JPS6235199B2 - - Google Patents

Info

Publication number
JPS6235199B2
JPS6235199B2 JP57114818A JP11481882A JPS6235199B2 JP S6235199 B2 JPS6235199 B2 JP S6235199B2 JP 57114818 A JP57114818 A JP 57114818A JP 11481882 A JP11481882 A JP 11481882A JP S6235199 B2 JPS6235199 B2 JP S6235199B2
Authority
JP
Japan
Prior art keywords
information
bit line
bit
memory cells
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57114818A
Other languages
English (en)
Japanese (ja)
Other versions
JPS595500A (ja
Inventor
Junzo Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP57114818A priority Critical patent/JPS595500A/ja
Publication of JPS595500A publication Critical patent/JPS595500A/ja
Publication of JPS6235199B2 publication Critical patent/JPS6235199B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Detection And Correction Of Errors (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP57114818A 1982-07-02 1982-07-02 半導体記憶装置 Granted JPS595500A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57114818A JPS595500A (ja) 1982-07-02 1982-07-02 半導体記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57114818A JPS595500A (ja) 1982-07-02 1982-07-02 半導体記憶装置

Publications (2)

Publication Number Publication Date
JPS595500A JPS595500A (ja) 1984-01-12
JPS6235199B2 true JPS6235199B2 (enrdf_load_stackoverflow) 1987-07-31

Family

ID=14647448

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57114818A Granted JPS595500A (ja) 1982-07-02 1982-07-02 半導体記憶装置

Country Status (1)

Country Link
JP (1) JPS595500A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10644416B2 (en) 2017-12-26 2020-05-05 Sumitomo Wiring Systems, Ltd. Connector

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6190392A (ja) * 1984-10-08 1986-05-08 Nippon Telegr & Teleph Corp <Ntt> 半導体記憶装置
JPH0513676Y2 (enrdf_load_stackoverflow) * 1985-04-08 1993-04-12

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5175342A (enrdf_load_stackoverflow) * 1974-12-25 1976-06-29 Fujitsu Ltd

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10644416B2 (en) 2017-12-26 2020-05-05 Sumitomo Wiring Systems, Ltd. Connector

Also Published As

Publication number Publication date
JPS595500A (ja) 1984-01-12

Similar Documents

Publication Publication Date Title
US5142541A (en) Error-bit generating circuit for use in a non-volatile semiconductor memory device
US5424989A (en) Semiconductor memory device
US4483001A (en) Online realignment of memory faults
JPS6042560B2 (ja) 半導体記憶装置
US5109360A (en) Row/column address interchange for a fault-tolerant memory system
US4485471A (en) Method of memory reconfiguration for fault tolerant memory
WO1994022085A1 (en) Fault tolerant memory system
US4461001A (en) Deterministic permutation algorithm
AU1035688A (en) Efficient address test for large memories
JPS593798A (ja) メモリ・システムにおける置換ベクトル発生方法
US6697290B2 (en) Apparatus for random access memory array self-repair
US6907385B2 (en) Memory defect redress analysis treating method, and memory testing apparatus performing the method
JP3970336B2 (ja) メモリセルを有する装置およびメモリセルの機能検査のための方法
US5392294A (en) Diagnostic tool and method for locating the origin of parasitic bit faults in a memory array
US6560731B2 (en) Method for checking the functioning of memory cells of an integrated semiconductor memory
US20080151659A1 (en) Semiconductor memory device
JPS6235199B2 (enrdf_load_stackoverflow)
JPS6120300A (ja) 欠陥救済回路を有する半導体メモリ
JP4381014B2 (ja) 半導体集積回路
JPH11242899A (ja) 半導体記憶回路
JPS62250599A (ja) 半導体メモリ装置
US6279129B1 (en) Configuration of memory cells and method of checking the operation of memory cells
US8792292B2 (en) Providing row redundancy to solve vertical twin bit failures
CN117524291B (zh) 封装后修复电路、封装后修复方法和存储器装置
JPH01260699A (ja) 記憶回路