JPS56168549A - Automatic ultrasonic flaw detector - Google Patents

Automatic ultrasonic flaw detector

Info

Publication number
JPS56168549A
JPS56168549A JP7320280A JP7320280A JPS56168549A JP S56168549 A JPS56168549 A JP S56168549A JP 7320280 A JP7320280 A JP 7320280A JP 7320280 A JP7320280 A JP 7320280A JP S56168549 A JPS56168549 A JP S56168549A
Authority
JP
Japan
Prior art keywords
circuit
frequency
data
echo
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7320280A
Other languages
Japanese (ja)
Inventor
Sakae Sugiyama
Kazumichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7320280A priority Critical patent/JPS56168549A/en
Publication of JPS56168549A publication Critical patent/JPS56168549A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To estimate the size of a defect, by a method wherein by frequency- analyzing an ultrasonic echo, the defect echo is extracted from the pattern thus obtained, and the image of said extracted echo is displayed on a section displaying apparatus or ultrasonic holography apparatus. CONSTITUTION:The defect discrimiating circuit comprises a frequency analyzing circuit 41, a characteristic extracting circuit 42, a characteristic comparing circuit 43 and a data storing circuit 44. The circuit 41 frequency-analyzes the ultrasonic echo r larger than a given threshold value as shown by the formula I and calculates the frequency spectral intensity q(f). The circuit 42 receives the data (fi, qi)(i= 1-N) from the circuit 41 and obtains a maximum spectral intensity qm, central frequency f0, average value DELTAf of the frequency intervals between maximum values, and standard deviation deltaf. In the circuit 44, the data on the material of the bodies to be inspected and the change according to the difference among reflecting bodies have been registered. The circuit 43 compares the data newly obtained by flaw detection and the data in the circuit 44 with each other to decide whether the reflecting body is defective or not.
JP7320280A 1980-05-30 1980-05-30 Automatic ultrasonic flaw detector Pending JPS56168549A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7320280A JPS56168549A (en) 1980-05-30 1980-05-30 Automatic ultrasonic flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7320280A JPS56168549A (en) 1980-05-30 1980-05-30 Automatic ultrasonic flaw detector

Publications (1)

Publication Number Publication Date
JPS56168549A true JPS56168549A (en) 1981-12-24

Family

ID=13511318

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7320280A Pending JPS56168549A (en) 1980-05-30 1980-05-30 Automatic ultrasonic flaw detector

Country Status (1)

Country Link
JP (1) JPS56168549A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6179162A (en) * 1984-09-27 1986-04-22 Mitsubishi Heavy Ind Ltd Surface wave holography method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6179162A (en) * 1984-09-27 1986-04-22 Mitsubishi Heavy Ind Ltd Surface wave holography method

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