JPS626653B2 - - Google Patents

Info

Publication number
JPS626653B2
JPS626653B2 JP54057252A JP5725279A JPS626653B2 JP S626653 B2 JPS626653 B2 JP S626653B2 JP 54057252 A JP54057252 A JP 54057252A JP 5725279 A JP5725279 A JP 5725279A JP S626653 B2 JPS626653 B2 JP S626653B2
Authority
JP
Japan
Prior art keywords
probe
board
socket
electrode
probe board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54057252A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55148436A (en
Inventor
Masaaki Kanda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP5725279A priority Critical patent/JPS55148436A/ja
Publication of JPS55148436A publication Critical patent/JPS55148436A/ja
Publication of JPS626653B2 publication Critical patent/JPS626653B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP5725279A 1979-05-10 1979-05-10 Probe base plate Granted JPS55148436A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5725279A JPS55148436A (en) 1979-05-10 1979-05-10 Probe base plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5725279A JPS55148436A (en) 1979-05-10 1979-05-10 Probe base plate

Publications (2)

Publication Number Publication Date
JPS55148436A JPS55148436A (en) 1980-11-19
JPS626653B2 true JPS626653B2 (cs) 1987-02-12

Family

ID=13050331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5725279A Granted JPS55148436A (en) 1979-05-10 1979-05-10 Probe base plate

Country Status (1)

Country Link
JP (1) JPS55148436A (cs)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4514022A (en) * 1983-06-29 1985-04-30 Tektronix, Inc. Probe cable assemblies
US4716500A (en) * 1985-10-18 1987-12-29 Tektronix, Inc. Probe cable assembly
US4926117A (en) * 1988-05-02 1990-05-15 Micron Technology, Inc. Burn-in board having discrete test capability
US5923176A (en) * 1991-08-19 1999-07-13 Ncr Corporation High speed test fixture

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593581Y2 (ja) * 1977-01-20 1984-01-31 日本電気株式会社 プロ−ブカ−ド

Also Published As

Publication number Publication date
JPS55148436A (en) 1980-11-19

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