JPS6232559B2 - - Google Patents

Info

Publication number
JPS6232559B2
JPS6232559B2 JP56048048A JP4804881A JPS6232559B2 JP S6232559 B2 JPS6232559 B2 JP S6232559B2 JP 56048048 A JP56048048 A JP 56048048A JP 4804881 A JP4804881 A JP 4804881A JP S6232559 B2 JPS6232559 B2 JP S6232559B2
Authority
JP
Japan
Prior art keywords
address
memory
fail
multiplexer
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56048048A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57164497A (en
Inventor
Tsutomu Myazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56048048A priority Critical patent/JPS57164497A/ja
Publication of JPS57164497A publication Critical patent/JPS57164497A/ja
Publication of JPS6232559B2 publication Critical patent/JPS6232559B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56048048A 1981-03-31 1981-03-31 Controlling device of address fail memory Granted JPS57164497A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56048048A JPS57164497A (en) 1981-03-31 1981-03-31 Controlling device of address fail memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56048048A JPS57164497A (en) 1981-03-31 1981-03-31 Controlling device of address fail memory

Publications (2)

Publication Number Publication Date
JPS57164497A JPS57164497A (en) 1982-10-09
JPS6232559B2 true JPS6232559B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-07-15

Family

ID=12792439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56048048A Granted JPS57164497A (en) 1981-03-31 1981-03-31 Controlling device of address fail memory

Country Status (1)

Country Link
JP (1) JPS57164497A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6050698A (ja) * 1983-08-26 1985-03-20 Mitsubishi Electric Corp 半導体試験装置
EP0424612A3 (en) * 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory
JP4941706B2 (ja) * 2006-03-23 2012-05-30 横河電機株式会社 メモリテスト装置
JP4706577B2 (ja) * 2006-07-11 2011-06-22 横河電機株式会社 信号処理装置及び半導体集積回路試験装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55113200A (en) * 1979-02-22 1980-09-01 Nec Corp Checking method for ic memory

Also Published As

Publication number Publication date
JPS57164497A (en) 1982-10-09

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