JPS61118639A - Apparatus for measuring quantity of eccentricity - Google Patents

Apparatus for measuring quantity of eccentricity

Info

Publication number
JPS61118639A
JPS61118639A JP24133584A JP24133584A JPS61118639A JP S61118639 A JPS61118639 A JP S61118639A JP 24133584 A JP24133584 A JP 24133584A JP 24133584 A JP24133584 A JP 24133584A JP S61118639 A JPS61118639 A JP S61118639A
Authority
JP
Grant status
Application
Patent type
Prior art keywords
lens
eccentricity
inspected
light
quantity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24133584A
Other versions
JPH053889B2 (en )
Inventor
Haruo Ogawa
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing of optical properties of lenses
    • G01M11/0221Testing of optical properties of lenses by determining the optical axis or position of lenses

Abstract

PURPOSE:To make it possible to measure quantity of eccentricity with high accuracy within a short time, by measuring the quantity of eccentricity of a lens by converting the same to a numerical value by using a computer. CONSTITUTION:The light from a light source is projected to the lens 43 to be inspected held to a lens frame 44 through a lens system 42 and the transmitted light is condensed to a focus position to form a spot image. This spot image is magnified by a lens system to be formed onto a light position detection element 46 and converted to X.Y voltage wherein the position of the centroid is linear in two directions X, Y. The output of the X.Y voltage is amplified by an amplifier 10 and converted to digital output by an A/D converter 13 to be inputted to a computer 14. Next, when a lens 5 to be inspected is rotated on the basis of a frame 6, the X.Y output of a light position detection element 9 changes when the lens 5 to be inspected is eccentric because the spot image draws a circle and the area of said circle is calculated by the computer 14 and the radius of said circle is subsequently calculated to calculate the quantity of eccentricity of the lens to be inspected.
JP24133584A 1984-11-15 1984-11-15 Expired - Lifetime JPH053889B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24133584A JPH053889B2 (en) 1984-11-15 1984-11-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24133584A JPH053889B2 (en) 1984-11-15 1984-11-15

Publications (2)

Publication Number Publication Date
JPS61118639A true true JPS61118639A (en) 1986-06-05
JPH053889B2 JPH053889B2 (en) 1993-01-18

Family

ID=17072766

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24133584A Expired - Lifetime JPH053889B2 (en) 1984-11-15 1984-11-15

Country Status (1)

Country Link
JP (1) JPH053889B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0197832A (en) * 1987-10-09 1989-04-17 Olympus Optical Co Ltd Measuring apparatus of eccentricity
US5059022A (en) * 1988-11-11 1991-10-22 Olympus Optical Company Limited Device for measuring radius of curvature and a method thereof
US5280336A (en) * 1991-03-29 1994-01-18 Optikos Corporation Automated radius measurement apparatus
US5416574A (en) * 1991-03-29 1995-05-16 Optikos Corporation Automated optical measurement apparatus
US5548396A (en) * 1993-08-13 1996-08-20 Ricoh Company, Ltd. Method and apparatus for measuring eccentricity of aspherical lens having an aspherical surface on only one lens face
JP2006175343A (en) * 2004-12-22 2006-07-06 Matsushita Electric Ind Co Ltd Rice polishing device
EP2184596A1 (en) * 2007-08-27 2010-05-12 Nikon Corporation Wavefront aberration measuring device and method and wavefront aberration adjusting method
JP2012118066A (en) * 2010-11-29 2012-06-21 Trioptics Gmbh Measurement of position of curvature center of optical plane of multi-lens optical system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS519620A (en) * 1974-07-15 1976-01-26 Matsushita Electric Ind Co Ltd
JPS5873336A (en) * 1981-10-28 1983-05-02 Tokyo Optical Apparatus for measuring curvature

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS519620A (en) * 1974-07-15 1976-01-26 Matsushita Electric Ind Co Ltd
JPS5873336A (en) * 1981-10-28 1983-05-02 Tokyo Optical Apparatus for measuring curvature

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0197832A (en) * 1987-10-09 1989-04-17 Olympus Optical Co Ltd Measuring apparatus of eccentricity
US5059022A (en) * 1988-11-11 1991-10-22 Olympus Optical Company Limited Device for measuring radius of curvature and a method thereof
US5280336A (en) * 1991-03-29 1994-01-18 Optikos Corporation Automated radius measurement apparatus
US5416574A (en) * 1991-03-29 1995-05-16 Optikos Corporation Automated optical measurement apparatus
US5548396A (en) * 1993-08-13 1996-08-20 Ricoh Company, Ltd. Method and apparatus for measuring eccentricity of aspherical lens having an aspherical surface on only one lens face
JP2006175343A (en) * 2004-12-22 2006-07-06 Matsushita Electric Ind Co Ltd Rice polishing device
EP2184596A1 (en) * 2007-08-27 2010-05-12 Nikon Corporation Wavefront aberration measuring device and method and wavefront aberration adjusting method
EP2184596A4 (en) * 2007-08-27 2012-12-05 Nikon Corp Wavefront aberration measuring device and method and wavefront aberration adjusting method
US8797520B2 (en) 2007-08-27 2014-08-05 Nikon Corporation Wavefront aberration measuring device and method and wavefront aberration adjusting method
JP2012118066A (en) * 2010-11-29 2012-06-21 Trioptics Gmbh Measurement of position of curvature center of optical plane of multi-lens optical system

Also Published As

Publication number Publication date Type
JPH053889B2 (en) 1993-01-18 grant

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