JPS5684572A - Measuring method for noise voltage of semiconductor device - Google Patents
Measuring method for noise voltage of semiconductor deviceInfo
- Publication number
- JPS5684572A JPS5684572A JP16314879A JP16314879A JPS5684572A JP S5684572 A JPS5684572 A JP S5684572A JP 16314879 A JP16314879 A JP 16314879A JP 16314879 A JP16314879 A JP 16314879A JP S5684572 A JPS5684572 A JP S5684572A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- circuit
- measured
- noise voltage
- appropriateness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To obtain proper noise voltage by measuring the noise voltage through sampling in several times and applying a prescribed operation to the measured value thereof.
CONSTITUTION: The output of the semiconductor device 1 to be measured is inputted in a sampling circuit 7 through the intermediary of an amplifier 2 and sampled values are supplied to a memory operation circuit 9. In the memory operation circuit 9, sampled values are stored and from these values an average value and standard deviation are found. These are indicated in an indicating circuit 10, while being sent to an appropriateness discriminating circuit 12. In the appropriateness discriminating circuit 12, through the comparison with reference signals for the average value and the standard deviation regarding the semiconductor device 1 to be measured, which are inputted from reference value input terminals 11a and 11b, the appropriateness of the semiconductor device 1 to be measured is discriminated and the result is indicated.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16314879A JPS5684572A (en) | 1979-12-11 | 1979-12-11 | Measuring method for noise voltage of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16314879A JPS5684572A (en) | 1979-12-11 | 1979-12-11 | Measuring method for noise voltage of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5684572A true JPS5684572A (en) | 1981-07-09 |
Family
ID=15768124
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16314879A Pending JPS5684572A (en) | 1979-12-11 | 1979-12-11 | Measuring method for noise voltage of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5684572A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0285371U (en) * | 1988-12-19 | 1990-07-04 |
-
1979
- 1979-12-11 JP JP16314879A patent/JPS5684572A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0285371U (en) * | 1988-12-19 | 1990-07-04 |
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