JPS6138855B2 - - Google Patents

Info

Publication number
JPS6138855B2
JPS6138855B2 JP55106583A JP10658380A JPS6138855B2 JP S6138855 B2 JPS6138855 B2 JP S6138855B2 JP 55106583 A JP55106583 A JP 55106583A JP 10658380 A JP10658380 A JP 10658380A JP S6138855 B2 JPS6138855 B2 JP S6138855B2
Authority
JP
Japan
Prior art keywords
film carrier
semiconductor device
temperature fluid
aging
transport rail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55106583A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5731147A (en
Inventor
Hiroshi Aoyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP10658380A priority Critical patent/JPS5731147A/ja
Publication of JPS5731147A publication Critical patent/JPS5731147A/ja
Publication of JPS6138855B2 publication Critical patent/JPS6138855B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2642Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10658380A 1980-08-01 1980-08-01 Method and apparatus for aging of semiconductor device Granted JPS5731147A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10658380A JPS5731147A (en) 1980-08-01 1980-08-01 Method and apparatus for aging of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10658380A JPS5731147A (en) 1980-08-01 1980-08-01 Method and apparatus for aging of semiconductor device

Publications (2)

Publication Number Publication Date
JPS5731147A JPS5731147A (en) 1982-02-19
JPS6138855B2 true JPS6138855B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1986-09-01

Family

ID=14437222

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10658380A Granted JPS5731147A (en) 1980-08-01 1980-08-01 Method and apparatus for aging of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5731147A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109834880A (zh) * 2019-01-09 2019-06-04 南阳柯丽尔科技有限公司 老化架及热敏胶片老化方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01229947A (ja) * 1988-03-10 1989-09-13 Seiko Epson Corp フレキシブル回路基板の位置決め方法
CA2073899A1 (en) * 1991-07-19 1993-01-20 Tatsuya Hashinaga Burn-in apparatus and method
DE102007047740B4 (de) * 2007-10-05 2010-11-04 Multitest Elektronische Systeme Gmbh Plunger zum Bewegen elektronischer Bauelemente, insbesondere IC's

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109834880A (zh) * 2019-01-09 2019-06-04 南阳柯丽尔科技有限公司 老化架及热敏胶片老化方法
CN109834880B (zh) * 2019-01-09 2021-10-22 南阳柯丽尔科技有限公司 老化架及热敏胶片老化方法

Also Published As

Publication number Publication date
JPS5731147A (en) 1982-02-19

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