JPH0548621B2 - - Google Patents
Info
- Publication number
- JPH0548621B2 JPH0548621B2 JP59268475A JP26847584A JPH0548621B2 JP H0548621 B2 JPH0548621 B2 JP H0548621B2 JP 59268475 A JP59268475 A JP 59268475A JP 26847584 A JP26847584 A JP 26847584A JP H0548621 B2 JPH0548621 B2 JP H0548621B2
- Authority
- JP
- Japan
- Prior art keywords
- defective
- pellet
- light amount
- value
- reflected light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59268475A JPS61147541A (ja) | 1984-12-21 | 1984-12-21 | 良品ペレツトの判別装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59268475A JPS61147541A (ja) | 1984-12-21 | 1984-12-21 | 良品ペレツトの判別装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2868493A Division JPH0648701B2 (ja) | 1993-01-25 | 1993-01-25 | 良品ペレットの判別装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61147541A JPS61147541A (ja) | 1986-07-05 |
| JPH0548621B2 true JPH0548621B2 (enExample) | 1993-07-22 |
Family
ID=17459015
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59268475A Granted JPS61147541A (ja) | 1984-12-21 | 1984-12-21 | 良品ペレツトの判別装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61147541A (enExample) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58125837A (ja) * | 1982-01-22 | 1983-07-27 | Mitsubishi Electric Corp | 自動ダイボンダのペレツト位置決め装置 |
-
1984
- 1984-12-21 JP JP59268475A patent/JPS61147541A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61147541A (ja) | 1986-07-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7054480B2 (en) | System and method for process variation monitor | |
| JPH0548622B2 (enExample) | ||
| JPH04207047A (ja) | プローブ検査装置 | |
| JPS61147541A (ja) | 良品ペレツトの判別装置 | |
| JPH0648701B2 (ja) | 良品ペレットの判別装置 | |
| JPH05343483A (ja) | 良品ペレットの判別装置 | |
| KR100278807B1 (ko) | 웨이퍼 검사 시스템 | |
| JP3460257B2 (ja) | 半導体検査装置 | |
| US6184046B1 (en) | Non-contact voltage stressing method for thin dielectrics at the wafer level | |
| JP2758844B2 (ja) | 半導体ウェーハスリップライン検査方法および半導体ウェーハの評価方法 | |
| JPS62136041A (ja) | ウエハプロ−バ | |
| KR200156141Y1 (ko) | 프로빙 검증 칩이 구비된 웨이퍼 | |
| JP7818825B2 (ja) | 基板の分断検出装置及び基板の分断検出方法 | |
| JP2839411B2 (ja) | 不良icの検査装置 | |
| JPH03264851A (ja) | 板材端面の欠陥検査方法およびその装置 | |
| JPS62115837A (ja) | プロ−ビング装置 | |
| JP2001249162A (ja) | ベアチップ検査装置及びベアチップ検査方法 | |
| JPH01313952A (ja) | プローブカードとこれを用いた位置合せ方法 | |
| JPH02235355A (ja) | 半導体製造装置及び製造方法 | |
| JPH0584669B2 (enExample) | ||
| JPH08274133A (ja) | 半導体ウエハプローバ | |
| JPH01162135A (ja) | 半導体光センサー測定装置 | |
| JPS61259536A (ja) | 半導体ウエハの検査装置 | |
| JP2001077164A (ja) | ウエハ欠陥検査装置 | |
| JPH05198630A (ja) | 半導体装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |