JPS6231527B2 - - Google Patents

Info

Publication number
JPS6231527B2
JPS6231527B2 JP52141015A JP14101577A JPS6231527B2 JP S6231527 B2 JPS6231527 B2 JP S6231527B2 JP 52141015 A JP52141015 A JP 52141015A JP 14101577 A JP14101577 A JP 14101577A JP S6231527 B2 JPS6231527 B2 JP S6231527B2
Authority
JP
Japan
Prior art keywords
input
logic
signal
drive circuit
array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52141015A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5472933A (en
Inventor
Hiroshi Mayumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP14101577A priority Critical patent/JPS5472933A/ja
Publication of JPS5472933A publication Critical patent/JPS5472933A/ja
Publication of JPS6231527B2 publication Critical patent/JPS6231527B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
JP14101577A 1977-11-22 1977-11-22 Logical array Granted JPS5472933A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14101577A JPS5472933A (en) 1977-11-22 1977-11-22 Logical array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14101577A JPS5472933A (en) 1977-11-22 1977-11-22 Logical array

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP60175366A Division JPS6143831A (ja) 1985-08-09 1985-08-09 論理信号入力回路

Publications (2)

Publication Number Publication Date
JPS5472933A JPS5472933A (en) 1979-06-11
JPS6231527B2 true JPS6231527B2 (OSRAM) 1987-07-09

Family

ID=15282201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14101577A Granted JPS5472933A (en) 1977-11-22 1977-11-22 Logical array

Country Status (1)

Country Link
JP (1) JPS5472933A (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4625311A (en) * 1984-06-18 1986-11-25 Monolithic Memories, Inc. Programmable array logic circuit with testing and verification circuitry
US4691161A (en) * 1985-06-13 1987-09-01 Raytheon Company Configurable logic gate array

Also Published As

Publication number Publication date
JPS5472933A (en) 1979-06-11

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