JPS52115282A - Flaw detection system for metal materials - Google Patents

Flaw detection system for metal materials

Info

Publication number
JPS52115282A
JPS52115282A JP3274576A JP3274576A JPS52115282A JP S52115282 A JPS52115282 A JP S52115282A JP 3274576 A JP3274576 A JP 3274576A JP 3274576 A JP3274576 A JP 3274576A JP S52115282 A JPS52115282 A JP S52115282A
Authority
JP
Japan
Prior art keywords
metal materials
flaw detection
detection system
flaw
abnd
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3274576A
Other languages
Japanese (ja)
Other versions
JPS5741690B2 (en
Inventor
Masaru Fukuyama
Masakuni Toko
Ryuzo Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Steel Corp
Original Assignee
Fujitsu Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Steel Corp filed Critical Fujitsu Ltd
Priority to JP3274576A priority Critical patent/JPS52115282A/en
Publication of JPS52115282A publication Critical patent/JPS52115282A/en
Publication of JPS5741690B2 publication Critical patent/JPS5741690B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Abstract

PURPOSE: To perform flaw detection of metal materials reliably and automatically by comparing the scanning signals before and after heating of the same place abnd separating and extracting the flaw signal.
COPYRIGHT: (C)1977,JPO&Japio
JP3274576A 1976-03-24 1976-03-24 Flaw detection system for metal materials Granted JPS52115282A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3274576A JPS52115282A (en) 1976-03-24 1976-03-24 Flaw detection system for metal materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3274576A JPS52115282A (en) 1976-03-24 1976-03-24 Flaw detection system for metal materials

Publications (2)

Publication Number Publication Date
JPS52115282A true JPS52115282A (en) 1977-09-27
JPS5741690B2 JPS5741690B2 (en) 1982-09-04

Family

ID=12367368

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3274576A Granted JPS52115282A (en) 1976-03-24 1976-03-24 Flaw detection system for metal materials

Country Status (1)

Country Link
JP (1) JPS52115282A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02278146A (en) * 1989-04-19 1990-11-14 Mitsubishi Electric Corp Surface defect inspecting device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58187160U (en) * 1982-06-08 1983-12-12 クラリオン株式会社 Light emitting diode holder

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5087386A (en) * 1973-12-03 1975-07-14
JPS50120679A (en) * 1974-03-07 1975-09-22

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5087386A (en) * 1973-12-03 1975-07-14
JPS50120679A (en) * 1974-03-07 1975-09-22

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02278146A (en) * 1989-04-19 1990-11-14 Mitsubishi Electric Corp Surface defect inspecting device

Also Published As

Publication number Publication date
JPS5741690B2 (en) 1982-09-04

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