JPS6255294B2 - - Google Patents

Info

Publication number
JPS6255294B2
JPS6255294B2 JP1436280A JP1436280A JPS6255294B2 JP S6255294 B2 JPS6255294 B2 JP S6255294B2 JP 1436280 A JP1436280 A JP 1436280A JP 1436280 A JP1436280 A JP 1436280A JP S6255294 B2 JPS6255294 B2 JP S6255294B2
Authority
JP
Japan
Prior art keywords
electron beam
stripe
large area
marks
correction coefficient
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1436280A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56112726A (en
Inventor
Kazumitsu Tanaka
Nobuo Goto
Hitoshi Takemura
Tetsuo Yuasa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP1436280A priority Critical patent/JPS56112726A/ja
Publication of JPS56112726A publication Critical patent/JPS56112726A/ja
Publication of JPS6255294B2 publication Critical patent/JPS6255294B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H01J37/3045Object or beam position registration

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP1436280A 1980-02-08 1980-02-08 Exposure of electron beam Granted JPS56112726A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1436280A JPS56112726A (en) 1980-02-08 1980-02-08 Exposure of electron beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1436280A JPS56112726A (en) 1980-02-08 1980-02-08 Exposure of electron beam

Publications (2)

Publication Number Publication Date
JPS56112726A JPS56112726A (en) 1981-09-05
JPS6255294B2 true JPS6255294B2 (enrdf_load_stackoverflow) 1987-11-19

Family

ID=11858942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1436280A Granted JPS56112726A (en) 1980-02-08 1980-02-08 Exposure of electron beam

Country Status (1)

Country Link
JP (1) JPS56112726A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS56112726A (en) 1981-09-05

Similar Documents

Publication Publication Date Title
US4362942A (en) Electron beam exposure system and an apparatus for carrying out the same
US4621371A (en) Method of forming by projection an integrated circuit pattern on a semiconductor wafer
JPH0336299B2 (enrdf_load_stackoverflow)
JP3335011B2 (ja) マスク及びこれを用いる荷電粒子ビーム露光方法
JPS6255294B2 (enrdf_load_stackoverflow)
JP3526385B2 (ja) パターン形成装置
JP2001052989A (ja) 荷電粒子ビーム露光方法、荷電粒子ビーム露光装置及びデバイス製造方法
JPH047088B2 (enrdf_load_stackoverflow)
US4413187A (en) Method for exposing an electron beam
KR20180083265A (ko) 하전 입자빔 묘화 장치 및 하전 입자빔 묘화 방법
JP2786314B2 (ja) 荷電粒子ビーム描画装置の偏向歪補正方法
JP2706599B2 (ja) 電子線描画方法とその装置
JPS59178726A (ja) パタ−ン転写用マスクの製造方法
JPS5922325A (ja) 電子ビ−ム描画装置
JP3914817B2 (ja) 荷電粒子ビーム描画方法
JP3105657B2 (ja) 荷電粒子ビーム描画方法
JP2502704B2 (ja) 電子ビ―ム描画方法
JP3195112B2 (ja) 電子線描画装置
JP3157968B2 (ja) 荷電粒子ビーム露光方法
JPH07262953A (ja) 荷電粒子ビーム露光装置及び露光方法
JP3464832B2 (ja) 荷電ビーム描画装置の位置合わせ方法及び位置合わせマーク
JPS6221216A (ja) 電子ビ−ム露光装置
JP3351389B2 (ja) 電子線露光装置及び電子線露光方法
JP3161101B2 (ja) 荷電粒子線描画装置
JPH07111943B2 (ja) 電子ビ−ム露光装置