JPS61118639A - 偏心量測定装置 - Google Patents

偏心量測定装置

Info

Publication number
JPS61118639A
JPS61118639A JP24133584A JP24133584A JPS61118639A JP S61118639 A JPS61118639 A JP S61118639A JP 24133584 A JP24133584 A JP 24133584A JP 24133584 A JP24133584 A JP 24133584A JP S61118639 A JPS61118639 A JP S61118639A
Authority
JP
Japan
Prior art keywords
lens
eccentricity
light
computer
detection element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24133584A
Other languages
English (en)
Japanese (ja)
Other versions
JPH053889B2 (enExample
Inventor
Haruo Ogawa
小川　治男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP24133584A priority Critical patent/JPS61118639A/ja
Publication of JPS61118639A publication Critical patent/JPS61118639A/ja
Publication of JPH053889B2 publication Critical patent/JPH053889B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP24133584A 1984-11-15 1984-11-15 偏心量測定装置 Granted JPS61118639A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24133584A JPS61118639A (ja) 1984-11-15 1984-11-15 偏心量測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24133584A JPS61118639A (ja) 1984-11-15 1984-11-15 偏心量測定装置

Publications (2)

Publication Number Publication Date
JPS61118639A true JPS61118639A (ja) 1986-06-05
JPH053889B2 JPH053889B2 (enExample) 1993-01-18

Family

ID=17072766

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24133584A Granted JPS61118639A (ja) 1984-11-15 1984-11-15 偏心量測定装置

Country Status (1)

Country Link
JP (1) JPS61118639A (enExample)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0197832A (ja) * 1987-10-09 1989-04-17 Olympus Optical Co Ltd 偏心測定装置
US5059022A (en) * 1988-11-11 1991-10-22 Olympus Optical Company Limited Device for measuring radius of curvature and a method thereof
US5280336A (en) * 1991-03-29 1994-01-18 Optikos Corporation Automated radius measurement apparatus
US5416574A (en) * 1991-03-29 1995-05-16 Optikos Corporation Automated optical measurement apparatus
US5548396A (en) * 1993-08-13 1996-08-20 Ricoh Company, Ltd. Method and apparatus for measuring eccentricity of aspherical lens having an aspherical surface on only one lens face
JP2006175343A (ja) * 2004-12-22 2006-07-06 Matsushita Electric Ind Co Ltd 精米器
JP2012118066A (ja) * 2010-11-29 2012-06-21 Trioptics Gmbh 多レンズ光学系の光学面の曲率中心の位置の測定
EP2184596A4 (en) * 2007-08-27 2012-12-05 Nikon Corp WAVE FRONT ABERRATION MEASURING DEVICE AND METHOD AND WAVE FRONT ABERRATION ADJUSTMENT METHOD

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS519620A (enExample) * 1974-07-15 1976-01-26 Matsushita Electric Industrial Co Ltd
JPS5873336A (ja) * 1981-10-28 1983-05-02 株式会社トプコン 曲率測定装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS519620A (enExample) * 1974-07-15 1976-01-26 Matsushita Electric Industrial Co Ltd
JPS5873336A (ja) * 1981-10-28 1983-05-02 株式会社トプコン 曲率測定装置

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0197832A (ja) * 1987-10-09 1989-04-17 Olympus Optical Co Ltd 偏心測定装置
US5059022A (en) * 1988-11-11 1991-10-22 Olympus Optical Company Limited Device for measuring radius of curvature and a method thereof
US5280336A (en) * 1991-03-29 1994-01-18 Optikos Corporation Automated radius measurement apparatus
US5416574A (en) * 1991-03-29 1995-05-16 Optikos Corporation Automated optical measurement apparatus
US5548396A (en) * 1993-08-13 1996-08-20 Ricoh Company, Ltd. Method and apparatus for measuring eccentricity of aspherical lens having an aspherical surface on only one lens face
JP2006175343A (ja) * 2004-12-22 2006-07-06 Matsushita Electric Ind Co Ltd 精米器
EP2184596A4 (en) * 2007-08-27 2012-12-05 Nikon Corp WAVE FRONT ABERRATION MEASURING DEVICE AND METHOD AND WAVE FRONT ABERRATION ADJUSTMENT METHOD
US8797520B2 (en) 2007-08-27 2014-08-05 Nikon Corporation Wavefront aberration measuring device and method and wavefront aberration adjusting method
TWI453381B (zh) * 2007-08-27 2014-09-21 尼康股份有限公司 Wavefront aberration measuring apparatus and method, and wavefront aberration adjustment method
JP2012118066A (ja) * 2010-11-29 2012-06-21 Trioptics Gmbh 多レンズ光学系の光学面の曲率中心の位置の測定

Also Published As

Publication number Publication date
JPH053889B2 (enExample) 1993-01-18

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