JPS61131404A - Pulse trimming for thermal head - Google Patents
Pulse trimming for thermal headInfo
- Publication number
- JPS61131404A JPS61131404A JP59253370A JP25337084A JPS61131404A JP S61131404 A JPS61131404 A JP S61131404A JP 59253370 A JP59253370 A JP 59253370A JP 25337084 A JP25337084 A JP 25337084A JP S61131404 A JPS61131404 A JP S61131404A
- Authority
- JP
- Japan
- Prior art keywords
- resistor
- resistance value
- thermal head
- high voltage
- pulsed high
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Electronic Switches (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
１Ｍ）技術分野
この発明は、厚膜型のサーマル・ヘッドにおける抵抗体
の抵抗値を調整するためのサーマル・ヘッドにおけるパ
ルストリミング法に関する。DETAILED DESCRIPTION OF THE INVENTION 1M) Technical Field The present invention relates to a pulse trimming method in a thermal head for adjusting the resistance value of a resistor in a thick film type thermal head.
（ｂ）従来技術
厚膜抵抗体のトリミング法としては、抵抗体を焼成後、
サンドブラストやレーザビームによってこの抵抗体の一
部を削り取る方法がある。ところが、これらの方法は、
サーマル・ヘッドの発熱抵抗体アレイのように１．配線
パターンによって分割された各抵抗体が極めて小さいも
のにＬよ実施が困難であり、また、短時間幅非常に多く
の発熱と放熱の熱サイクルを繰り、返すような素子に実
施することは処理の信頼性の点で問題があった。従って
、従来の厚膜型のサー÷ル・ヘッドは、セラミック基板
上に抵抗体を印刷し焼成する形成段階でできるだけ精度
を高めることにより抵抗値が均一になるようにするしか
方法がな（、このため、抵抗値のバラツキによりて生じ
る記録品質の低下を防止するにも限度があった。(b) Conventional technology As a trimming method for thick film resistors, after firing the resistor,
There is a method of scraping off a portion of this resistor using sandblasting or a laser beam. However, these methods
1. Like the heating resistor array of a thermal head. It is difficult to implement this method when each resistor divided by a wiring pattern is extremely small, and it is difficult to implement this method for an element that undergoes a large number of heat generation and heat dissipation thermal cycles over a short period of time. There was a problem with reliability. Therefore, with conventional thick-film type circuit heads, the only way to make the resistance value uniform is to increase the precision as much as possible at the formation stage of printing and firing the resistor on the ceramic substrate. For this reason, there is a limit to the ability to prevent deterioration in recording quality caused by variations in resistance values.
（Ｃ）発明の目的
この発明は、このような事情に鑑みなされたものであっ
て、発熱抵抗体アレイの各抵抗体にパルス状の高電圧を
印加することにより、厚膜型のサーマル・ヘッドにおけ
、る各抵抗体の抵抗値のバラツキを修正することができ
るサーマル・ヘッドにおけるパルストリミング法を提供
することを目的とする。(C) Purpose of the Invention The present invention was made in view of the above circumstances, and is capable of producing a thick-film thermal head by applying a pulsed high voltage to each resistor of the heating resistor array. It is an object of the present invention to provide a pulse trimming method for a thermal head that can correct variations in the resistance value of each resistor.
（ｄ１発明の構成および効果
この発明のサーマル・ヘッドにおけるパルスト ゛リミ
ング法は、厚膜型のサーマル・ヘッドにおいて、配線パ
ターンによって分割された発熱−抵抗体アレイの各抵抗
体に、適宜パルス状の高電圧を印加することにより、各
抵抗体の抵抗値のバラツキを修正することを特徴とする
。(d1 Structure and Effects of the Invention The pulse trimming method for the thermal head of the present invention involves applying appropriate pulse-shaped pulses to each resistor of a heating-resistor array divided by a wiring pattern in a thick film type thermal head. It is characterized in that variations in the resistance values of each resistor are corrected by applying a high voltage.
具体的には、まず、各抵抗体の抵抗値の測定を行い、所
定の抵抗値に合致しない場合には、この抵抗体の両端の
配線と接続する電極にパルス状の高電圧を印加すること
により抵抗値を修正する。Specifically, first, the resistance value of each resistor is measured, and if it does not match the predetermined resistance value, a pulsed high voltage is applied to the electrodes connected to the wiring at both ends of this resistor. Correct the resistance value by
そして、この作業を全ての抵抗体について行うことによ
り、各抵抗体の抵抗値をできるだけ所定の抵抗値に近づ
けバラツキを小さくする。各抵抗体に印加するパルス状
の高電圧の電圧値、パルス幅および繰り返し回数は、実
験データ等に基づいて抵抗体の抵抗値が所定値とどの程
度具なるかによって定める。By performing this operation on all the resistors, the resistance value of each resistor is brought closer to a predetermined resistance value as much as possible, and variations are reduced. The voltage value, pulse width, and number of repetitions of the pulsed high voltage applied to each resistor are determined based on experimental data and the like, depending on how much the resistance value of the resistor is different from a predetermined value.
この発明のサーマル・ヘッドにおけるパルストリミング
法を上記のように構成すると、各抵抗体の抵抗値を焼成
後に個別に修正することができるので、発熱抵抗体アレ
イにおける各抵抗体の抵抗値がほぼ一定となる。このた
め、同一信号入力に対する各抵抗体の発熱量も均一とな
るので、記録濃度のムラがなくなり記録品質を向上させ
ることができる。また、従来抵抗体の抵抗値が所定値と
大幅に異なるような場合には、−律に不良品として処分
せざるを得なかったものが、焼成後の修正が可能となっ
たので、歩留りの向上を期待することができる。When the pulse trimming method for the thermal head of this invention is configured as described above, the resistance value of each resistor can be individually modified after firing, so that the resistance value of each resistor in the heating resistor array is almost constant. becomes. Therefore, the amount of heat generated by each resistor in response to the same signal input becomes uniform, so that unevenness in recording density is eliminated, and recording quality can be improved. In addition, in the past, if the resistance value of a resistor was significantly different from a predetermined value, it would normally have to be disposed of as a defective product, but now it is possible to correct it after firing, which reduces yield. We can expect improvement.
＋８１実施例
図は、この発明のサーマル・ヘッドにおけるパルストリ
ミング法を成る厚膜型のサーマル・へ・ノドに実施した
場合の、印加するパルス状の高電圧の電圧値に対する抵
抗体の抵抗値の変化の割合を示すグラフであり、この特
性は実験的に求められる。+81 Example diagram shows the resistance value of the resistor with respect to the voltage value of the pulsed high voltage applied when the pulse trimming method in the thermal head of the present invention is applied to a thick film type thermal head. This is a graph showing the rate of change, and this characteristic is obtained experimentally.
厚膜型のサーマル・ヘッドは、セラミック基板上にグレ
ーズ層、抵抗層および配線層を焼成することにより、配
線パターンによって分割された多数の抵抗体からなる発
熱抵抗体アレイを形成したものである。尚、この実施例
では、パルス状の高電圧を印加すると抵抗体の抵抗値は
低下するので、発熱抵抗体プレイを形成する際に、予め
抵抗体の抵抗値が誤差によって低くなったときにも所定
の抵抗値より低くならないように、抵抗値を太き目に設
定しておく。A thick-film thermal head has a heating resistor array formed of a large number of resistors divided by wiring patterns by firing a glaze layer, a resistance layer, and a wiring layer on a ceramic substrate. In this example, the resistance value of the resistor decreases when a pulsed high voltage is applied, so when forming the heating resistor play, even if the resistance value of the resistor decreases due to an error, The resistance value is set thick so that it does not become lower than a predetermined resistance value.
この実施例のサーマル・ヘッドにおけるパルストリミン
グ法は、まず、発熱抵抗体アレイの各抵抗体の抵抗値の
測定を行い、所定の抵抗値に合致しない場合に、この抵
抗体の両端の配線と接続する電極にパルス状の高電圧を
印加する。このパルス状の高電圧の印加は、数百■の電
圧で充電したｚｓｏｐｐのコンデンサを電極に接続し抵
抗体に放電させることにより行う。尚、コンデンサの容
量を変えると抵抗値変化の特性も変化する。パルス状の
高電圧の電圧値は、例えば、所定の抵抗値が２６０Ωで
あり、測定値が４００Ωであった場合、４００Ωを２６
０Ωに変化させるときの抵抗値変化率は、（２６０−４
００）÷４００ ＝−０，３５となるので、図のグラフ
から抵抗値変化率が一３５％となる印加電圧３３５ｖを
求めることにより定める。パルス状の高電圧を１回印加
し再び抵抗値を測定して、所定値付近の成る範囲内にな
った場合には、そこでパルストリミングを終了する。再
び抵抗値を測定して、所定値に達しない場合には、印加
電圧をさらに１０ｖずつ増加して範囲内となるまでパル
ス状の高電圧の印加を繰り返す。また、パルス状の高電
圧を印加後、抵抗体の抵抗値を安定化するために、低圧
の直流電圧を数秒間印加することによりエージングを行
ってもよい。エージングを行う場合には、エージングに
よる抵抗値の変化分を予定に入れてパルス状の高電圧の
電圧値を定める。以下、同様の操作を各抵抗体ごとに繰
り返して、抵抗値のバラツキをできるだけ小さくするこ
の実施例のサーマル・ヘッドにおけるパルストリミング
法をこのように実施する゛と、パルストリミングを行わ
ない場合には、±４０％程あった抵抗値のバラツキを±
３％程度まで均一にすることができる。このため、同一
信号入力に対する各抵抗体の発熱量も均一となるので、
記録濃度のムラがなくなり記録品質を向上させることが
できる。また、従来抵抗体の抵抗値が所定値と大幅に異
なるような場合には、−律に不良品として処分せざるを
得なかったものが、焼成後の修正が可能となったので、
歩留りの向上を期待することができる。さらに、このパ
ルストリミングは、他の方法のように抵抗体を傷付けた
りしないので、外観の品位を損なう心配がない。The pulse trimming method in the thermal head of this example first measures the resistance value of each resistor in the heating resistor array, and if it does not match the predetermined resistance value, connects the wiring at both ends of this resistor. A pulsed high voltage is applied to the electrode. The application of this pulsed high voltage is carried out by connecting a zsopp capacitor charged with a voltage of several hundred square meters to an electrode and discharging it into a resistor. Note that when the capacitance of the capacitor is changed, the resistance value change characteristics also change. For example, if the predetermined resistance value is 260Ω and the measured value is 400Ω, the voltage value of the pulsed high voltage is 26Ω.
The rate of change in resistance value when changing to 0Ω is (260-4
00)÷400=-0.35, so it is determined by finding the applied voltage of 335V at which the resistance value change rate is 135% from the graph in the figure. A pulsed high voltage is applied once and the resistance value is measured again. If the resistance value is within a range near the predetermined value, the pulse trimming is terminated there. The resistance value is measured again, and if it does not reach the predetermined value, the applied voltage is further increased in increments of 10 V, and the application of the pulsed high voltage is repeated until it falls within the range. Furthermore, after applying a pulsed high voltage, aging may be performed by applying a low DC voltage for several seconds in order to stabilize the resistance value of the resistor. When aging is performed, the voltage value of the pulsed high voltage is determined by taking into account the change in resistance value due to aging. Hereinafter, the same operation will be repeated for each resistor to minimize the variation in resistance value. If the pulse trimming method for the thermal head of this embodiment is implemented in this way, and if pulse trimming is not performed, , the variation in resistance value was about ±40%.
It can be made uniform to about 3%. Therefore, the amount of heat generated by each resistor in response to the same signal input is also uniform, so
This eliminates unevenness in recording density and improves recording quality. In addition, in the past, if the resistance value of a resistor was significantly different from the predetermined value, it would normally have to be disposed of as a defective product, but now it is possible to correct it after firing.
An improvement in yield can be expected. Furthermore, unlike other methods, this pulse trimming does not damage the resistor, so there is no need to worry about damaging the appearance.
尚、実施例では、パルス状の高電圧を印加することによ
り、抵抗体の抵抗値が低下する場合を示したが、パルス
状の高電圧の電圧値やパルス軸等によっては抵抗値が上
昇する場合もあるので、それぞれの場合にあわせて最適
な条件を選択する。In addition, although the example shows a case where the resistance value of the resistor decreases by applying a pulsed high voltage, the resistance value may increase depending on the voltage value of the pulsed high voltage, the pulse axis, etc. Since there may be cases, the optimal conditions should be selected according to each case.
でin
図は、この発明のサーマル・ヘッドにおけるパルストリ
ミング法を成る厚膜型のサーマル・ヘッドに実施した場
合の、印加するパルス状の高電圧の電圧値に対する抵抗
体の抵抗値の変化の割合を示すグラフである。The figure shows the rate of change in the resistance value of the resistor with respect to the voltage value of the applied pulsed high voltage when the pulse trimming method for the thermal head of the present invention is applied to a thick film type thermal head. It is a graph.
Claims (1)
ンによって分割された発熱抵抗体アレイの各抵抗体に、
適宜パルス状の高電圧を印加することにより、各抵抗体
の抵抗値のバラツキを修正することを特徴とするサーマ
ル・ヘッドにおけるパルストリミング法。(1) In a thick-film thermal head, each resistor in the heating resistor array divided by the wiring pattern has
A pulse trimming method for a thermal head, which is characterized in that variations in resistance values of each resistor are corrected by appropriately applying a pulsed high voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59253370A JPS61131404A (en) | 1984-11-29 | 1984-11-29 | Pulse trimming for thermal head |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59253370A JPS61131404A (en) | 1984-11-29 | 1984-11-29 | Pulse trimming for thermal head |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61131404A true JPS61131404A (en) | 1986-06-19 |
| JPH0326527B2 JPH0326527B2 (en) | 1991-04-11 |
Family
ID=17250405
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59253370A Granted JPS61131404A (en) | 1984-11-29 | 1984-11-29 | Pulse trimming for thermal head |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61131404A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6292411A (en) * | 1985-10-18 | 1987-04-27 | 富士ゼロックス株式会社 | Manufacture of thick film thermal head |
| JPS6292414A (en) * | 1985-10-18 | 1987-04-27 | 富士ゼロックス株式会社 | Manufacture of thick film thermal head |
| JPS6359556A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359552A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359548A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359549A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359551A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS63252759A (en) * | 1987-04-09 | 1988-10-19 | Matsushita Electric Ind Co Ltd | Thermal resistor trimming device for thermal head |
| JPS63252758A (en) * | 1987-04-09 | 1988-10-19 | Matsushita Electric Ind Co Ltd | Thermal resistor trimming of thermal head |
| JPS63252760A (en) * | 1987-04-09 | 1988-10-19 | Matsushita Electric Ind Co Ltd | Thermal resistor trimming of thermal head |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS528500A (en) * | 1975-06-27 | 1977-01-22 | Dainichi Nippon Cables Ltd | Electric insulation use gas composition |
| JPS5520872A (en) * | 1978-07-31 | 1980-02-14 | Matsushita Electric Works Ltd | Handle for simple flush toilet stool |
| JPS5780708A (en) * | 1980-11-07 | 1982-05-20 | Nissan Motor | Method of producing thick film resistor |
| JPS5968270A (en) * | 1982-10-12 | 1984-04-18 | Nippon Kogaku Kk <Nikon> | Preparation of heat generating resistance body for thermal head |
| JPS6183050A (en) * | 1984-09-28 | 1986-04-26 | Mitsubishi Electric Corp | Preparation of thermal head |
-
1984
- 1984-11-29 JP JP59253370A patent/JPS61131404A/en active Granted
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS528500A (en) * | 1975-06-27 | 1977-01-22 | Dainichi Nippon Cables Ltd | Electric insulation use gas composition |
| JPS5520872A (en) * | 1978-07-31 | 1980-02-14 | Matsushita Electric Works Ltd | Handle for simple flush toilet stool |
| JPS5780708A (en) * | 1980-11-07 | 1982-05-20 | Nissan Motor | Method of producing thick film resistor |
| JPS5968270A (en) * | 1982-10-12 | 1984-04-18 | Nippon Kogaku Kk <Nikon> | Preparation of heat generating resistance body for thermal head |
| JPS6183050A (en) * | 1984-09-28 | 1986-04-26 | Mitsubishi Electric Corp | Preparation of thermal head |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6292411A (en) * | 1985-10-18 | 1987-04-27 | 富士ゼロックス株式会社 | Manufacture of thick film thermal head |
| JPS6292414A (en) * | 1985-10-18 | 1987-04-27 | 富士ゼロックス株式会社 | Manufacture of thick film thermal head |
| JPS6359556A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359552A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359548A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359549A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS6359551A (en) * | 1986-08-29 | 1988-03-15 | Mitsubishi Electric Corp | Manufacture of thermal head |
| JPS63252759A (en) * | 1987-04-09 | 1988-10-19 | Matsushita Electric Ind Co Ltd | Thermal resistor trimming device for thermal head |
| JPS63252758A (en) * | 1987-04-09 | 1988-10-19 | Matsushita Electric Ind Co Ltd | Thermal resistor trimming of thermal head |
| JPS63252760A (en) * | 1987-04-09 | 1988-10-19 | Matsushita Electric Ind Co Ltd | Thermal resistor trimming of thermal head |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0326527B2 (en) | 1991-04-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |