JPS5679267A - Tester - Google Patents
TesterInfo
- Publication number
- JPS5679267A JPS5679267A JP15615479A JP15615479A JPS5679267A JP S5679267 A JPS5679267 A JP S5679267A JP 15615479 A JP15615479 A JP 15615479A JP 15615479 A JP15615479 A JP 15615479A JP S5679267 A JPS5679267 A JP S5679267A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- resistor
- operational amplifier
- switch
- output voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To prevent a momentary abnormal current form flowing through an object being measured by connecting the object and a tester in a state where no current flows, before applying a given voltage.
CONSTITUTION: When a given voltage is applied to a terminal 6 and a semiconductor switch 8 and then a switch 5 are closed, the output voltage of a voltage follower 2 is that of the measuring terminal of an object 3 being measured. The difference voltage between said voltage and the output voltage of an operational amplifier 1 is amplified by an operation amplifier 7 and feedbacked through a resistor R4 to the input of the operational amplifier 1, so that the output voltage of the operational amplifier 1 is equal to that of the object 3. Then, when a switch 4 is closed, no current flows through a resistor R1. Then, opening the semiconductor switch 8 causes a voltage determined by resistors R2 and R3 to be applied to the object 3. Measuring the voltage drop due to the current flowing through the resistor R1 permits the current flowing through the object 3 to be obtained.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15615479A JPS5679267A (en) | 1979-11-30 | 1979-11-30 | Tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15615479A JPS5679267A (en) | 1979-11-30 | 1979-11-30 | Tester |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5679267A true JPS5679267A (en) | 1981-06-29 |
JPS6236183B2 JPS6236183B2 (en) | 1987-08-05 |
Family
ID=15621522
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15615479A Granted JPS5679267A (en) | 1979-11-30 | 1979-11-30 | Tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5679267A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6337819B1 (en) * | 1999-04-28 | 2002-01-08 | Fujitsu Limited | Semiconductor device having on-chip terminal with voltage to be measured in test |
-
1979
- 1979-11-30 JP JP15615479A patent/JPS5679267A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6337819B1 (en) * | 1999-04-28 | 2002-01-08 | Fujitsu Limited | Semiconductor device having on-chip terminal with voltage to be measured in test |
Also Published As
Publication number | Publication date |
---|---|
JPS6236183B2 (en) | 1987-08-05 |
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