JPS6248194B2 - - Google Patents
Info
- Publication number
- JPS6248194B2 JPS6248194B2 JP56188344A JP18834481A JPS6248194B2 JP S6248194 B2 JPS6248194 B2 JP S6248194B2 JP 56188344 A JP56188344 A JP 56188344A JP 18834481 A JP18834481 A JP 18834481A JP S6248194 B2 JPS6248194 B2 JP S6248194B2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- ground
- voltage measuring
- input terminal
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/145—Indicating the presence of current or voltage
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18834481A JPS5890176A (ja) | 1981-11-26 | 1981-11-26 | プロ−ブ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18834481A JPS5890176A (ja) | 1981-11-26 | 1981-11-26 | プロ−ブ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5890176A JPS5890176A (ja) | 1983-05-28 |
| JPS6248194B2 true JPS6248194B2 (enExample) | 1987-10-13 |
Family
ID=16221969
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18834481A Granted JPS5890176A (ja) | 1981-11-26 | 1981-11-26 | プロ−ブ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5890176A (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0616055B2 (ja) * | 1985-07-19 | 1994-03-02 | 光一 吉田 | スプリング・コンタクト式プロ−ブ |
| JPS62104165U (enExample) * | 1985-12-19 | 1987-07-02 | ||
| US4758779A (en) * | 1986-04-07 | 1988-07-19 | Tektronix, Inc. | Probe body for an electrical measurement system |
| US7504837B2 (en) | 2004-03-26 | 2009-03-17 | Nec Corporation | Electrical characteristics measurement method and electrical characteristics measurement device |
| JP2011052969A (ja) * | 2009-08-31 | 2011-03-17 | Hioki Ee Corp | 基板検査装置におけるz軸ユニットの配線引き回し構造 |
| JP2013113822A (ja) * | 2011-11-30 | 2013-06-10 | Hioki Ee Corp | 測定装置 |
| JP2013120077A (ja) * | 2011-12-06 | 2013-06-17 | Hioki Ee Corp | 測定装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS579846Y2 (enExample) * | 1977-07-01 | 1982-02-25 |
-
1981
- 1981-11-26 JP JP18834481A patent/JPS5890176A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5890176A (ja) | 1983-05-28 |
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