JPS6148210B2 - - Google Patents
Info
- Publication number
- JPS6148210B2 JPS6148210B2 JP56031332A JP3133281A JPS6148210B2 JP S6148210 B2 JPS6148210 B2 JP S6148210B2 JP 56031332 A JP56031332 A JP 56031332A JP 3133281 A JP3133281 A JP 3133281A JP S6148210 B2 JPS6148210 B2 JP S6148210B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electron microscope
- scanning electron
- partition plate
- positively charged
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/026—Means for avoiding or neutralising unwanted electrical charges on tube components
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56031332A JPS57147857A (en) | 1981-03-06 | 1981-03-06 | Sample observation through scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56031332A JPS57147857A (en) | 1981-03-06 | 1981-03-06 | Sample observation through scanning electron microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57147857A JPS57147857A (en) | 1982-09-11 |
| JPS6148210B2 true JPS6148210B2 (enExample) | 1986-10-23 |
Family
ID=12328297
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56031332A Granted JPS57147857A (en) | 1981-03-06 | 1981-03-06 | Sample observation through scanning electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57147857A (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6172363B1 (en) | 1996-03-05 | 2001-01-09 | Hitachi, Ltd. | Method and apparatus for inspecting integrated circuit pattern |
| EP1296352A4 (en) * | 2000-06-27 | 2007-04-18 | Ebara Corp | INVESTIGATION DEVICE FOR LOADED PARTICLE RAYS AND METHOD FOR PRODUCING A COMPONENT ELEVATED WITH THIS INSPECTION DEVICE |
| JP4629207B2 (ja) * | 2000-10-20 | 2011-02-09 | 株式会社ホロン | マスク検査装置 |
| US6627884B2 (en) | 2001-03-19 | 2003-09-30 | Kla-Tencor Technologies Corporation | Simultaneous flooding and inspection for charge control in an electron beam inspection machine |
| US7880144B2 (en) | 2006-01-20 | 2011-02-01 | Juridical Foundation Osaka Industrial Promotion Organization c/o Mydome Osaka | Liquid medium for preventing charge-up in electron microscope and method of observing sample using the same |
| KR101650054B1 (ko) * | 2011-09-09 | 2016-08-22 | 고쿠리츠켄큐카이하츠호진 카가쿠기쥬츠신코키코 | 생물 시료를 그대로의 모습으로 관찰하기 위한 전자 현미경에 의한 관찰 방법과 그것에 사용되는 진공 하에서의 증발 억제용 조성물, 주사형 전자 현미경, 및 투과형 전자 현미경 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5127981A (ja) * | 1974-09-02 | 1976-03-09 | Mitsui Shipbuilding Eng | Jikubarikikei |
-
1981
- 1981-03-06 JP JP56031332A patent/JPS57147857A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57147857A (en) | 1982-09-11 |
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