JPS6236183B2 - - Google Patents
Info
- Publication number
- JPS6236183B2 JPS6236183B2 JP54156154A JP15615479A JPS6236183B2 JP S6236183 B2 JPS6236183 B2 JP S6236183B2 JP 54156154 A JP54156154 A JP 54156154A JP 15615479 A JP15615479 A JP 15615479A JP S6236183 B2 JPS6236183 B2 JP S6236183B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- amplifier
- under test
- switch
- device under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 29
- 238000005259 measurement Methods 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15615479A JPS5679267A (en) | 1979-11-30 | 1979-11-30 | Tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15615479A JPS5679267A (en) | 1979-11-30 | 1979-11-30 | Tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5679267A JPS5679267A (en) | 1981-06-29 |
| JPS6236183B2 true JPS6236183B2 (enrdf_load_stackoverflow) | 1987-08-05 |
Family
ID=15621522
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15615479A Granted JPS5679267A (en) | 1979-11-30 | 1979-11-30 | Tester |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5679267A (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000310672A (ja) * | 1999-04-28 | 2000-11-07 | Fujitsu Ltd | 半導体装置 |
-
1979
- 1979-11-30 JP JP15615479A patent/JPS5679267A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5679267A (en) | 1981-06-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5006809A (en) | Apparatus for measuring the electrical resistance of a test specimen | |
| CN102955125B (zh) | 集成电路 | |
| US3227953A (en) | Bridge apparatus for determining the input resistance and beta figure for an in-circuit transistor | |
| JPS622169A (ja) | 極小抵抗測定方法及び装置 | |
| JPS6236183B2 (enrdf_load_stackoverflow) | ||
| JPS641649Y2 (enrdf_load_stackoverflow) | ||
| JPH11281677A (ja) | 電流測定装置 | |
| JP3461258B2 (ja) | 導電率またはpHを測定する装置 | |
| JPH0438303Y2 (enrdf_load_stackoverflow) | ||
| JPH0519821Y2 (enrdf_load_stackoverflow) | ||
| JPH0519820Y2 (enrdf_load_stackoverflow) | ||
| JP3436138B2 (ja) | 半導体試験装置用バイアス電源回路 | |
| JP3495545B2 (ja) | 溶存酸素またはpHを測定する装置 | |
| RU1810837C (ru) | Устройство дл измерени падени напр жени на контактах | |
| JPH0546341Y2 (enrdf_load_stackoverflow) | ||
| GB2124785A (en) | Circuit module for impedance measuring circuit | |
| JPH0216292Y2 (enrdf_load_stackoverflow) | ||
| SU1084709A1 (ru) | Устройство дл измерени параметров рассе ни транзисторов | |
| US3200335A (en) | Apparatus for enabling the hi, hf, ho, and hr chracteristics of transistors to be derived | |
| JPH0524222Y2 (enrdf_load_stackoverflow) | ||
| JP2537961B2 (ja) | 溶接電圧検出装置 | |
| KR960013754B1 (ko) | 직렬 저항 보상 기능을 갖는 적분형 콘덴서 측정 회로 | |
| JP3521094B2 (ja) | 酸素濃度測定装置 | |
| JPH11153641A (ja) | 半導体デバイス試験装置 | |
| JPH05232172A (ja) | パワーアンプの試験方法および試験装置 |