JPS5890176A - プロ−ブ - Google Patents

プロ−ブ

Info

Publication number
JPS5890176A
JPS5890176A JP18834481A JP18834481A JPS5890176A JP S5890176 A JPS5890176 A JP S5890176A JP 18834481 A JP18834481 A JP 18834481A JP 18834481 A JP18834481 A JP 18834481A JP S5890176 A JPS5890176 A JP S5890176A
Authority
JP
Japan
Prior art keywords
contact
ground
input terminal
wire
voltage measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18834481A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6248194B2 (enExample
Inventor
Michihiro Ono
小野　道広
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP18834481A priority Critical patent/JPS5890176A/ja
Publication of JPS5890176A publication Critical patent/JPS5890176A/ja
Publication of JPS6248194B2 publication Critical patent/JPS6248194B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP18834481A 1981-11-26 1981-11-26 プロ−ブ Granted JPS5890176A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18834481A JPS5890176A (ja) 1981-11-26 1981-11-26 プロ−ブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18834481A JPS5890176A (ja) 1981-11-26 1981-11-26 プロ−ブ

Publications (2)

Publication Number Publication Date
JPS5890176A true JPS5890176A (ja) 1983-05-28
JPS6248194B2 JPS6248194B2 (enExample) 1987-10-13

Family

ID=16221969

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18834481A Granted JPS5890176A (ja) 1981-11-26 1981-11-26 プロ−ブ

Country Status (1)

Country Link
JP (1) JPS5890176A (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221065A (ja) * 1985-07-19 1987-01-29 Koichi Yoshida スプリング・コンタクト式プロ−ブ
JPS62104165U (enExample) * 1985-12-19 1987-07-02
JPS6366470A (ja) * 1986-04-07 1988-03-25 テクトロニツクス・インコ−ポレイテツド プロ−ブ装置
US7504837B2 (en) 2004-03-26 2009-03-17 Nec Corporation Electrical characteristics measurement method and electrical characteristics measurement device
JP2011052969A (ja) * 2009-08-31 2011-03-17 Hioki Ee Corp 基板検査装置におけるｚ軸ユニットの配線引き回し構造
JP2013113822A (ja) * 2011-11-30 2013-06-10 Hioki Ee Corp 測定装置
JP2013120077A (ja) * 2011-12-06 2013-06-17 Hioki Ee Corp 測定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5415657U (enExample) * 1977-07-01 1979-02-01

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5415657U (enExample) * 1977-07-01 1979-02-01

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221065A (ja) * 1985-07-19 1987-01-29 Koichi Yoshida スプリング・コンタクト式プロ−ブ
JPS62104165U (enExample) * 1985-12-19 1987-07-02
JPS6366470A (ja) * 1986-04-07 1988-03-25 テクトロニツクス・インコ−ポレイテツド プロ−ブ装置
US7504837B2 (en) 2004-03-26 2009-03-17 Nec Corporation Electrical characteristics measurement method and electrical characteristics measurement device
JP2011052969A (ja) * 2009-08-31 2011-03-17 Hioki Ee Corp 基板検査装置におけるｚ軸ユニットの配線引き回し構造
JP2013113822A (ja) * 2011-11-30 2013-06-10 Hioki Ee Corp 測定装置
JP2013120077A (ja) * 2011-12-06 2013-06-17 Hioki Ee Corp 測定装置

Also Published As

Publication number Publication date
JPS6248194B2 (enExample) 1987-10-13

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