JPS61176839A - 透明または半透明の板状体の欠点検査装置 - Google Patents

透明または半透明の板状体の欠点検査装置

Info

Publication number
JPS61176839A
JPS61176839A JP1815285A JP1815285A JPS61176839A JP S61176839 A JPS61176839 A JP S61176839A JP 1815285 A JP1815285 A JP 1815285A JP 1815285 A JP1815285 A JP 1815285A JP S61176839 A JPS61176839 A JP S61176839A
Authority
JP
Japan
Prior art keywords
transparent
plate
shaped body
semi
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1815285A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0511574B2 (enrdf_load_stackoverflow
Inventor
Masami Okino
沖野 雅美
Yasuhiro Osada
長田 泰礼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanebo Ltd
Original Assignee
Kanebo Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanebo Ltd filed Critical Kanebo Ltd
Priority to JP1815285A priority Critical patent/JPS61176839A/ja
Publication of JPS61176839A publication Critical patent/JPS61176839A/ja
Publication of JPH0511574B2 publication Critical patent/JPH0511574B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • G01N21/8903Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1815285A 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置 Granted JPS61176839A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1815285A JPS61176839A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1815285A JPS61176839A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置

Publications (2)

Publication Number Publication Date
JPS61176839A true JPS61176839A (ja) 1986-08-08
JPH0511574B2 JPH0511574B2 (enrdf_load_stackoverflow) 1993-02-15

Family

ID=11963639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1815285A Granted JPS61176839A (ja) 1985-01-31 1985-01-31 透明または半透明の板状体の欠点検査装置

Country Status (1)

Country Link
JP (1) JPS61176839A (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04143641A (ja) * 1990-10-04 1992-05-18 Mitsui Toatsu Chem Inc プラスチックフィルムのシースルー特性の測定方法
US5452079A (en) * 1992-06-26 1995-09-19 Central Glass Company, Limited Method of and apparatus for detecting defect of transparent sheet as sheet glass
US5691811A (en) * 1995-02-10 1997-11-25 Central Glass Company, Limited Method of and apparatus for detecting defect of transparent sheet as sheet glass
JPH11148813A (ja) * 1997-07-02 1999-06-02 Asahi Glass Co Ltd 表面形状の評価方法および評価装置
JP2002507742A (ja) * 1998-03-25 2002-03-12 ラゾー ラザー ゾルター ゲーエムベーハー 板ガラスの中の欠陥、特にドリップ、スレッド及び線を検出するための方法及び装置
JP2002148195A (ja) * 2000-11-06 2002-05-22 Sumitomo Chem Co Ltd 表面検査装置及び表面検査方法
JP2013524192A (ja) * 2010-04-01 2013-06-17 サン−ゴバン グラス フランス 透明基板の光学的品質を分析するための装置及び方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48102653A (enrdf_load_stackoverflow) * 1972-04-10 1973-12-24
JPS59147006U (ja) * 1983-03-22 1984-10-01 サンクス株式会社 不良品検出装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48102653A (enrdf_load_stackoverflow) * 1972-04-10 1973-12-24
JPS59147006U (ja) * 1983-03-22 1984-10-01 サンクス株式会社 不良品検出装置

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04143641A (ja) * 1990-10-04 1992-05-18 Mitsui Toatsu Chem Inc プラスチックフィルムのシースルー特性の測定方法
US5452079A (en) * 1992-06-26 1995-09-19 Central Glass Company, Limited Method of and apparatus for detecting defect of transparent sheet as sheet glass
US5691811A (en) * 1995-02-10 1997-11-25 Central Glass Company, Limited Method of and apparatus for detecting defect of transparent sheet as sheet glass
JPH11148813A (ja) * 1997-07-02 1999-06-02 Asahi Glass Co Ltd 表面形状の評価方法および評価装置
JP2002507742A (ja) * 1998-03-25 2002-03-12 ラゾー ラザー ゾルター ゲーエムベーハー 板ガラスの中の欠陥、特にドリップ、スレッド及び線を検出するための方法及び装置
JP2002148195A (ja) * 2000-11-06 2002-05-22 Sumitomo Chem Co Ltd 表面検査装置及び表面検査方法
JP2013524192A (ja) * 2010-04-01 2013-06-17 サン−ゴバン グラス フランス 透明基板の光学的品質を分析するための装置及び方法
EP2553439B1 (fr) * 2010-04-01 2019-08-14 Saint-Gobain Glass France Procede et dispositif d'analyse de la qualite optique d'un substrat transparent

Also Published As

Publication number Publication date
JPH0511574B2 (enrdf_load_stackoverflow) 1993-02-15

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