Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi LtdfiledCriticalHitachi Ltd
Priority to JP11303576ApriorityCriticalpatent/JPS5339181A/en
Publication of JPS5339181ApublicationCriticalpatent/JPS5339181A/en
PURPOSE: To display the defect of the substance to be inspected and the boundary face of different kind metal at the same time, by separating received signal of ultrasonic wave defect inspection into each component of high and low frequency and treating the above signal.
COPYRIGHT: (C)1978,JPO&Japio
JP11303576A1976-09-221976-09-22Defect inspecting apparatus by ultrasonic wave
PendingJPS5339181A
(en)