JPS61147541A - 良品ペレツトの判別装置 - Google Patents
良品ペレツトの判別装置Info
- Publication number
- JPS61147541A JPS61147541A JP59268475A JP26847584A JPS61147541A JP S61147541 A JPS61147541 A JP S61147541A JP 59268475 A JP59268475 A JP 59268475A JP 26847584 A JP26847584 A JP 26847584A JP S61147541 A JPS61147541 A JP S61147541A
- Authority
- JP
- Japan
- Prior art keywords
- pellet
- defective
- pellets
- mark
- amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59268475A JPS61147541A (ja) | 1984-12-21 | 1984-12-21 | 良品ペレツトの判別装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59268475A JPS61147541A (ja) | 1984-12-21 | 1984-12-21 | 良品ペレツトの判別装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2868493A Division JPH0648701B2 (ja) | 1993-01-25 | 1993-01-25 | 良品ペレットの判別装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61147541A true JPS61147541A (ja) | 1986-07-05 |
| JPH0548621B2 JPH0548621B2 (enExample) | 1993-07-22 |
Family
ID=17459015
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59268475A Granted JPS61147541A (ja) | 1984-12-21 | 1984-12-21 | 良品ペレツトの判別装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61147541A (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58125837A (ja) * | 1982-01-22 | 1983-07-27 | Mitsubishi Electric Corp | 自動ダイボンダのペレツト位置決め装置 |
-
1984
- 1984-12-21 JP JP59268475A patent/JPS61147541A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58125837A (ja) * | 1982-01-22 | 1983-07-27 | Mitsubishi Electric Corp | 自動ダイボンダのペレツト位置決め装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0548621B2 (enExample) | 1993-07-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100580435C (zh) | 监控制程变异的系统与方法 | |
| JPH0318708A (ja) | 表面検査方法及び装置 | |
| JP2000161932A5 (enExample) | ||
| JPS61147542A (ja) | 良品ペレツトの判別装置 | |
| JPH04207047A (ja) | プローブ検査装置 | |
| JPH0548621B2 (enExample) | ||
| EP0335163A2 (en) | Apparatus for detecting foreign matter on the surface of a substrate | |
| JPH0648701B2 (ja) | 良品ペレットの判別装置 | |
| JPH05343483A (ja) | 良品ペレットの判別装置 | |
| JP3460257B2 (ja) | 半導体検査装置 | |
| US6184046B1 (en) | Non-contact voltage stressing method for thin dielectrics at the wafer level | |
| JP3022649B2 (ja) | 半導体検査装置 | |
| JPH03264851A (ja) | 板材端面の欠陥検査方法およびその装置 | |
| JPS62136041A (ja) | ウエハプロ−バ | |
| JPS6130750A (ja) | 固型製剤品の外観検査方法 | |
| JP2984155B2 (ja) | ウエハのicチップ検査方法 | |
| JPS6165444A (ja) | 被検査チツプの回路パタ−ン外観検査方法並びにその装置 | |
| JPH01313952A (ja) | プローブカードとこれを用いた位置合せ方法 | |
| JPS62115838A (ja) | ウエハ−マ−ク検出方法 | |
| JPH02235355A (ja) | 半導体製造装置及び製造方法 | |
| JPH01288771A (ja) | プローブカード及びプローブ装置 | |
| JPH0376241A (ja) | 半導体装置 | |
| JP2007278918A (ja) | 光学基板ウェハの検査方法 | |
| CN111896545A (zh) | 一种无损检测样品品质的方法 | |
| KR19980016444U (ko) | 프로빙 검증 칩이 구비된 웨이퍼 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |