JPS6229023B2 - - Google Patents
Info
- Publication number
- JPS6229023B2 JPS6229023B2 JP55084215A JP8421580A JPS6229023B2 JP S6229023 B2 JPS6229023 B2 JP S6229023B2 JP 55084215 A JP55084215 A JP 55084215A JP 8421580 A JP8421580 A JP 8421580A JP S6229023 B2 JPS6229023 B2 JP S6229023B2
- Authority
- JP
- Japan
- Prior art keywords
- frequency spectrum
- frequency
- signal
- values
- ultrasonic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007547 defect Effects 0.000 claims description 26
- 238000001228 spectrum Methods 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 13
- 230000003595 spectral effect Effects 0.000 claims description 8
- 238000004364 calculation method Methods 0.000 claims description 5
- 239000000523 sample Substances 0.000 claims description 5
- 238000010183 spectrum analysis Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 3
- 238000009659 non-destructive testing Methods 0.000 claims description 3
- 230000001066 destructive effect Effects 0.000 claims 1
- 238000002592 echocardiography Methods 0.000 description 9
- 238000000605 extraction Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000002604 ultrasonography Methods 0.000 description 5
- 238000013500 data storage Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 230000004927 fusion Effects 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000010349 pulsation Effects 0.000 description 1
- 239000002893 slag Substances 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
- G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
- G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4445—Classification of defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/267—Welds
Landscapes
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Acoustics & Sound (AREA)
- Mathematical Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8421580A JPS578445A (en) | 1980-06-20 | 1980-06-20 | Method and device of non-destructive inspection by frequency spectral analysis |
| US06/274,428 US4428235A (en) | 1980-06-20 | 1981-06-17 | Non-destructive inspection by frequency spectrum resolution |
| CA000380071A CA1169955A (en) | 1980-06-20 | 1981-06-18 | Non-destructive inspection by frequency spectrum resolution |
| EP81104728A EP0042601B1 (en) | 1980-06-20 | 1981-06-19 | Non-destructive inspection by frequency spectrum resolution |
| DE8181104728T DE3169659D1 (en) | 1980-06-20 | 1981-06-19 | Non-destructive inspection by frequency spectrum resolution |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8421580A JPS578445A (en) | 1980-06-20 | 1980-06-20 | Method and device of non-destructive inspection by frequency spectral analysis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS578445A JPS578445A (en) | 1982-01-16 |
| JPS6229023B2 true JPS6229023B2 (zh) | 1987-06-24 |
Family
ID=13824249
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8421580A Granted JPS578445A (en) | 1980-06-20 | 1980-06-20 | Method and device of non-destructive inspection by frequency spectral analysis |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS578445A (zh) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57179745A (en) * | 1981-04-30 | 1982-11-05 | Fujitsu Ltd | Method and device for measuring material property by ultrasonic wave |
| JPS58162861A (ja) * | 1982-03-23 | 1983-09-27 | Toshiba Corp | 超音波探傷装置 |
| KR100497501B1 (ko) * | 2002-11-29 | 2005-07-01 | (주)오리엔트전산 | 초음파를 이용한 자동차 엔진용 피스톤 갤러리의 결함탐지방법 및 이에 사용되는 결함탐지 장치 |
| KR100681855B1 (ko) | 2004-08-31 | 2007-02-15 | (주) 엠큐브테크놀로지 | 향상된 해상도의 이미지를 얻을 수 있는 초음파 측정방법 |
| JP5104833B2 (ja) * | 2009-09-09 | 2012-12-19 | 株式会社豊田中央研究所 | 構造物内部状態計測システム及び構造物内部状態計測方法 |
-
1980
- 1980-06-20 JP JP8421580A patent/JPS578445A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS578445A (en) | 1982-01-16 |
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