JPS6253939B2 - - Google Patents

Info

Publication number
JPS6253939B2
JPS6253939B2 JP2666479A JP2666479A JPS6253939B2 JP S6253939 B2 JPS6253939 B2 JP S6253939B2 JP 2666479 A JP2666479 A JP 2666479A JP 2666479 A JP2666479 A JP 2666479A JP S6253939 B2 JPS6253939 B2 JP S6253939B2
Authority
JP
Japan
Prior art keywords
electron beam
signal
dose
pulse width
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2666479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55120134A (en
Inventor
Masatoshi Utaka
Sumio Hosaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Original Assignee
CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHO ERU ESU AI GIJUTSU KENKYU KUMIAI filed Critical CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Priority to JP2666479A priority Critical patent/JPS55120134A/ja
Publication of JPS55120134A publication Critical patent/JPS55120134A/ja
Publication of JPS6253939B2 publication Critical patent/JPS6253939B2/ja
Granted legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/045Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3174Particle-beam lithography, e.g. electron beam lithography
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Analytical Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Electron Beam Exposure (AREA)
JP2666479A 1979-03-09 1979-03-09 Apparatus for electron-beam lithography Granted JPS55120134A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2666479A JPS55120134A (en) 1979-03-09 1979-03-09 Apparatus for electron-beam lithography

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2666479A JPS55120134A (en) 1979-03-09 1979-03-09 Apparatus for electron-beam lithography

Publications (2)

Publication Number Publication Date
JPS55120134A JPS55120134A (en) 1980-09-16
JPS6253939B2 true JPS6253939B2 (enrdf_load_stackoverflow) 1987-11-12

Family

ID=12199666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2666479A Granted JPS55120134A (en) 1979-03-09 1979-03-09 Apparatus for electron-beam lithography

Country Status (1)

Country Link
JP (1) JPS55120134A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0319653U (enrdf_load_stackoverflow) * 1989-07-05 1991-02-26
JPH0413245U (enrdf_load_stackoverflow) * 1990-05-25 1992-02-03

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01278725A (ja) * 1988-05-02 1989-11-09 Fujitsu Ltd 荷電粒子ビーム露光装置
JPH0226015A (ja) * 1988-07-15 1990-01-29 Toshiba Mach Co Ltd 電子ビーム描画方法及び描画装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0319653U (enrdf_load_stackoverflow) * 1989-07-05 1991-02-26
JPH0413245U (enrdf_load_stackoverflow) * 1990-05-25 1992-02-03

Also Published As

Publication number Publication date
JPS55120134A (en) 1980-09-16

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