JPS6239746A - 円筒体外観検査装置 - Google Patents

円筒体外観検査装置

Info

Publication number
JPS6239746A
JPS6239746A JP60180334A JP18033485A JPS6239746A JP S6239746 A JPS6239746 A JP S6239746A JP 60180334 A JP60180334 A JP 60180334A JP 18033485 A JP18033485 A JP 18033485A JP S6239746 A JPS6239746 A JP S6239746A
Authority
JP
Japan
Prior art keywords
image
inspected
pellet
cylindrical surface
objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60180334A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0362222B2 (enrdf_load_html_response
Inventor
Yoshitaka Yaginuma
芳隆 柳沼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Nuclear Fuel Co Ltd
Original Assignee
Mitsubishi Nuclear Fuel Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Nuclear Fuel Co Ltd filed Critical Mitsubishi Nuclear Fuel Co Ltd
Priority to JP60180334A priority Critical patent/JPS6239746A/ja
Publication of JPS6239746A publication Critical patent/JPS6239746A/ja
Publication of JPH0362222B2 publication Critical patent/JPH0362222B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
JP60180334A 1985-08-16 1985-08-16 円筒体外観検査装置 Granted JPS6239746A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60180334A JPS6239746A (ja) 1985-08-16 1985-08-16 円筒体外観検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60180334A JPS6239746A (ja) 1985-08-16 1985-08-16 円筒体外観検査装置

Publications (2)

Publication Number Publication Date
JPS6239746A true JPS6239746A (ja) 1987-02-20
JPH0362222B2 JPH0362222B2 (enrdf_load_html_response) 1991-09-25

Family

ID=16081403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60180334A Granted JPS6239746A (ja) 1985-08-16 1985-08-16 円筒体外観検査装置

Country Status (1)

Country Link
JP (1) JPS6239746A (enrdf_load_html_response)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01284745A (ja) * 1988-05-10 1989-11-16 Showa Aruminiumukan Kk 円筒状物の印刷良否選別装置
EP0597639A1 (en) * 1992-11-12 1994-05-18 Westinghouse Electric Corporation Non-contact surface flaw detection
JP2008064624A (ja) * 2006-09-07 2008-03-21 Toyo Inspections Kk 撮像装置及び撮像方法
JP2013542427A (ja) * 2010-10-08 2013-11-21 キャプシュゲル・ベルジウム・エヌ・ヴィ 三次元物体表面の二次元画像を取得する装置及び方法
JP2015064301A (ja) * 2013-09-25 2015-04-09 Jfeスチール株式会社 表面欠陥検査装置及び表面欠陥検査方法

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01284745A (ja) * 1988-05-10 1989-11-16 Showa Aruminiumukan Kk 円筒状物の印刷良否選別装置
EP0597639A1 (en) * 1992-11-12 1994-05-18 Westinghouse Electric Corporation Non-contact surface flaw detection
JP2008064624A (ja) * 2006-09-07 2008-03-21 Toyo Inspections Kk 撮像装置及び撮像方法
JP2013542427A (ja) * 2010-10-08 2013-11-21 キャプシュゲル・ベルジウム・エヌ・ヴィ 三次元物体表面の二次元画像を取得する装置及び方法
US9414027B2 (en) 2010-10-08 2016-08-09 Capsugel Belgium Nv Apparatus and method for acquiring a two-dimensional image of the surface of a three-dimensional object
US9575011B2 (en) 2010-10-08 2017-02-21 Capsugel Belgium Nv Apparatus and method for acquiring a two-dimensional image of the surface of a three-dimensional object
US10113977B2 (en) 2010-10-08 2018-10-30 Capsugel Belgium Nv Apparatus and method for acquiring a two-dimensional image of the surface of a three-dimensional object
JP2015064301A (ja) * 2013-09-25 2015-04-09 Jfeスチール株式会社 表面欠陥検査装置及び表面欠陥検査方法

Also Published As

Publication number Publication date
JPH0362222B2 (enrdf_load_html_response) 1991-09-25

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees