
- well
- conductivity type
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/64—Double-diffused metal-oxide semiconductor [DMOS] FETs
- H10D30/65—Lateral DMOS [LDMOS] FETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/601—Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs
- H10D30/603—Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs having asymmetry in the channel direction, e.g. lateral high-voltage MISFETs having drain offset region or extended drain IGFETs [EDMOS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
- H10D84/854—Complementary IGFETs, e.g. CMOS comprising arrangements for preventing bipolar actions between the different IGFET regions, e.g. arrangements for latchup prevention
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/213—Channel regions of field-effect devices
- H10D62/221—Channel regions of field-effect devices of FETs
- H10D62/235—Channel regions of field-effect devices of FETs of IGFETs
- H10D62/299—Channel regions of field-effect devices of FETs of IGFETs having lateral doping variations
- H10D62/307—Channel regions of field-effect devices of FETs of IGFETs having lateral doping variations the doping variations being parallel to the channel lengths
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/393—Body regions of DMOS transistors or IGBTs
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60240105A JPS6298764A (ja) | 1985-10-25 | 1985-10-25 | 半導体装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60240105A JPS6298764A (ja) | 1985-10-25 | 1985-10-25 | 半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6298764A true JPS6298764A (ja) | 1987-05-08 |
| JPH0243347B2 JPH0243347B2 (enrdf_load_stackoverflow) | 1990-09-28 |
Family
ID=17054563
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60240105A Granted JPS6298764A (ja) | 1985-10-25 | 1985-10-25 | 半導体装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6298764A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6825543B2 (en) | 2000-12-28 | 2004-11-30 | Canon Kabushiki Kaisha | Semiconductor device, method for manufacturing the same, and liquid jet apparatus |
| US6867457B2 (en) | 2002-07-10 | 2005-03-15 | Canon Kabushiki Kaisha | Semiconductor device and liquid jetting device using the same |
-
1985
- 1985-10-25 JP JP60240105A patent/JPS6298764A/ja active Granted
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6825543B2 (en) | 2000-12-28 | 2004-11-30 | Canon Kabushiki Kaisha | Semiconductor device, method for manufacturing the same, and liquid jet apparatus |
| KR100486072B1 (ko) * | 2000-12-28 | 2005-04-29 | 캐논 가부시끼가이샤 | 반도체장치와, 그 제조방법 및 액체분사장치 |
| US7056798B2 (en) | 2000-12-28 | 2006-06-06 | Canon Kabushiki Kaisha | Semiconductor device, method for manufacturing the same, and liquid jet apparatus |
| EP2302677A1 (en) | 2000-12-28 | 2011-03-30 | Canon Kabushiki Kaisha | Method for manufacturing a semiconductor device |
| JP2014039055A (ja) * | 2000-12-28 | 2014-02-27 | Canon Inc | 半導体装置およびそれを用いた液体吐出装置 |
| US6867457B2 (en) | 2002-07-10 | 2005-03-15 | Canon Kabushiki Kaisha | Semiconductor device and liquid jetting device using the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0243347B2 (enrdf_load_stackoverflow) | 1990-09-28 |
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