JPS6261334B2 - - Google Patents
Info
- Publication number
- JPS6261334B2 JPS6261334B2 JP22300784A JP22300784A JPS6261334B2 JP S6261334 B2 JPS6261334 B2 JP S6261334B2 JP 22300784 A JP22300784 A JP 22300784A JP 22300784 A JP22300784 A JP 22300784A JP S6261334 B2 JPS6261334 B2 JP S6261334B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- cooling
- cooling gas
- gas
- substrate holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000758 substrate Substances 0.000 claims description 56
- 239000000112 cooling gas Substances 0.000 claims description 37
- 238000001816 cooling Methods 0.000 claims description 23
- 239000007789 gas Substances 0.000 claims description 17
- 239000000565 sealant Substances 0.000 claims 1
- 239000003566 sealing material Substances 0.000 description 8
- 230000000694 effects Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Physical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22300784A JPS61103530A (ja) | 1984-10-25 | 1984-10-25 | 真空処理装置における基板の冷却機構 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22300784A JPS61103530A (ja) | 1984-10-25 | 1984-10-25 | 真空処理装置における基板の冷却機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61103530A JPS61103530A (ja) | 1986-05-22 |
JPS6261334B2 true JPS6261334B2 (enrdf_load_stackoverflow) | 1987-12-21 |
Family
ID=16791362
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22300784A Granted JPS61103530A (ja) | 1984-10-25 | 1984-10-25 | 真空処理装置における基板の冷却機構 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61103530A (enrdf_load_stackoverflow) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0689444B2 (ja) * | 1986-10-31 | 1994-11-09 | 東京エレクトロン株式会社 | 薄膜形成装置 |
JPH0772351B2 (ja) * | 1986-12-01 | 1995-08-02 | 株式会社日立製作所 | 金属薄膜選択成長方法 |
JPH0713960B2 (ja) * | 1986-12-23 | 1995-02-15 | 日本電気株式会社 | ドライエッチング装置 |
JP2719332B2 (ja) * | 1987-05-25 | 1998-02-25 | 株式会社日立製作所 | プラズマ処理方法 |
JP2656658B2 (ja) * | 1990-10-11 | 1997-09-24 | 株式会社日立製作所 | 試料温度制御方法及び真空処理装置 |
JPH05182930A (ja) * | 1991-11-29 | 1993-07-23 | Nichiden Mach Ltd | ウェーハ冷却装置 |
US5864162A (en) * | 1993-07-12 | 1999-01-26 | Peregrine Seimconductor Corporation | Apparatus and method of making a self-aligned integrated resistor load on ultrathin silicon on sapphire |
US5930638A (en) * | 1993-07-12 | 1999-07-27 | Peregrine Semiconductor Corp. | Method of making a low parasitic resistor on ultrathin silicon on insulator |
US5416043A (en) * | 1993-07-12 | 1995-05-16 | Peregrine Semiconductor Corporation | Minimum charge FET fabricated on an ultrathin silicon on sapphire wafer |
US5572040A (en) * | 1993-07-12 | 1996-11-05 | Peregrine Semiconductor Corporation | High-frequency wireless communication system on a single ultrathin silicon on sapphire chip |
US5863823A (en) * | 1993-07-12 | 1999-01-26 | Peregrine Semiconductor Corporation | Self-aligned edge control in silicon on insulator |
US5973363A (en) * | 1993-07-12 | 1999-10-26 | Peregrine Semiconductor Corp. | CMOS circuitry with shortened P-channel length on ultrathin silicon on insulator |
JP3220619B2 (ja) * | 1995-05-24 | 2001-10-22 | 松下電器産業株式会社 | ガス伝熱プラズマ処理装置 |
JP2002050809A (ja) | 2000-08-01 | 2002-02-15 | Anelva Corp | 基板処理装置及び方法 |
WO2011043063A1 (ja) * | 2009-10-05 | 2011-04-14 | キヤノンアネルバ株式会社 | 基板冷却装置、スパッタリング装置および電子デバイスの製造方法 |
CN108847382B (zh) * | 2018-06-26 | 2020-10-16 | 上海华力微电子有限公司 | 一种气压调节装置、气压调节方法及晶圆刻蚀设备 |
-
1984
- 1984-10-25 JP JP22300784A patent/JPS61103530A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61103530A (ja) | 1986-05-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |