JPS5684572A - Measuring method for noise voltage of semiconductor device - Google Patents

Measuring method for noise voltage of semiconductor device

Info

Publication number
JPS5684572A
JPS5684572A JP16314879A JP16314879A JPS5684572A JP S5684572 A JPS5684572 A JP S5684572A JP 16314879 A JP16314879 A JP 16314879A JP 16314879 A JP16314879 A JP 16314879A JP S5684572 A JPS5684572 A JP S5684572A
Authority
JP
Japan
Prior art keywords
semiconductor device
circuit
measured
noise voltage
appropriateness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16314879A
Other languages
Japanese (ja)
Inventor
Takayoshi Shimomura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP16314879A priority Critical patent/JPS5684572A/en
Publication of JPS5684572A publication Critical patent/JPS5684572A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To obtain proper noise voltage by measuring the noise voltage through sampling in several times and applying a prescribed operation to the measured value thereof.
CONSTITUTION: The output of the semiconductor device 1 to be measured is inputted in a sampling circuit 7 through the intermediary of an amplifier 2 and sampled values are supplied to a memory operation circuit 9. In the memory operation circuit 9, sampled values are stored and from these values an average value and standard deviation are found. These are indicated in an indicating circuit 10, while being sent to an appropriateness discriminating circuit 12. In the appropriateness discriminating circuit 12, through the comparison with reference signals for the average value and the standard deviation regarding the semiconductor device 1 to be measured, which are inputted from reference value input terminals 11a and 11b, the appropriateness of the semiconductor device 1 to be measured is discriminated and the result is indicated.
COPYRIGHT: (C)1981,JPO&Japio
JP16314879A 1979-12-11 1979-12-11 Measuring method for noise voltage of semiconductor device Pending JPS5684572A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16314879A JPS5684572A (en) 1979-12-11 1979-12-11 Measuring method for noise voltage of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16314879A JPS5684572A (en) 1979-12-11 1979-12-11 Measuring method for noise voltage of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5684572A true JPS5684572A (en) 1981-07-09

Family

ID=15768124

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16314879A Pending JPS5684572A (en) 1979-12-11 1979-12-11 Measuring method for noise voltage of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5684572A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0285371U (en) * 1988-12-19 1990-07-04

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0285371U (en) * 1988-12-19 1990-07-04

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