JPS61131544A - 自動アライニング方式 - Google Patents
自動アライニング方式Info
- Publication number
- JPS61131544A JPS61131544A JP59253620A JP25362084A JPS61131544A JP S61131544 A JPS61131544 A JP S61131544A JP 59253620 A JP59253620 A JP 59253620A JP 25362084 A JP25362084 A JP 25362084A JP S61131544 A JPS61131544 A JP S61131544A
- Authority
- JP
- Japan
- Prior art keywords
- image
- circuit
- semiconductor wafer
- suction table
- circuit pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10P72/53—
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59253620A JPS61131544A (ja) | 1984-11-30 | 1984-11-30 | 自動アライニング方式 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59253620A JPS61131544A (ja) | 1984-11-30 | 1984-11-30 | 自動アライニング方式 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61131544A true JPS61131544A (ja) | 1986-06-19 |
| JPH0525177B2 JPH0525177B2 (enExample) | 1993-04-12 |
Family
ID=17253889
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59253620A Granted JPS61131544A (ja) | 1984-11-30 | 1984-11-30 | 自動アライニング方式 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61131544A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002331930A (ja) * | 2001-05-11 | 2002-11-19 | Kinki Sharyo Co Ltd | 鉄道車両用軸箱支持装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56153747A (en) * | 1980-04-02 | 1981-11-27 | Gen Signal Corp | Positioning system |
| JPS5854648A (ja) * | 1981-09-28 | 1983-03-31 | Nippon Kogaku Kk <Nikon> | 位置合わせ装置 |
-
1984
- 1984-11-30 JP JP59253620A patent/JPS61131544A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56153747A (en) * | 1980-04-02 | 1981-11-27 | Gen Signal Corp | Positioning system |
| JPS5854648A (ja) * | 1981-09-28 | 1983-03-31 | Nippon Kogaku Kk <Nikon> | 位置合わせ装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002331930A (ja) * | 2001-05-11 | 2002-11-19 | Kinki Sharyo Co Ltd | 鉄道車両用軸箱支持装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0525177B2 (enExample) | 1993-04-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO1990009558A1 (en) | Method and apparatus for measuring registration between layers of a semiconductor wafer | |
| JP2928331B2 (ja) | プローバのアライメント装置及び方法 | |
| JPH01127238A (ja) | 可動部材用の限定的再位置決め区域における位置フイードバック向上 | |
| JPS61168236A (ja) | ウエハ検査装置 | |
| US5124931A (en) | Method of inspecting electric characteristics of wafers and apparatus therefor | |
| US20080050006A1 (en) | Method and apparatus for semiconductor wafer alignment | |
| US7265536B2 (en) | Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station | |
| JPS61131544A (ja) | 自動アライニング方式 | |
| JPS61206237A (ja) | 半導体ウエハプロ−バ | |
| US20020187035A1 (en) | Arrangement for wafer inspection | |
| JPS60188955A (ja) | 露光装置 | |
| JPH0682743B2 (ja) | ウエハ処理装置 | |
| JPH0434826B2 (enExample) | ||
| KR100229245B1 (ko) | 리드위치검사방법 및 검사장치 | |
| JPH08222611A (ja) | ウェーハの位置合わせ方法 | |
| JPS61206238A (ja) | 自動半導体ウエハプロ−バ | |
| JPS60239036A (ja) | 半導体ウエハプロ−バ | |
| JPS6239822B2 (enExample) | ||
| JPH0627252A (ja) | 被処理体の位置合わせ装置 | |
| JPH0374853A (ja) | Tabディバイスの検査方法及びそれに用いるtabディバイス用キャリア並びに測定モジュール及びインサート装置 | |
| JPH05114640A (ja) | リード測定方法および装置並びにそれが使用されたリード検査装置 | |
| JPH0228344A (ja) | 半導体検査装置 | |
| JP2694468B2 (ja) | 位置検出方法および検査装置 | |
| JPS6115340A (ja) | ウエハプロ−バ | |
| JP2686606B2 (ja) | テンプレート登録方法 |