JPS5731147A - Method and apparatus for aging of semiconductor device - Google Patents
Method and apparatus for aging of semiconductor deviceInfo
- Publication number
- JPS5731147A JPS5731147A JP10658380A JP10658380A JPS5731147A JP S5731147 A JPS5731147 A JP S5731147A JP 10658380 A JP10658380 A JP 10658380A JP 10658380 A JP10658380 A JP 10658380A JP S5731147 A JPS5731147 A JP S5731147A
- Authority
- JP
- Japan
- Prior art keywords
- aging
- chip
- constitution
- sent
- lead frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To appropriately apply aging, by a method wherein a semiconductor device connected to a lead frame is sent through sending holes, and a predetermined voltage is applied after positioning, and local heating is also applied. CONSTITUTION:An Si chip 6 connected to a film carrier 3 is exactly positioned on a rail 12 by a sprocket 13 using perforations 1. Spring contactors 20 in a contact mechanism 15 is contacted with the external leads of a lead frame 4 and pressed to a rail surface 12, and a voltage is applied to the chip 6. The air is sent to glass tubes 17 containing heaters 18 to spray a high-temperature fluid 16, and predetermined aging is performed by maintaing the chip 6 at high temperatures. By said constitution, sufficient thermal aging can be applied without any influence by contraction and expansion by the heat of the film carrier, and a highly reliable device can be obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10658380A JPS5731147A (en) | 1980-08-01 | 1980-08-01 | Method and apparatus for aging of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10658380A JPS5731147A (en) | 1980-08-01 | 1980-08-01 | Method and apparatus for aging of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5731147A true JPS5731147A (en) | 1982-02-19 |
JPS6138855B2 JPS6138855B2 (en) | 1986-09-01 |
Family
ID=14437222
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10658380A Granted JPS5731147A (en) | 1980-08-01 | 1980-08-01 | Method and apparatus for aging of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5731147A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01229947A (en) * | 1988-03-10 | 1989-09-13 | Seiko Epson Corp | Method for positioning flexible printed circuit board |
US5359285A (en) * | 1991-07-19 | 1994-10-25 | Sumitomo Electric Industries, Ltd. | Method and apparatus for varying temperature and electronic load conditions of a semiconductor device in a burn-in test chamber while performing a burn-in test |
JP2010534843A (en) * | 2007-10-05 | 2010-11-11 | ムルティテスト・エレクトロニッシェ・ジステーメ・ゲーエムベーハー | Plunger for holding and moving electronic components, especially IC |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109834880B (en) * | 2019-01-09 | 2021-10-22 | 南阳柯丽尔科技有限公司 | Aging rack and method for aging thermosensitive film |
-
1980
- 1980-08-01 JP JP10658380A patent/JPS5731147A/en active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01229947A (en) * | 1988-03-10 | 1989-09-13 | Seiko Epson Corp | Method for positioning flexible printed circuit board |
US5359285A (en) * | 1991-07-19 | 1994-10-25 | Sumitomo Electric Industries, Ltd. | Method and apparatus for varying temperature and electronic load conditions of a semiconductor device in a burn-in test chamber while performing a burn-in test |
JP2010534843A (en) * | 2007-10-05 | 2010-11-11 | ムルティテスト・エレクトロニッシェ・ジステーメ・ゲーエムベーハー | Plunger for holding and moving electronic components, especially IC |
US8232815B2 (en) | 2007-10-05 | 2012-07-31 | Multitest Elektronische Systeme Gmbh | Plunger for holding and moving electronic components in particular ICS |
Also Published As
Publication number | Publication date |
---|---|
JPS6138855B2 (en) | 1986-09-01 |
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