JPS6242076U - - Google Patents

Info

Publication number
JPS6242076U
JPS6242076U JP1985132633U JP13263385U JPS6242076U JP S6242076 U JPS6242076 U JP S6242076U JP 1985132633 U JP1985132633 U JP 1985132633U JP 13263385 U JP13263385 U JP 13263385U JP S6242076 U JPS6242076 U JP S6242076U
Authority
JP
Japan
Prior art keywords
phase
frequency
phase difference
ratio
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1985132633U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0450543Y2 (enExample
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985132633U priority Critical patent/JPH0450543Y2/ja
Priority to US06/899,952 priority patent/US4700129A/en
Publication of JPS6242076U publication Critical patent/JPS6242076U/ja
Application granted granted Critical
Publication of JPH0450543Y2 publication Critical patent/JPH0450543Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
    • G01R25/06—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents employing quotient instrument

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measuring Phase Differences (AREA)
JP1985132633U 1985-08-30 1985-08-30 Expired JPH0450543Y2 (enExample)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1985132633U JPH0450543Y2 (enExample) 1985-08-30 1985-08-30
US06/899,952 US4700129A (en) 1985-08-30 1986-08-25 Phase measurement apparatus with automatic calibration

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985132633U JPH0450543Y2 (enExample) 1985-08-30 1985-08-30

Publications (2)

Publication Number Publication Date
JPS6242076U true JPS6242076U (enExample) 1987-03-13
JPH0450543Y2 JPH0450543Y2 (enExample) 1992-11-27

Family

ID=15085890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985132633U Expired JPH0450543Y2 (enExample) 1985-08-30 1985-08-30

Country Status (2)

Country Link
US (1) US4700129A (enExample)
JP (1) JPH0450543Y2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009505462A (ja) * 2005-08-08 2009-02-05 ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー 位相調整を備えた測定装置、特にベクトル・ネットワーク・アナライザ
JP2011102804A (ja) * 2009-11-11 2011-05-26 Agilent Technologies Inc デジタルｎｍｒ信号処理システムおよび方法
JP5225994B2 (ja) * 2007-08-15 2013-07-03 株式会社アドバンテスト 測定装置、試験装置および測定方法

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2627758B2 (ja) * 1987-12-28 1997-07-09 株式会社アドバンテスト 信号発生装置
DE3801154A1 (de) * 1988-01-16 1989-08-03 Deutsches Elektronen Synchr Messschaltung zur phasenmessung gepulster hochfrequenzsignale
US4901255A (en) * 1988-03-21 1990-02-13 Lynn Electronics Corp. Method and apparatus for evaluating quadrature encoders
US5150111A (en) * 1988-11-04 1992-09-22 Sumitomo Electric Industries, Ltd. Apparatus for and method of detecting an abnormality in a signal
US4879527A (en) * 1989-01-23 1989-11-07 Cincinnati Electronics Corporation Phase lock loop and improved phase detector therefor
EP0430256B1 (en) * 1989-12-01 1996-02-07 Advantest Corporation Method and equipment for cablibrating output levels of waveform analyzing apparatus
JP3160428B2 (ja) * 1993-07-12 2001-04-25 株式会社東芝 濃度計
US5808895A (en) * 1996-05-31 1998-09-15 Aerometrics, Inc. Method and apparatus for low signal to noise ratio instantaneous phase measurement
KR0183914B1 (ko) * 1996-08-19 1999-04-15 김광호 3상 교류의 위상각 검출회로
US7788067B2 (en) * 2006-05-12 2010-08-31 Artium Technologies, Inc. Means and methods for signal validation for sizing spherical objects
US7564564B2 (en) 2006-08-22 2009-07-21 Artium Technologies, Inc. Automatic set-up for instrument functions
US7994800B2 (en) * 2008-03-25 2011-08-09 General Electric Company Systems and methods for online phase calibration
JP5249390B2 (ja) * 2011-06-23 2013-07-31 株式会社アドバンテスト 信号測定装置、信号測定方法、プログラム、記録媒体
JP5936478B2 (ja) 2012-08-03 2016-06-22 キヤノン株式会社 計測装置、リソグラフィー装置、および物品の製造方法
JP5936479B2 (ja) * 2012-08-03 2016-06-22 キヤノン株式会社 計測装置、リソグラフィー装置、および物品の製造方法
JP6317455B2 (ja) 2014-08-29 2018-04-25 京セラ株式会社 センサ装置およびセンシング方法
EP3955011B1 (en) * 2020-08-10 2024-01-31 Nxp B.V. Phase shift and gain measurement apparatus
US11860203B2 (en) * 2020-11-30 2024-01-02 Kyocera Avx Components (Werne) Gmbh Dual channel differential sensor

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2930270C2 (de) * 1979-07-26 1986-04-24 M.A.N.- Roland Druckmaschinen AG, 6050 Offenbach Kontrollvorrichtung für die Zufuhr von Bogen
US4327441A (en) * 1980-03-31 1982-04-27 Texas Instruments Incorporated Method and apparatus for synchronizing and calibrating a receiver to a pulse width modulation transmitter
FR2538909A1 (fr) * 1982-12-30 1984-07-06 Thomson Csf Comparateur de phase
AU2592384A (en) * 1983-03-26 1984-09-27 Itt Industries, Inc. Digital horizontal synchronization
US4636719A (en) * 1984-11-01 1987-01-13 Environmental Research Institute Of Michigan Apparatus for extended precision phase measurement

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009505462A (ja) * 2005-08-08 2009-02-05 ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー 位相調整を備えた測定装置、特にベクトル・ネットワーク・アナライザ
JP5225994B2 (ja) * 2007-08-15 2013-07-03 株式会社アドバンテスト 測定装置、試験装置および測定方法
JP2011102804A (ja) * 2009-11-11 2011-05-26 Agilent Technologies Inc デジタルｎｍｒ信号処理システムおよび方法

Also Published As

Publication number Publication date
JPH0450543Y2 (enExample) 1992-11-27
US4700129A (en) 1987-10-13

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