JPS578445A - Method and device of non-destructive inspection by frequency spectral analysis - Google Patents

Method and device of non-destructive inspection by frequency spectral analysis

Info

Publication number
JPS578445A
JPS578445A JP8421580A JP8421580A JPS578445A JP S578445 A JPS578445 A JP S578445A JP 8421580 A JP8421580 A JP 8421580A JP 8421580 A JP8421580 A JP 8421580A JP S578445 A JPS578445 A JP S578445A
Authority
JP
Japan
Prior art keywords
frequency
ultrasonic
echoes
circuit
characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8421580A
Other languages
English (en)
Other versions
JPS6229023B2 (ja
Inventor
Sakae Sugiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8421580A priority Critical patent/JPS578445A/ja
Priority to US06/274,428 priority patent/US4428235A/en
Priority to CA000380071A priority patent/CA1169955A/en
Priority to DE8181104728T priority patent/DE3169659D1/de
Priority to EP81104728A priority patent/EP0042601B1/en
Publication of JPS578445A publication Critical patent/JPS578445A/ja
Publication of JPS6229023B2 publication Critical patent/JPS6229023B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/267—Welds

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
JP8421580A 1980-06-20 1980-06-20 Method and device of non-destructive inspection by frequency spectral analysis Granted JPS578445A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP8421580A JPS578445A (en) 1980-06-20 1980-06-20 Method and device of non-destructive inspection by frequency spectral analysis
US06/274,428 US4428235A (en) 1980-06-20 1981-06-17 Non-destructive inspection by frequency spectrum resolution
CA000380071A CA1169955A (en) 1980-06-20 1981-06-18 Non-destructive inspection by frequency spectrum resolution
DE8181104728T DE3169659D1 (en) 1980-06-20 1981-06-19 Non-destructive inspection by frequency spectrum resolution
EP81104728A EP0042601B1 (en) 1980-06-20 1981-06-19 Non-destructive inspection by frequency spectrum resolution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8421580A JPS578445A (en) 1980-06-20 1980-06-20 Method and device of non-destructive inspection by frequency spectral analysis

Publications (2)

Publication Number Publication Date
JPS578445A true JPS578445A (en) 1982-01-16
JPS6229023B2 JPS6229023B2 (ja) 1987-06-24

Family

ID=13824249

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8421580A Granted JPS578445A (en) 1980-06-20 1980-06-20 Method and device of non-destructive inspection by frequency spectral analysis

Country Status (1)

Country Link
JP (1) JPS578445A (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57179745A (en) * 1981-04-30 1982-11-05 Fujitsu Ltd Method and device for measuring material property by ultrasonic wave
JPS58162861A (ja) * 1982-03-23 1983-09-27 Toshiba Corp 超音波探傷装置
KR100497501B1 (ko) * 2002-11-29 2005-07-01 (주)오리엔트전산 초음파를 이용한 자동차 엔진용 피스톤 갤러리의 결함탐지방법 및 이에 사용되는 결함탐지 장치
KR100681855B1 (ko) 2004-08-31 2007-02-15 (주) 엠큐브테크놀로지 향상된 해상도의 이미지를 얻을 수 있는 초음파 측정방법
JP2011058937A (ja) * 2009-09-09 2011-03-24 Toyota Central R&D Labs Inc 構造物内部状態計測システム及び構造物内部状態計測方法

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57179745A (en) * 1981-04-30 1982-11-05 Fujitsu Ltd Method and device for measuring material property by ultrasonic wave
JPH026022B2 (ja) * 1981-04-30 1990-02-07 Fujitsu Ltd
JPS58162861A (ja) * 1982-03-23 1983-09-27 Toshiba Corp 超音波探傷装置
JPH0526140B2 (ja) * 1982-03-23 1993-04-15 Tokyo Shibaura Electric Co
KR100497501B1 (ko) * 2002-11-29 2005-07-01 (주)오리엔트전산 초음파를 이용한 자동차 엔진용 피스톤 갤러리의 결함탐지방법 및 이에 사용되는 결함탐지 장치
KR100681855B1 (ko) 2004-08-31 2007-02-15 (주) 엠큐브테크놀로지 향상된 해상도의 이미지를 얻을 수 있는 초음파 측정방법
JP2011058937A (ja) * 2009-09-09 2011-03-24 Toyota Central R&D Labs Inc 構造物内部状態計測システム及び構造物内部状態計測方法

Also Published As

Publication number Publication date
JPS6229023B2 (ja) 1987-06-24

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