JPS5633564A - Measuring device for current of electronic parts - Google Patents

Measuring device for current of electronic parts

Info

Publication number
JPS5633564A
JPS5633564A JP10947579A JP10947579A JPS5633564A JP S5633564 A JPS5633564 A JP S5633564A JP 10947579 A JP10947579 A JP 10947579A JP 10947579 A JP10947579 A JP 10947579A JP S5633564 A JPS5633564 A JP S5633564A
Authority
JP
Japan
Prior art keywords
high resistor
measuring
currents
voltage
worked
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10947579A
Other languages
Japanese (ja)
Other versions
JPS6126630B2 (en
Inventor
Hiroshi Tsukada
Yukio Yanagisawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10947579A priority Critical patent/JPS5633564A/en
Publication of JPS5633564A publication Critical patent/JPS5633564A/en
Publication of JPS6126630B2 publication Critical patent/JPS6126630B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE: To charge the earth capacity of a measuring line, etc. rapidly and shorten a measuring time by a method wherein a relay contact formed in parallel with a high resistor is attached to a comparator and worked when measuring currents flowing in by the voltage drop of the high resistor.
CONSTITUTION: A set value S1 which instructs applying voltage by numerical value is converted by means of a D-A converter DAC, and currents are supplied to an electronic part DUT through an amplifier AMP, a high resistor RM and a measuring line l1. On the other hand, a comparator COMP is connected to a sensing line l2 applying feedback to the amplifier AMP, and a relay contact Ry1 and a measuring portion ADC connected in parallel with the high resistor RM are worked by the output. Thus, since voltage is applied without passing through the high resistor RM first and earth capacity Cl, Cd is rapidly charged and the voltage drop of the high resistor RM is measured by the operation of the comparator COMP, minute currents such as leakage currents can be measured for an extremely short time.
COPYRIGHT: (C)1981,JPO&Japio
JP10947579A 1979-08-28 1979-08-28 Measuring device for current of electronic parts Granted JPS5633564A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10947579A JPS5633564A (en) 1979-08-28 1979-08-28 Measuring device for current of electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10947579A JPS5633564A (en) 1979-08-28 1979-08-28 Measuring device for current of electronic parts

Publications (2)

Publication Number Publication Date
JPS5633564A true JPS5633564A (en) 1981-04-04
JPS6126630B2 JPS6126630B2 (en) 1986-06-21

Family

ID=14511171

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10947579A Granted JPS5633564A (en) 1979-08-28 1979-08-28 Measuring device for current of electronic parts

Country Status (1)

Country Link
JP (1) JPS5633564A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130070805A1 (en) * 2011-09-20 2013-03-21 Analog Devices, Inc. On-chip temperature sensor using interconnect metal

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130070805A1 (en) * 2011-09-20 2013-03-21 Analog Devices, Inc. On-chip temperature sensor using interconnect metal
US9200968B2 (en) * 2011-09-20 2015-12-01 Analog Devices, Inc. On-chip temperature sensor using interconnect metal

Also Published As

Publication number Publication date
JPS6126630B2 (en) 1986-06-21

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